Si
atomic number 14 tetravalent metalloid chemical element.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Radiometry Calibration
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Trescal provides full Radiometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Radiometry Calibration services can be delivered at your site or at our lab. Accreditations for our radiometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
RS422 Mode SI-module With Optical Isolation
MX422-G
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RS422 mode SI-module with optical isolation
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Product
Potentiostats
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AMETEK SI offers a range of bipotentiostats, single and multi channel potentiostats and galvanostats through both the Princeton Applied Research and Solartron Analytical brands.
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Flow Calibration
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Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Voltage and Current Measuring Technology
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HIGHVOLT Prüftechnik Dresden GmbH
Designed for the measurement of alternating current (AC), direct current (DC), lightning (LI) and switching (SI) impulse high voltages (HV) as well as AC and impulse high current (HC) according to IEC 60060, IEC 61083 and IEC 60052, available as indoor and outdoor design.
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Product
AAA Solar simulator
SS50AAA-PLC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Product
Medical Device Calibration
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Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Optical Node
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Sichuan Jiuzhou Electronic Technology Co.,Ltd
* Philips CGD914 amplifier module that employs both GaAs and Si dies.* 4 outputs, output level ≥100dBμV when optical input at -1dBm.* Plug-in fixed attenuator, fixed equalizer.* Optical power indication for -7 ~ 0dBm.* FP laser or DFB laser for return path.* RF test point for forward path and return path.* Optional SNMP responser unit supporting JIUZHOU HFC Net Managing software.* AC 60V or AC 220V power supply.* Aluminum die-casting housing.
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Product
6 GHz ProLink Differential Probe with Dx10-SI Solder-In Tip
D610-A-PL
Differential Probe
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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Product
UV TOCONs
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SiC based UV sensor with integrated amplifier and 0 – 5 V voltage output. Measures intensities from 1.8pW/cm² up to 18W/cm². Spectral response for broadband UV or filtered for UVA, UVB, UVC or UV-Index. Also available for blue light (GaP chip) or visible light (Si chip) measurement. Available in TO5 housings or as miniature sensor probes (stainless steel or plastic). Special TOCONs for hydrogen flame sensing (TOCON_F) and for fire detection (TOCON_N) available. Also available for operating temperatures up to 120°C (standard is 85°C). Please learn more about the sglux TOCONs here: TOCON selection guide and here: TOCON User Guide.
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Product
Temperature Calibration
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Trescal provides full Temperature Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Temperature Calibration services can be delivered at your site or at our lab. Accreditations for our temperature calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
6 GHz ProLink Differential Probe with Dx20-SI Solder-In Tip
D620-A-PL
Differential Probe
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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Product
Photodiodes
Avalanche
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Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Product
Power Meters and Calibration Cells
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The Solar Reference Cell consist of a 20 x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 x 70 x 16 mm metal enclosure with a protective quartz window and a temperature sensor. The temperature sensor is a 100 ohm platinum Resistance Temperature Detector (RTD).The Solar Reference Cells come with a Certificate of Calibration and compatible set of connecting cables. The following parameters of the reference cell are certified: Isc, Imax, Voc, Vmax, Pmax, Area, Fill Factor and Efficiency. The certification is accredited by NIST to the ISO-17025 standard and is traceable both to the National Renewable Energy Laboratory (NREL), and to the International System of Units (SI). A compatible cable set is also supplied with each Solar Reference Cell.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
MPEG & DVB Analyzer
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The analyzer combines the most important MPEG analyzer features into one single product: Decode all MPEG and DVB service information down to the descriptor level. Current/Next table versions are listed separately. SI information for "other" transport streams is decoded as well. The full range of descriptors defined in MPEG2 and DVB are supported.
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Product
Current Loop 20 MA Constant Current SI-module With Optical Isolation
MXTTY
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Current loop 20 mA constant current (active, passive) SI-module with optical isolation.
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Product
Pressure Calibration
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Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
PAM analysis upgrade for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-UPG-PAM
Analyzer
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
Seismometers
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SI value, the so called “velocity response spectrum”, is one of the standards to express an earthquake''s destructive power against structures. SW-74SI is an advanced model equipped with alarm output to 10-step and SI value output.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
EMC Calibration
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Trescal provides full EMC Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. EMC Calibration services can be delivered at your site or at our lab. Accreditations for our emc calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
4-Port Serial Interface, Modular, With/Without Optical Isolation, 3.3V
CPCI-7500
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*This Model has a 37-pin D-Sub male connector*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)*Transmission mode asynchronous, full, half duplex*Transfer rate: progr. up to 115.2 kBaud up to 1 MBaud on request*Protocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bits*Parity: even, odd, none, mark or space*Interrupt lines: automatic through BIOS
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Product
4-Port Serial Interface
APCI-7500-3
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This Model has a 37-pin D-Sub male connectorRS232, RS422, RS485, 20 mA Current LoopModular structure through SI modulesWith or without optical isolationMode configuration free for each port128-byte FIFO-buffer, common interruptTransfer rate programmable up to 115,200 BaudOption: up to 1 MBaud for RS485 and RS422Automatic direction recognition for RS48Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)Transmission mode asynchronous, full, half duplexTransfer rate: progr. up to 115.2 kBaud up to 1 MBaud on requestProtocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bitsParity: even, odd, none, mark or spaceInterrupt lines: automatic through BIOS
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Product
NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
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Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
AC Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
High-voltage Dividers (High Potential Divider) are used to measure voltages and decouple partial discharges in high-voltage test systems. Depending on the specific type, they are used to measure alternating voltage (AC), direct voltage (DC), lightning impulse voltage (LI), and switching impulse voltage (SI) systems. High-voltage dividers by HIGHVOLT comply with the relevant IEC standards. The systems are available for both indoor and outdoor use.
