Si
atomic number 14 tetravalent metalloid chemical element.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Single Port Serial Interface
APCI-7300-3
*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Ultra-Low Noise 2 kHz Photoreceiver w/ Si-PIN Photodiode
PWPR-2K-SI
Picowatt Photoreceiver series PWPR-2K with switchable gain (10 to the 9th V/A, 10 to the 10th V/A) and a bandwidth from DC to 2 kHz is the perfect choice for cw-measurements, time resolved signal acquisitions and highly sensitive modulated measurements. Si and InGaAs models cover the wavelength range from 320 to 1700 nm.
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Accelerometry Calibration
Trescal provides full Accelerometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Accelerometry Calibration services can be delivered at your site or at our lab. Accreditations for our accelerometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Pressure Meters
An individually-numbered Traceable® Certificate provided with each unit, assures accuracy from our ISO/IEC 17025:2005 (1750.01) calibration laboratory accredited by A2LA. It indicates traceability of measurements to the SI units through NIST or other recognized national measurement institutes (NMI) that are signatories to the CIPM Mutual Recognition Agreement.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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KV CAPS
500 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPSTM Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available as unpackaged chips. The chips have gold bonding surfaces on both terminals to enable excellent bonding and minimum contact resistance.
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DVB Analyzer
DVB Inspector
DVB Inspector is an open-source DVB analyzer, written in java. It can show the logical structure of the DVB SI and PSI data. It also shows bit rate usage data. DVB Inspector can be used to analyse contents; MPEG Video structure, teletext, DVB subtitles, DSM-CC Object carousels.
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General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Torque Calibration
Trescal provides full Torque Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Torque Calibration services can be delivered at your site or at our lab. Accreditations for our torque calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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KV CAPS
1000 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Medical Device Calibration
Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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DVB / MPEG Stream Analyzer program
dvbsnoop
dvbsnoop is a DVB / MPEG stream analyzer program, which enables you to watch (live) stream information in human readable form. Its purpose is to debug, dump or view digital stream information (e.g. digital television broadcasts) send via satellite, cable or terrestrial. Streams can be SI, PES or TS. Basically you can describe dvbsnoop as a "swiss army knife" analyzing program for DVB, MHP, DSM-CC or MPEG
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Pressure Calibration
Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Photodiodes
Avalanche
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Power Meters and Calibration Cells
The Solar Reference Cell consist of a 20 x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 x 70 x 16 mm metal enclosure with a protective quartz window and a temperature sensor. The temperature sensor is a 100 ohm platinum Resistance Temperature Detector (RTD).The Solar Reference Cells come with a Certificate of Calibration and compatible set of connecting cables. The following parameters of the reference cell are certified: Isc, Imax, Voc, Vmax, Pmax, Area, Fill Factor and Efficiency. The certification is accredited by NIST to the ISO-17025 standard and is traceable both to the National Renewable Energy Laboratory (NREL), and to the International System of Units (SI). A compatible cable set is also supplied with each Solar Reference Cell.
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Humidity Calibration
Trescal provides full Humidity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Humidity Calibration services can be delivered at your site or at our lab. Accreditations for our humidity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Solar Radiation Sensors
The silicon solar radiation sensor (Si) sensor provides an inexpensive but yet robust and reliable solution for measuring the solar irradiance specifically for the monitoring of photovoltaic (PV) systems. Due to the structure of the sensor element, which corresponds to a PV module, these sensors are ideally suited as a reference for the monitoring of PV systems to determine the solar radiation.
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4-Port Serial Interface, Modular, With/Without Optical Isolation, 3.3V
CPCI-7500
*This Model has a 37-pin D-Sub male connector*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)*Transmission mode asynchronous, full, half duplex*Transfer rate: progr. up to 115.2 kBaud up to 1 MBaud on request*Protocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bits*Parity: even, odd, none, mark or space*Interrupt lines: automatic through BIOS
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Magnetic Susceptibility Meter
SM-20
The SM-20 magnetic susceptibility meter is very useful tool for a number of geological and geophysical applications where the unique sensitivity of 10-6 SI units together with its small, shirt-pocket size and low weight are appreciated.
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Velocity Calibration
Trescal provides full Velocity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Velocity Calibration services can be delivered at your site or at our lab. Accreditations for our velocity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Mass Calibration
Trescal provides full Mass Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Mass Calibration services can be delivered at your site or at our lab. Accreditations for our mass calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
