Semiconductor Substrate
thin crystalline material sliced from ingot.
-
Product
Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
-
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
-
Product
Custom Coatings
-
MICROMATTER provides custom coating services (single or multi-layer) on customer supplied glass, metal and semiconductor substrates.
-
Product
Defect Inspection Systems
-
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
-
Product
High Volume Semiconductor Substrate Interconnect Tester
GATS-2100
-
Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors.The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
-
Product
Semiconductors
-
Teledyne Lincoln Microwave designs our own proprietary microwave diodes, which underpin many of our performance advantages.Our Semiconductor Technology Centre is located at the School of Physics and Astronomy within the University of Nottingham, UK. Facilities include a 90m2 ISO class 6 process cleanroom with ISO class 5 laminar flow.
-
Product
Semiconductor
-
Engineered ceramics are used in the semiconductor industry because of their excellent material properties. Ultra-pure ceramics are often used in the whole cycle of semiconductor manufacturing including Semiconductor Wafer & Wafer Processing, Semiconductor Fabrication (Front End), and Semiconductor Packaging (Back End).
-
Product
Substrate Manufacturing
-
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
-
Product
Semiconductor Automation
-
Brooks' years of experience providing application-specific solutions backed by unparalleled technology leadership, industry expertise.
-
Product
Semiconductor
-
With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
-
Product
Semiconductor
-
Package FunctionSMV(2.9mm*2.8mm) AND GateUSV(2.0mm*2.1mm) NAND GateFM8(5.0mm*4.5mm) NOR GateSM8(2.9mm*4.0mm) OR GateUS8(2.0mm*3.1mm) INVERTER
-
Product
Compound Semiconductor
-
Scientific Computing International
Semiconductors that are made from two or more elements.
-
Product
Differential Calibration Substrates
-
The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected.
-
Product
Calibration Substrates
-
The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
-
Product
Compact Semiconductor ATE
QST286
-
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
-
Product
Semiconductor Testers
-
Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices
-
Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
-
Product
Semiconductor Tester
5000E
-
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
-
-
Product
Semiconductors
-
Meets SDIO card v2.0 specificationSupports SDIO SPI, 1-bit, and 4-bit SD modesHost clock rate from 0-50 MHzSingle SDIO function interfaceSD commands processed in hardwareReset output on completion of initializationIndication of high speed and high power enabling to application logicMaximum block size supported is 1024 bytesThree I/O mode selection pinsCRC7 and CRC16 modulesSupports direct R/W (IO52) and extended R/W (IO53) commandsAPB bus interfaceParallel bus interfaceStandard 8051 split bus interfaceGeneric 8051 bus interfaceUART interface
-
Product
Semiconductor Switching Systems
Keithley 700 Series
-
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
-
Product
Semiconductor Test Equipment
IC Tester
-
Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
-
Product
Semiconductor Functional Verification Tools
Trek5
-
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
-
Product
Semiconductor
-
Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.
-
Product
Semiconductor Technology
-
Semiconductor technology has maintained exponential performance growth, transforming society at a blistering pace. Now, all eyes are on the industry to keep up that rate – commonly associated with Moore’s law – to accommodate for challenges such as the steeply growing amount of data, low-power edge computing for artificial intelligence and high-performance computing to crack some of the world’s toughest problems.
-
Product
Semiconductor Assembly
-
With the know-how that we have cultivated over many years in the semiconductor manufacturing process, we respond to the diverse needs of our customers regardless of prototype production and mass production.
-
Product
Semiconductor Curve Tracer
CS-3000 Series
-
*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
-
Product
300 Mm Semiconductor Processes
-
With the Center Nanoelectronic Technologies (CNT), the Fraunhofer IPMS conducts applied research on 300 mm wafers for microchip producers, suppliers, equipment manufacturers and R&D partners. In the field of FEoL and BEoL we offer the following technology developments and services at Ultra Large Scale Integration level (ULSI):
-
Product
Semiconductor CharacterizationSystem
Keithley 4200
-
Materials Development Corporation
The MDC CSM/Win-4200 System integrates the extraordinary power of the CSM/Win softwarewith the power of the new Keithley 4200-SCS. Measure capacitance, voltage, and current down to sub-femtoamp levels.
-
-
Product
Semiconductor Testing
-
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
