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Scanning X-Ray Detectors
Shad-o-Scan
Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Scanning Tunneling Microscope for Ultra High Vacuum
STM
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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3D Scanning System
CyberGage360
Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Radiation Scanning Equipment
The spectrometer is designed for radiation scanning of territories and objects. The functions of the spectrometer are measurement of the energy distribution of gamma radiation, measurement of the ambient dose equivalent rate of gamma radiation, search and identification of gamma-emitting radionuclides, detection of neutron radiation sources.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Light Section Sensors
Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
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Measurement Services
API offers on-site dimensional inspection, 3D scanning, machine tool and robot error mapping and calibration, laser tracker calibration/verification.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Metrology/SEM
Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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PCI Analog Input Board
APC330
The APC330 has many features to improve your overall system throughput rate. You can scan all channels or define a subset for more frequent sampling. Burst mode scans selected channels at the maximum conversion rate.
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Optomechanical Devices
Optomechanical devices include an optical chopper, scanning galvo mirrors, adaptive optics, a motorized pinhole wheel, a piezo objective scanner, a motorized flip mount, motorized filter wheels, and optical beam shutters.
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Line-scan Camera
The Avaatech XRF Core Scan can also be equipped with a high-resolution line-scan camera that allows to obtain detailed pictures of the sample material, including color data. The current generation camera is the JAI LT-400 CL-F Color Line Scan Camera.
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Automated Optical Inspection System
AOI Series
Perform visual inspections of printed circuit boards (PCB) during manufacturing in which a camera is used to scan the board in extremely fine detail to check for any defects or failures.
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Talon 26.5 GHz Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTR 2654
- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 800 MHz to 26.5 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- 4U chassis with front panel removable SSDs- Storage capabilities to 245 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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NanoLattice Pitch Standard (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Analog I/O Board
VME-3128A
The VME-3128A scans 16, 32, 48 or 64 channels, continually digitizes all of them and stores the results. Choose from 64 differential or single-ended inputs and program VMEbus interrupts and interval timer to meet the unique requirements of your mission.
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sonic tester
PR-82
The PR-82 sonic tester has been modified for the automotive industry. This gauge is commonly used for measuring the thickness of cylinder walls, head ports, decks, tubing, body panals, and windshields. It also has the ability to scan the length of a part to find the the minimum thickness.The PR-82 is back-lit and the unit operates for up to 200 hours on a single set of batteries. It is protected by Dakota Ultrasonics 5 year limited warranty.
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Hipot Tester
NX Hipot+
50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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Magnetrons and Accessories
Teledyne e2v is a leader in cargo scanning technology, delivering products that are integrated into 90% of major systems worldwide.Over 90% of the world’s non-bulk cargo is transported by ship in standardised containers. The containerisation system was developed after World War II and its cost reduction has been a major driver of international trade and globalisation. There are well over half a billion container shipments per annum.
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acA2000-340kc, Color Camera Link, 2 MP, 340 FPS Area Scan Camera
782143-01
The acA2000-340kc is a Color Basler Ace Camera Link Camera with a 2 MP resolution and a maximum image acquisition speed of 340 frames per second. The acA2000-340kc uses a CMV2000 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
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Polarity Tester
PT-1
International Electro-Magnetics, Inc.
The PT-1 provides a simple and easy way to determine the relative polarity of coil windings. It allows for an in-process test that takes a minimum of time to perform. By placing a coil on the platform and making connection to the start and end of a winding, a test signal is induced in the winding. The induced signal is low level and completely safe for the operator. By comparing the test signal phase of the coil under the test output, the relative polarity is indicated by the Red/Green LED. The tester operates by inducing a signal voltage in the coil under test by means of a magnetic flux field. The field is generated by a coil located in the probe base. The coil configuration is designed to provide optimum field distribution. We have also applied this basic circuit to a 5-channel scanning unit.
