Total Reflection X-ray Fluorescence
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Industrial CT X-Ray Inspection System
X7000
The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts.
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Electrodeless Z-Pinch™Soft X-Ray (SXR) Source
EQ-10SXR
Is a compact, easy-to-use, reliable and cost-effective SXR light source system, based on Energetiq’s unique Electrodeless Z-pinch™ technology using Nitrogen gas.
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Handheld X-Ray Backscatter Imaging System
Nighthawk™
Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Trace-Level UV Fluorescence SO2 Analyzer
Model T100U
Teledyne Advanced Pollution Instrumentation
The Model T100U Trace-level SO2 analyzer has been developed specifically to address the challenges of low level monitoring as required, for example, in the US NCore network. It uses the proven UV fluorescence principle, and is designed to allow ultra-sensitive SO2 measurements while still meeting the requirements for use as a US EPA compliance analyzer.The analyzer uses both the light and dark phases of the pulsed UV light source to continuously detect and correct for electronic noise, giving exceptionally stable and sensitive performance. A separate UV detector allows the instrument to continuously correct for variations in lamp intensity. Exceptional stability is achieved with the use of an optical shutter to compensate for PMT drift, and a reference detector to correct for changes in UV lamp intensity. A hydrocarbon "kicker" and advanced optical design combine to prevent inaccuracies due to interferents.
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Adjustable Range Reflective Photoelectric Sensor
RX-LS200
Panasonic Industrial Devices Sales Company of America
Panasonic's Die-cast Adjustable Range Reflective Photoelectric Sensor. The Sensor does not detect the background beyond the set point and the color or size of the object does not affect its sensing performance.
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24 Channel Isolated Counter / Totalizer & 16 Channel Pulse Simulator
DP-cPCI-5004
DP-cPCI-5004, Isolated Pulse Simulator / Counter / Totalizer module is an integrated module for pulse output, pulse measurement and event counting. The module has 16 isolated channels of pulse output at desired frequency. The 16 channels are divided into three groups . The first two groups have four differential and one single ended channels each.
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X-ray Inspection System
TruView Prime
The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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UV Fluorescence Sulfur Dioxide Analyzer
Model T100
The Model T100 uses the proven UV fluorescence principle, coupled with a state of the art user interface to provide easy, accurate, and dependable measurements of low level SO2.Exceptional stability is achieved with the use of an optical shutter to compensate for PMT drift and a reference detector to correct for changes in UV lamp intensity. A hydrocarbon ‘kicker’ and advanced optical design combine to prevent inaccuracies due to interferents.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel using NumaView™ Software, or via RS232, Ethernet, or USB com ports, either locally or by remote connection using the included NumaView™ Remote PC Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.The Model T100 comes with NumaView ™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView ™ Software.
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Automated Total Nitrosamine Analyser
Ellutia Chromatography Solutions
Nitrosamines are carcinogenic compounds that can be found and formed in many products. This has been a particular issue in the pharmaceutical industry recently. Traditional approaches to the analysis, such as by mass spec, have been challenging due to the low detection levels required, the possibility of false positives, or even missing. This system takes a unique approach of using the combination of a chemical reaction targeting nitrosamine compounds, then detection by a detector with very high selectivity and sensitivity for nitro/nitroso compounds. Rather than speciating the various nitrosamines present, the system gives a single quantitative result down to 1 ppb for the total nitrosamine content. This means both volatile and non-volatile nitrosamines are measured at the same time. This process is automated to allow a high sample throughput. This makes it ideal for screening a large number of samples rapidly.
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In-Line X-ray Inspection System
X-eye 6200
Automatically in-line inspect Solder joint defects of PCBA, and other defects on Hidden Components.Able to judge Good/NG fast with inspection speed of 1sec/FOV and the program can set ROIs conveniently.Performing X-ray inspection in various production site, integrated with other manufacturing equipements.
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X-Ray and CT Inspection
Systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Nano-focus X-ray Inspection System
X-eye NF120
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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X-Ray Detectors
With the need to always reduce the inspection time to the strict minimum, the NDT world is slowly reducing its dependency on films and jumping straight into the Digital Radiography (DR) revolution. While saving tremendous amount of time and money not developing films, digital radiography also enables you to edit, record and send your inspections to whomever, whenever and wherever you want.
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Integrating Spheres For Reflection, Transmission, Absorption
Universal integrating spheres and accessories optimized for the measurement of reflection, transmission, absorption and photoluminescence
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X-ray Fluorescence
XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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Automated X-ray Inspection (AXI)
Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Femtosecond Fluorescence Up-Conversion Spectrometer
FOG100
Femtosecond optical gating (FOG) methods give best temporal resolution in light induced fluorescence lifetime measurements. Since 1997 we manufacture model FOG100-DX for operation with femtosecond oscillators and we offer now FOG100-DA for operation with femtosecond amplified pulses.
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Total Substation Maintenance Program
S. D. Myers' Solutions offers Substation Maintenance Services which provide the means to solve your substation and transformer needs. One phone call gives you access to the S. D. Myers' team, our expertise and experience, as well as our network of partnerships, all working toward the goal of extending the relaible and cost-effective life of your substation equipment.
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Convergent Reflective Photoelectric Sensor
EX-40
Panasonic Industrial Devices Sales Company of America
The Convergent Reflective Photoelectric Sensor EX-40 offers reliable object detection in a limited area. Due to convergent distance sensing, the color or material of the object has almost no effect. Further, the background also has very little effect, enabling stable sensing.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
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Keysight Multifunction Module with 32-bit DIO, 2-ch D/A and Totalizer for 34980A
34952A
The Keysight 34952A module for the 34980A Multifunction Switch/Measure Unit allows great flexibility for a variety of sense and control applications.It combines the following on a single earth-referenced module:
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Total Solution
SD 4.1 Family
To meet the ever increasing data transfer rate in high end applications, such as professional broadcasting transmission or advanced high resolution display, the SD 4.1 specification calls out the maximum performance of 1.56 Gbps at UHS-II full duplex mode per lane or half duplex UHS-II at 3.16 Gbps. In real applications, due to the system overhead and different SD 4.1 device controller designs, the actual measured performance can vary dramatically from system to system. With the newly introduced ADMA 3, the OS driver is now able to issue multiple read or multiple write commands at once, without having to wait for the SD controller to complete one command at a time. Once the SD host controller has collected multiple commands, it will then manage and complete them without intervention from the host software drive. Thus, the UHS-II 1.56 Gbps interface can be more effectively utilized and maximize the system throughput. This feature can be very useful when running multithreaded applications where multiple applications are constantly updating their status or swapping their contents by writing or reading small chunk of data to or from the memory card.
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Free Chlorine & Total Chlorine Meter
Tests swimming pools, municipal water, food and beverage water, or other aqueous solution where fluid clarity is important.
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Reflective Memory Node Card
PMC-5565PIORC
The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
