Total Reflection X-ray Fluorescence
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-ray Fluorescence Spectrometers
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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X-Ray Fluorescence Analyzer
MESA-50K
In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Reflective Memory
VME-5565
The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Fluorescence Detector
RF-20A/RF-20Axs
The excellent basic performance of the Prominence series is further enhanced by the RF-20A/RF-20Axs fluorescence detectors, which offer world-class sensitivity, excellent ease of maintenance, and validation support functions. They support a wide range of applications from conventional analysis to high-performance analysis.
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X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Analyzer for Total Sulfur
FGA-1000
ATOM Instrument offers the most versatile total sulfur analyzers available. The ATOM FGA-1000 is an online process analyzer utilizing patented Excimer UV Fluorescence (EUVF) Technology to measure Total Sulfur in a variety of applications such as monitoring refinery flare gas and subsequent sulfur dioxide (SO2) emissions as mandated by the EPA Rule 40 CFR 60, Subpart Ja.
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Industrial X-Ray
Teledyne DALSA offers powerful, innovative CCD and CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for industrial and scientific applications such as NDT (non destructive testing) in evaluation, troubleshooting, research, and quality control.
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X-ray Microscopy
ZEISS Xradia Ultra
Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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Calibrated Diffuse Reflectance Standards
Diffuse reflection calibration standards in synthetic ODM and ODMP material
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Transmission / Reflection Measurement
Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Fluorescent Leak Detection
How to pinpoint the exact source of leaks, save money, and protect your business. Our OEM approved fluorescent dyes work as a preventive maintenance system to protect your workers and your business. Our safety products are being utilized in mines all over the world.
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Diffuse Reflectance Sphere
DRS100
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Reflectance Standards
Diffuse reflectance calibration standards in white or different grey levels. Traceable calibration for the wavelength range from 250 nm to 2450 nm.
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Fluorescence Imaging
A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
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Total Energy System
5000
The electric vehicle (EV) charging market is rapidly expanding, with more and more people switching to electric cars. As the demand for EV charging stations increases, so does the amount of energy that is being exchanged. This energy exchange market is already massive, with charging peaks reaching into the megawatts of energy. With this amount of energy comes a significant amount of revenue, which requires the most accurate billing possible. That’s where TESCO’s Catalog No. 5000 – Total Energy System comes in. The Catalog No. 5000 is a double duo system that enables the testing and accuracy verification of Electric Vehicle Service Equipment (EVSE) and Field Test Equipment for testing EVSE’s in the field. This system is a dual-purpose DC and AC System and includes both a 100A AC (ACT-100) Test System and a 200A DC Test System (DCT-200).
