Distributed Antenna System
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Battery Monitoring System
iPQMS-C128
The iPQMS is the premier battery monitoring system in Eagle Eye's IBwatch-Series. It ensures backup power systems are optimally maintained in large-scale environments. The iPQMS is the main processing unit that measures up to 448 jars (or 448 cells) utilizing up to seven Relaying Units (RU). Each RU connects up to 64 jars (or 64 cells) and captures data from these batteries and sends it to the MPU in real-time. The iPQMS can be used over a private network via TCP/IP, or locally with RS-232. Networked systems can utilize SMS/Email alerts during an alarm outbreak. If you do not wish to use our Battery Management Software, Modbus protocol is available for third-party integration. Flexible expanding solutions allow multiple iPQMS units to monitor all your systems in real-time.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Optical VisionInspection System
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Cable Identification System & Cable Phasing System
Impulse Phaser
With the introduction of direct buried, solid dielectric primary voltage cables, the IMPULSE PHASER has come into greater prominence for safely and accurately identifying buried primary cables, including jacketed neutral designs. The IMPULSE PHASER has been accurately used on paper insulated, lead covered feeders in excess of 20 miles and even on submarine cable 300 feet underwater.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Components for System Integration
Bh offers a wide range of accessories to improve your photon counting experiment such as experimental control modules, optomechanics or implantable fiber probes for in-vivo applications. For PMTs and MCPs we offer different preamplifiers and a variety of routing devices for multi-detector operation. For a perfect SYNC signal, trigger modules and a SYG are available.
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Dual Circular Polarization Conical Horn Antenna
ZLB7-SJ22-33G-1078
Dual Circular Polarization Conical Horn Antenna, Frequency 22~33GHz, Gain 15dBi, 2.92mm Female Connector
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GC System
Gas Chromatography System
Shanghai Selon Scientific Instrument Co. Ltd.
An analytical tool used to separate, identify, and quantify individual compounds in a complex mixture.
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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Equipment Failure Diagnosis System and Safety Management System
A system for diagnosing failures of rotating machinery such as turbines, motors, pumps, fans, and compressors, which are major facilities in nuclear power, hydropower, thermal power plants, petrochemical plants, shipbuilding, and aviation, through displacement sensors.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Augmented Reality Systems
ARTIST replaces current limited, live-fire or laser-based training, while enhancing both training effectiveness and efficiency. Our system saves ammunition costs and cuts logistics, giving personnel quality training time.
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Flexible Switching System
S6400D
Universal Switching Corporation
High performance and expandable, the third generation S6400D offers coaxial switching configurations as small as 8x8 and can be expanded to a full 64x64. Simply install more modules in the field. Configurable for Video, RF, IF, Data and many other types of signals.
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Version Control System
Helix Core
Perforce Helix Core is the leading version control system for teams who need to accelerate innovation at scale. Store and track changes to all your digital assets, from source code to binary to IPs. Connect your teams and empower them to move faster and build better.
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Log Periodic Antenna
ZDS7-1-6G-832
Log Periodic Antenna, Frequency 1~6GHz, Gain 9dBi, VSWR 2.5, Linear polarization, N-Female
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Dimensional Metrology System
PINNACLE PLUS
Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/
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Stacked Logarithmic Periodic Broadband Antennas
Dual Polarised LPDA
Linear dual polarized Logarithmic Periodic Broadband Antenna (Aluminium tubing) for Receive and Transmit Applications.
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Condition Monitoring System
Cut costs and boost productivity with a condition-monitoring tool designed for ease of use and scalability. The Dynapar OnSite™ system is a powerful predictive maintenance system targeted at preventing failures before they occur. It can slash unscheduled downtime, improve efficiency of route-based vibration analysis, and provide real-time analytics and trending to warn of possible machine failures.
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Power System Operations
Schweitzer Engineering Laboratories, Inc.
Automate data collection, concentrate phasor data, and analyze data with real-time analytics.
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Sonar systems
For surface ship applications Ultra has developed a comprehensive, fully-integrated sonar system, comprising both on-board sonars such as hull-mounted and towed arrays. This modular system fuses data from own-ship and off-board sensors to build a complete underwater tactical picture delivering a bi-static sonar capability.
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Cable and Antenna Analyzer
iVA-0627A-NC
iVA Cable & Antenna Analyzer System, Type N male connector with Neoprene Soft Case
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Intelligent Systems
Technologically advanced machines that perceive and respond to the world around them.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Deposition Systems
When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Photovoltaic/Solar Metrology System
Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
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Battery Testing Systems
The CT2001 series Battery Testing Systems are designed for energy storage materials research and battery test. The eight channels are independently programmed and controlled by the computer. The Current ranges are from 1 mA to 5 A and Voltage ranges from 2V to 15V. Each testing system is specifically built for customer needs.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
