Incircuit
See Also: In-circuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
In-Circuit Emulator - 80C186/80C188 Family
DS-186
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* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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Product
Modular In-Circuit & Functional Test System
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Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
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Product
Turn-Key Functional / Mechanical Fixture
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In addition to In-circuit testing, functional testing is widely used in the industry to verify electronic cards. This is why ReMaTek has always paid a special attention to the specific requirements of functional testing. Our dedicated engineering staff is prepared to handle all of your mechanical, electrical and software requirements. We are aiming particularly the small turn-key test systems where all the elements; the mechanical fixture, the test equipment and the test software, are put together in a complete system.
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Product
ISP Programmer Superpro Is01
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Features:Until now,Support IC manufacturer, pcs devices and keeps growing.1)High speed thanks to the flexible hardware engine. Programming speed adjustable for complicated application environments brought by user target board, length of ISP cable etc.2)Stand-alone and PC-Hosted (USB2.0 High Speed) dual mode;3)Supports ISP programming of devices with I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 and any other serial port.4)ATE interface;5)Over-current and ESD protection to protect your equipment;6)DLL and API for easy integration into customers’ system.Hardware Specifications:1) ISP cable integrates I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 interfaces。2) VDD (0-5.5V /0.5A) and Vpp (0-15V / 0.2A) lines provided to power the target board and the target devices.3) Cable driver circuit supports target devices of voltage level 1.5-5V and is ESD protected.4) USB 2.0 (high speed) interface for PC hosted mode and management of project files on SD card.5) A 20 Characters x 4 lines LCD and a 6-key keypad are built with it for stand-alone operation. In stand-alone mode project files are stored on the SD card (up to 16GB). The number of the project files is limited only by the capacity of the SD card.6) ATE interface is built for easy external hardware control. 6 lines SEL0-SEL5 are for project selection (maximum 64 files); 2 command lines START and STOP; 3 STATUS lines PASS, FAIL and BUSY. All signals are optical-isolated.7) A universal AC adaptor of DC12V/2A is included for power supply.8)WINDOWS XP/Vista/Win7/Win8/Win10 32/64bit compatibility.Software Specifications:1) Supports almost all devices with ISP interface.2) Supports Jam and Staple files from ACTEL and ALTERA; Direct C files from ACTEL.3) Programming speed selectable (High, Normal and Low) for complicated applications such as different cable lengths, different target load characters.4) Dynamic buffer function. Application examples include device S/N, MAC address, frequency or transducer calibration etc.5) File format on SD: FAT16, FAT32.6) Functions for IP protection: Project security, SD security, batch control, administration management etc. 7) API and DLL provided for easy integration into customers’ system like ICT and ATE.8) Software provides the features for multiple units to work concurrently controlled by USB HUB.Applications:1)R&D application like in-circuit test and debug.2)Volume production. Devices may be programmed after the board is fully assembled. One example is the serial number writing to an on-board serial device.3)Field application. Comes with portability, stand-alone mode and mobile data storage media (SD card), it is suitable for field test, debug and data acquisition.4)Third application modules. Friend s/w interface (DLL and Virtual Com communication command set) and h/w interface ( ATE and USB) are provided and make it very easy for customers to integrate ISP01 as a functional module into their systems. One example is the ICT equipment. With this integration user can finish in-circuit test and in-circuit programming in one step.
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Product
Flying Probe Tester
Condor MTS 505
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Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Product
Aeroflex AIDE
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This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
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Product
Hardware Debug Interface & Stand Alone Programmer
Cyclone PRO
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P&E Microcomputer Systems' Cyclone PRO is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale HC08, HCS08, HC12, HC(S)12(X), and RS08 microcontrollers. Now featuring support for Freescale's ColdFire V1.
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Product
In-Circuit Test
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Test Coach has been delivering the highest quality in-circuit test programs since 1998. Our engineers have the education, experience and expertise needed to solve your most challenging test requirements. We partner with our customers to provide comprehensive test solutions, including consulting on: design for test, recommendations on the best hardware and software options to implement, test strategy, and long term planning for multi board projects. Our expertise allows us to really understand customer requirements, so that quotes are accurate and timely. However, we also understand that sometimes projects can change scope. At Test Coach, we have the flexibility to adapt to changes with as little impact to delivery as possible.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
In-circuit ESR Meter
Capacitor Wizard
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The Capacitor Wizard® finds bad capacitors IN CIRCUIT by measuring a capacitor's ESR (equivalent series resistance). A good capacitor should have very low ESR. Weak and bad capacitors have much higher ESR. The Capacitor Wizard® will SPEED UP YOUR REPAIR.
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Product
Active Differential Probe, 100 kHz to 7 GHz
U1818A
High Frequency Probe
The Keysight U1818A 100 kHz to 7 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818A allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Product
Manufacturing Defects Analyzer
eloZ1-1600
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
In-Circuit ESR & DCR capacitor Tester
236
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This In-circuit ESR & DCR capacitor tester is designed to measure ESR (equivalent Series Resistance) on capacitors range from 0.47uF to 2200uF, in or out of circuit. The ability to trouble shoot in-circuit saves time and makes the 236 a must for anyone that tests or trouble shoots PCB (printed circuit boards).
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
New Generation Vacuum Box for the 3070 Test Platform
Vortex Series
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The Vortex Series is a new generation vacuum box for the 3070 test platform that will easily revolutionize in-circuit test. The simplified and streamlined design allows for maximizing the usable testable board size of the Vortex 100 Performance Grade fixture. The rugged all aluminum design maximizes the opening angle of 85° ideal for Cobot usage, while eliminating the top plate and associated hardware and retaining our classic quick plate guided probe technology.
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
In-Circuit Tester
Eagle MTS180
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The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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Product
Automated Inline In-Circuit Test Solutions
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Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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Product
High Node Count In-Circuit Test Fixtures
HNC Test Fixture
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Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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Product
Stand-Alone Programmer and Hardware Debug Interface
Cyclone MAX
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Cyclone MAX is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale ColdFire V2/V3/V4, Power Architecture 5xx/8xx, Power Architecture 55xx/56xx (Nexus), and ARM (MAC7xxx) microcontrollers.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Wireless Test Fixtures
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At Forwessun, we have vast experience in designing and delivering wireless in-circuit test (ICT) fixtures. We have experience in providing fixtures tailored to the unique needs of various different industries. While our primary customer focus has been on full and half-bank fixtures for the HP3070 system, we offer bespoke solutions for other platforms as well including GenRad, Teradyne, and SPEA systems.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Product
Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Multi-Stage In-Circuit Test Fixtures
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
In-Circuit Testing and Test Engineering
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5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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