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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Reach-In Altitude Test Chamber
Weiber Altitude Test Chamber combine temperature and altitude to test basic components or subassemblies designed for use in a variety of industries. With altitude test chambers, user can control the temperature environment for testing while simulating various altitudes from site level to 10,400 meters (25kPa). Altitude testing may be continued without temperature control up to 600,000 meters (0.1 kPa).High Low Temperature Altitude Test Chamber is used to test temperature and low-pressure altitude conditions simultaneously. Two common applications of High Low Humidity Altitude Test Chamber are testing of avionics or other aerospace equipment to simulate actual conditions, and simulate high-altitude conditions found in mountainous regions or other regions. All models are factory tested, with an ergonomic and maintenance cum user-friendly design. These CE approved test chambers are created with multi-layered insulation with double vapour barrier is of low 'K' factor, high density and of non-hygroscopic in nature. Weiber test chamber are made in accordance with the international standard. Weiber Test Chambers are GMP complaints and are also ISO and NABL certified.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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PNA-X Microwave Network Analyzer
N5241A
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Fixture Self-Test Controller and Calibration Check
AQ818
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Automotive Test Platform
ETS-800
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Testing Service
CloudTesting™ Service
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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150 Amps, 10 MHz BW Current Probe - AC/DC , 500 Amp Peak Pulse
CP150
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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VITA 62, 3U Test Fixture
TF-3U-7B041-1
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Reach-In Ageing Test Chambers
Aging Chamber has been designed to simulate environmental condition to test the stability and reliability of products under stressed environment. Weiber is a leading manufacturer and supplier of Aging Test Chamber in India and abroad. Weiber offers scientific equipments at the most economical rates and versatile design. Microprocessor based Aging Test Chambers are made in accordance with the international testing standards. The equipments are NABL, NSF certified and CE approved. Aging Chamber maintains 25% to 95 % RH. The Test Chamber is digitally controlled delivering accurate result under controlled environmental conditions. This chamber also known as Accelerated Ageing Test Chamber.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
