EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Product
Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Product
System Accessories
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To support the full need of the application Elma offers a comprehensive range of system level accessories to include: I/O solutions, HMI Displays, System/Power Management, Test/Development Boards, and Mechanical Mounting products.
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Product
Air Data Test Set System
B511
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The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Product
Parallel systems
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Did you know you can couple several Gill AC, Gill 12 and Weld Testers together or any combination of Gill AC, Gill 12 or Weld Tester, to give you a parallel logging multiple Potentiostat / Galvanostat / ZRA / FRA system, capable of recording from each working electrode at up to 60 readings per second. Coupling several Gill ACs or Gill 12s together gives the added abilities of the Weld tester and the ability to perform fast sweeps. Using our latest software, it has never been easier to couple instruments together to provide a Parallel System. In fact up to 32 instruments can be controlled at the same time. These instruments can either have individually enclosures or be rack mounted.
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Product
Handset Noise Under RF Test System
BK8021
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If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Application-Specific Test Systems & Components
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Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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Product
AC Hysteresis Graph Test System
DX-2012M
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Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Product
Lamp Cap Temperature Rise Test System
CX-T1
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Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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Product
Analysis System
Neptune (EDS-WDS)
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By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
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Product
System
SYS-28
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This 28" box coater has a separately ventable top chamber, to allow for faster parts changes and increased productivity. It also is equipped with our FTC-620 flip controller. The flip and rotation motors can be seen on the top. This system uses a Varian tri-scroll pump and a bottom mounted 16" APD cryopump.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Pneumatic Horizontal Shock Response Spectrum Test System
KRD15 series
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KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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Product
Various Systems
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Our experienced and highly qualified engineering team enables Innco systems to offer a wide range of possibilities to design positioning systems according to your specifications or measurement applications.The control of the system, singular or complex can be realized with our standard CO3000 controller, which allows connections to your measurement systems by GPIB or LAN.
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Product
Camera Barrel Test System
BK8612
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We designed the BK8612 2 Channel Noise Test System to provide noise and vibration testing for your digital camera barrel DC Motors. Because it is based on the BaKo BK2120B DAQ, it is capable of monitoring a microphone and an accelerometer concurrently to obtain data from the motor. Because you can change the parameters of functions and limits, it is versatile but still quick and easy to set up. In addition, you can look at data in real time and also store it for future analysis. Easy to use and set up, fast and accurate; if you need to maintain the quality of your camera barrel motors, this is the tester you want.
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Product
Electrodynamic Vibration Test Systems
CV-series
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CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Product
LT-200A Aging-Life Test System For LEDs
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Product
Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
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The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Hydraulic Vertical Shock Test System
KRD10 series
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KRD10 series full-automatic hydraulic shock test system is used to measure and determine the impact resistance of products or packaging, and to evaluate the reliability and structural integrity of products in a shock environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests to achieve the shock wave and impact energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Tensile Testing System With Thermostatic Chamber
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This thermostatic chamber is ideal for long-stroke tensile testing of large-elongation materials such as rubber and plastic in controlled temperature environments.
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Viscosity Systems
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Viscometer utilizes a unique vibratory principle to provide continuous measurement at on-line process conditions. This eliminates the need for sampling and provides exceptional accuracy.
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Battery Testing Systems
BTS1
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Air battery test cell for laboratory electrochemical experiments and air electrode research. The transparent acrylic structure allows clear observation of internal reactions, while 304 stainless steel components provide corrosion resistance for reliable testing.
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MOCVD Systems
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For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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High Voltage Isolation Test Systems
HT 9460 and 9464
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Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge.With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices.
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Product
Complete Systems
Universal Testing Device
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The universal testing device is intended for a diverse range of measurement and automation tasks in laboratories and in test engineering. Thermocouples, RTDs and other sensors can be directly connected. Electrical AC/DC values can also be acquired with the universal testing device.
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Product
Test Case Management System
Kiwi TCMS
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The leading open source test case management system. *Efficiently manage test cases, plans and runs*Improve testing productivity & reporting*Integrates with popular issue trackers*External API interface*GPL 2 licensed
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In-Circuit Test Systems
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Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Product
Terahertz Systems
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Optoelectronic Terahertz-Generation. TOPTICA provides complete systems and components for both time-domain and frequency-domain terahertz generation. For time-domain applications, the TeraFlash sets new standards in terms of dynamic range, bandwidth and measurement speed. Combining TOPTICA's FemtoFiber smart laser technology with state-of-the-art InGaAs antennas, the system achieves a peak dynamic range of more than 90 dB and a bandwidth greater than 5 THz.





























