X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Scanning Mobility Particle Sizer Spectrometer
3938
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TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials.
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Integrating Sphere FT-NIR Spectrometer
QuasIR 3000™
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The QuasIR™ 3000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
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XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
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Large-Area CMOS X-Ray Detector
Rad-icon
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Teledyne DALSA’s Rad-icon product family of large-area digital x-ray cameras offers users a high-speed, high-performance x-ray imaging detector with a fast, reliable PC interface (either GigE or CameraLink) for easy integration.
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Product
CiCi-Raman-NIR Spectrometer
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HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA OEM has pioneered Raman systems for spectroscopy, designing and manufacturing them for over four decades. We provide miniature spectrometers and systems for industrial applications such as process control, security, pharmaceutical, medical and semiconductor. The CiCi-Raman-785 is our high performance spectrometer featuring an aberration-corrected concave holographic grating configured with Horiba Scientific's Syncerity™ TE-cooled CCD camera with a VIS-NIR 2048 x 70 detector, in a TE-cooled Head at -50° C.
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AOTF-NIR Spectrometers
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Brimrose’s rugged and high-performing on-line NIR process spectrometers deliver fast-response and multi-component analysis for a variety of process applications for many industries, including pharmaceutical, food & dairy, chemical, polymer, petrochemical, agricultural, seed, pulp & paper, and olive & grape industries. The AOTF technology enables Brimrose spectrometers to scan very fast (up to 16,000 wavelengths per second) and without moving parts.
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Modular Spectrometers
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B&W Tek boasts one of the most comprehensive lines of UV, Vis and NIR spectrometer modules on the market. Combined with our wide selection of spectroscopy accessories, we offer you nearly limitless utility. Due to their small form factor and customizable software control systems, fiber optic spectrometers are the ideal choice for both integration into your OEM system and for the laboratory, where you can combine modular products to form a complete solution.
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
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Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Polychrometer (multichannel spectrometer)
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It is a spectrometer that reduces the aberration of the optical system to the utmost limit because it measures effectively using multichannel detectors such as CCD, CMOS, InGaAs etc. Since the spatial resolution is high on the whole surface of the light receiving surface of the detector, it can be used for the following applications.
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Product
X-ray Inspection Of PCB Boards And More
The RTX Series
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Glenbrook’s RTX Series of modular, real-time systems include models designed to meet a variety of production requirements including circuit board components. Numerous options make it easy to customize any RTX model to your specific application. All hardware and software elements are fully compatible to ensure the continued value of your equipment.
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Spectrometer
AirSPEC
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Baltic Scientific Instruments, Ltd
Scintillation gamma-ray spectrometer AirSPEC is intended for measuring scintillation spectra and alsofor determination of activities and specific activities of radionuclides in samples and in conditions of natural occurrence in geometries 2 and 4.Spectrometercan be usedfor various tasksradiation monitoring, including the definition ofspecific effective activity of naturally occurring radionuclides (NORM) in building materials (granite,crushed stone, gravel, etc.), raw materials, products, waste industrial productionand rockswithoutsampling; measurements surface activity of the radionuclide 137Cs (and other); mass fraction of NORM in rocks andoresin the conditions oftheirnatural occurrence on a surface, inboreholes and in warehouses andtransportcontainers, and also in study ofsurface contaminationof soil,as well asprospecting and exploration ofmineral deposits resources.The spectrometercan be used forworkin the laboratoryand in the field conditions.
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X-Ray Inspection System
MX1
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Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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WDXRF Spectrometer
S8 TIGER Series 2
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Thanks to HighSense technology the S8 TIGER Series 2 WDXRF spectrometer delivers for all elements accuracy and precision for industrial quality and process control. With high resolving WDXRF technology and optimal detection of light, medium and heavy elements based on the new HighSense beam path, the XRF2 mapping tool of the S8 TIGER Series delivers best sensitivity, smallest spot size, and highest resolution for small spot applications. Ergonomic and failsafe operation are vital for efficiency and best analytical data. Simple, intuitive start of samples are guaranteed with the multilingual TouchControl interface.
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Benchtop X-ray diffraction (XRD) instrument
MiniFlex
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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X-ray Inspection System
JewelBox-90T/100T/110T™
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All JewelBoxes deliver precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and image distortion prevalent in other systems.
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FTIR Spectrometers
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Fourier Transform Infrared (FTIR) spectroscopy is a non-destructive analytical technique that can be applied to solid, liquid, and gas samples. Measuring the mid-IR spectral range, from 4,000 cm-1 to 400 cm-1, the technique detects vibrational transitions of molecules, therefore an FTIR spectrum contains vibrational information on the sample studied.
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Spectrometers
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BaySpec offers wide range of spectrometers from miniature handheld VIS – NIR - SWIR spectrometers, high-sensitivity UV – VIS – NIR – SWIR spectrometers, and CCD / InGaAs cameras. They are designed to meet real-world challenges for best-in-class performance, long-term reliability, compact size, and ultra-low power consumption. All these products provide fully customized OEM and ODM service to meet your spectroscopic needs.
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High Energy Industrial CT X-Ray Inspection System
MeVX Series
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The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
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mm-wave Bridges for EPR/NMR Spectrometers
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ELVA-1 produces mm-wave bridges and components for EPR spectrometers. Lots of scientific laboratories in the world use ELVA-1’s products in their EPR experiments. Up to 170 GHz operating frequency
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Bench-top Raman Spectrometer
MacroRAM™
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Bench-top Raman Spectrometer - Best in Class Raman Sensitivity and Software, with Class 1 Laser Safety. The new MacroRAM Raman spectrometer brings simplicity to Raman measurements without compromising the ability to handle even the most complex samples. Its compact and robust design, including Class 1* laser safety means it''''s safe for use in most environments, from undergraduate teaching labs to industrial QC applications.
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Spectrometer Module
Jaz Series
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The Jaz spectrometer brings you an unparalleled level of flexibility. Its unique features and expandable platform make it a good choice for applications in the lab or in the field, including greenhouse lighting monitoring, remote sensing, process flow, quality assurance, life sciences and many others. Our customers have taken Jaz to wheat fields to detect blight infection, to Mt. Everest to measure UV intensity, and to Greek islands to measure reproductive success of orchids.
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For Real-Time X-ray Inspection Systems
Image Processors
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A number of image processing software packages are available. Features include frame averaging, measurement, text, label, marking, 3-D rendering, video recording and image storage. Additionally, BGA analysis and void measurement software can be added as well as other options. See our image processors for x-ray inspection machines below.
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X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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Product
Raman Spectrometer
Spec 64
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The fiber coupled high speed Raman spectrometer is optimized for maximum light throughput and high speed spectrum acquisition. Connected to an AFM or a scanning stage, high speed Raman imaging is possible due to an integration time down to 10 ms per spectrum. The spectrometer can be operated with a separate software as stand-alone device or synchronized via the Anfatec AFM software.
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Detachable X-Ray Detector
RadEye HR
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The Remote RadEye HR x-ray detector is a slim, lightweight, rugged solution for high-resolution radiation imaging. The detector is suitable for industrial inspection applications where images are taken in tight or difficult-to-reach spaces.
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ICP-OES Spectrometers
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ICP-OES spectrometers measure the concentration of elements from ppb to % using de-excitation of atoms and ions in a plasma. The robustness of our Ultima ICP spectrometers makes them ideal for applications common to mining, chemicals manufacture, salt production, wear metals in oil analysis, petrochemical, metallurgical production and precious metal refining.
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Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
