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Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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SWB-2816, 8x46, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-16
8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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2 GHz Dual 1:4 RF Mux, 50 Ohm Module for 34970A/34972A
34905A
The Keysight 34905A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation.
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Quad 4x32 Reed Matrix for 34980A
34934A
The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Edge Press Technology Bed of Nails Testers
Prober Edge Press Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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IP X3, X4 - Rain Test Chamber
The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers are such Rain Testing Machines/Chambers used for the testing of automobiles, electronic parts and components, light equipments, voltage cabinets and other wide variety of products under a rainy environment. These IP Test Chamber and IP Testing Chambers are designed to simulate specific environmental conditions, mimicking a natural rainy weather, to test the seals and water proofing capacity of the equipment and devices, thereby providing an estimation of the product performance over a period of time.
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Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
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Keysight Dual 4x16 Armature Matrix for 34980A
34932A
The Keysight 34932A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x16, 8x16, or 4x32 configurations 128 2-wire cross-points 300 V, 1 A switch; 2 A carry current Connections to the internal DMM Latching armature relays, with relay counter Expandable via four 2-wire analog buses
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Power Supply Testers
Qmax Test Technologies Pvt. Ltd.
Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one.
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SWB-2810, 4x43, 1 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-10
4x43, 1 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-14
8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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SF6 Density Meter Tester
JHMD-1
Xiamen Jiahua Electrical Technology Co.,Ltd
JHMD-1 is a smart tester. By using high accuracy core units, pressure sensor, A/D, D/A transducer, 32 bit ARM MCU and TI company’s high speed signal chip, it can automatically calibrate the density relay, measure pressure at signal activity temperature, convert pressure from any temperature to 20℃ standard pressure, print test data and save for review. It identifies the fault during the test. The whole procedure is under automatically operation, JHMD-1 is a high accurate, high stable, reliable tester.
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Calibration Standard
MM14
The MM14 is a digital technology pressure standard calibrator. It consists of a variety of components combined to allow ease of operation for the verification of pressure based UUTs (unit under test) such as Air Data Test Sets.The MM14 utilises a very accurate dual pressure transfer standard generator, a reference Primary Standard dead-weight and PC based operating system for automatic verification of the U.U.T.
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Digibridge
1659
The GenRad 1659 Digibridge RLC Tester is an easily programmable, microprocessor-based high performance passive component tester. It automatically identifies the type of component under test and measures in the proper range. The result is simple, precise, unambiguous RLC component testing. The GenRad 1659 RLC Digibridge is an instrument for measuring primary parameters of inductance (L), capacitance (C) and resistance (R) and secondary parameters of dissipation factor (D) and quality factor (Q). GenRad designed this single compact unit with maximum flexibility and operator convenience in mind. The simple front panel design of the Digibridge requires less effort to operate. Digital display and user friendly control allows test parameters and limits to be set easily.
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Electrical Insulation Tester Kit with Dual Display
420001
When undertaking power installations, the 420001-insulation tester can provide special help to test wiring. This unit can provide 125V,250V, 500V and 1000V source for the test, and under each range it can supply 1mA current to feed the capacitance load. With the auto-range function, it can measure up to 4,000 Megaohm with the resolution of 1Kohm.
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Multiport JTAG Tester
XJQuad
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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PXI Source/Measure Unit
Keysight PXI source/measure unit (SMU) offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. It delivers industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading for faster test time.
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Transmission Performance/Endurance Test System
This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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High Temperature, Low Strain, Extended Performance Capacitive Extensometers
Model 7650A
Jinan Testing Equipment IE Corporation
Model 7650A extensometers measure strains with extremely high precision due to their design features and low strain range. All models are capable of tension and compression strain measurement, and may be used for fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650A models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to provide high accuracy, high resolution measurements and perform high temperature fatigue testing at the highest possible frequencies. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods for specimen contact when testing to 1200℃ (2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.The Model 7650A is often customized for specific test needs. Contact Epsilon for a configuration that matches your requirement.
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PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Press Down Rods Bed of Nails Testers
Prober Press Rods Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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SIMRC - RS232 to I2C Converter PCB
1080-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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High Voltage Surge Current Monitors
HVSCM
Designed to be used with the Model HVST High Voltage Surge tester. The Surge Current Monitor allows simultaneously surge testing 20 units. The Surge Current Monitor monitors the current going through each unit under test at the time of the surge. If a unit under test breaks down or leaks, the Surge Current Monitor will identify the bad unit by lighting the corresponding LED. The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. In production testing we expect that most of the time the devices will pass. In the event that one should fail, the failed device would be removed and then all the parts would have ot undergo another surge test. Since most devices pass most of the time, simultaneous surge testing can be a real time saver.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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22 Bit / 2 MS/s Arbitrary Waveform Generator
AWG22
The AWG22 is a 22 bit Arbitrary Waveform Generator for medium-speed / high resolution waveform generation. The module combines an exceptional dynamic performance with a very high DC accuracy.The AWG22 is upwards compatible with the AWG20 and also features differential outputs with a programmable common-mode voltage.The module has 8 output ranges starting at 80mVpp up to 10.20Vpp, which covers a wide range of Unit Under Test input voltages.
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PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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On-board Emissions Measurement System
OBS-ONE PM unit
OBS-ONE PM unit is the industry-leading on-board Particulate Matter (PM) measurement system. It collects PM on a filter paper, using a partial flow gravimetric sampling method, while simultaneously measuring real-time PM. A key feature of this design is the use of a venturi flow meter which enables reliable proportional sampling and accurate exhaust gas flow measurement under transient flow conditions. Combine the GAS unit and PM unit to perform certification tests on heavy duty and non-road vehicles.
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SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
