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Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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AC Fuel Flow Signal Generator
TA-100
The TA-100 signal generator was designed to facilitate testing of aircraft fuel flow indicators that require two input signals designated as “Drum” and “Impeller”. This generator provides both signals so as to provide a direct interface to the fuel flow indicator under test. The generator also provides switched power out to the unit under test as well as a 5v source for testing the bezel lighting. The original design was built around the requirements for the AMETEK series indicators (pn: 10171 series). This generator simulates a reference and a time delayed signal of appropriate amplitude for an indication of up to 1200pph for the indicator under test. The “PPH Select” switch provides fixed signal delays representing 0, 200, 400, 800, 1000 and 1200pph flow rates respectively, this provides the mechanic with an expedient check of the indicators accuracy. The “PPH Adjust” control allows the mechanic to vary the signal delay throughout the full range and serves as a good method for checking of pointer smoothness from stop to stop. The unit’s front panel also provides test jacks to monitor the “FDR Output” as well as the drum and impeller signals. The TA-100 requires only 28Vdc to operate. This generator provides a very economical approach to any repair facility or flight department as it becomes an alternative to purchasing two bench top signal generators. The TA-100 generator at the very least can provide a simple functional test and eliminate the high cost of exchanging an indicator as a function of troubleshooting the aircraft system.
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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RF Microwave Switch Matrices
RF Microwave Switch Matrices provide automatic routing of RF microwave signals between test instrumentation and the unit under test (UUT). They provide consistent signal paths, enable automation of tests, and often include signal conditioning.
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VXI Analog Instrument
Ai-710
The Ai-710 is a Core System Instrument (CSi)—a single-slot, multi-function VXI analog test instrument. It eliminates the requirement for multiple discrete instruments that often provide inadequate test coverage for newer Units Under Test (UUTs). The single-slot VXI form factor reduces tester footprint, as well.
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Digital and Analog Test Sets
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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96 Channel DPST Relay And Control PXI Carrier Card
GX6196
The GX6196 is a 6U PXI switch and control board that can be used to create custom switching, signal conditioning, or specific UUT control interfaces. The board provides 96, 2 pole, form A relays, 8 digital I/O lines, and a serial digital interface. All of these resources are available via (5) inter-board connectors which interface to the user defined daughter / mezzanine board. The mezzanine board provides all connections to the unit under test (UUT) via two 78 pin D-sub connectors. The GX6196 is supplied with a front panel which accepts (2) 78 pin D-sub connectors.
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Partial Discharge Detector
APD-ANNUNCIATOR
The APD-ANNUNCIATOR is a remote partial discharge detection equipment inside any energized cabinet. The probe is installed in the unit under test, instantly reporting its status. This equipment gives a great benefit because it avoids long term damage to the switching equipment.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Automated Bench Test Equipment
The Automated Bench Test Equipment (BTE) provides a combination of automatically sequenced and manually selected electrical or electro-mechcanical stimulation to an electronic or electro-mechanical unit under test. The system simulates the normal and threshold operational ranges of each of the inputs and communication channels of the unit under test.
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Multiport JTAG Tester
XJQuad
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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RS232 9 Way D-Type lead
1081-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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Press Down Rods Bed of Nails Testers
Prober Press Rods Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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SWB-2816, 8x46, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-16
8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, … individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Thermal Shock Testing
DATASYST Engineering & Testing Services, Inc.
Thermal shot testing is a accomplished through the use of two-zone temperature chambers where the unit under test is shuttled between chambers.
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Interface Panel for SLSC
THROUGHPOINT™
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
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SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781421-11
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Intermittent Fault Detection & Isolation System
IFDIS
The IFDIS™ uses patented Intermittent Fault Detector technology that simultaneously and continuously monitors every circuit path within a Unit Under Test (UUT) - such as a Line Replaceable Unit (LRU) chassis' interconnects - for intermittent continuity failures that occur for as short as 50 nanoseconds. This state of the art technology is combined with an environmental chamber and vibration table, which simulate the UUT’s operational environment and cause intermittent faults to manifest, creating a system that is unsurpassed in intermittent fault detection.
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SIMRC - RS232 to I2C Converter PCB
1080-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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SIGNAL & POWER ISOLATOR
EE301-ISOL
The EE301-ISOLATOR will completely isolate your electronic loads inputs & outputs signals plus ground returns from the main power input UUT (unit under test)... The module allows you to control the electronic load just as you would with any standard control signal. Input / Output & Power signals are fully isolated up to 350 VDC.
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SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781421-14
8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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LXI Low-Frequency Matrices
Our LXI low-frequency matrices provide complete flexibility for connecting test equipment and the unit under test (UUT)together and are compliant with LXI Standard 1.4
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Adjustable Press Plate Bed of Nails Testers
Prober Adjustable Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Averna LAUNCH
Are you optimizing your time managing your smart data? Averna Launch consolidates all test data from your smart factories and delivers results in both real-time and user-friendly reports. By automatically detecting the unit under test (UUT) Launch runs all required test sequences, predetermined by you.
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SWB-2817, 16x22, 0.3 A, Reed Matrix Module for SwitchBlock
781420-17
16x22, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2817 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Embed functional-test
ScanWorks Embedded Diagnostics
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
