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Transceiver Test
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Benchtop Femtosecond/Picosecond Lasers and Amplifiers
The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Transceiver Testing
Family of RF test systems designed for transceiver testing. Designed for radio-to-radio testing in a closed mesh network. Step attenuators allow you to dynamically fade up/down the RF signal between radios. These Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted remote commands.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Testing Service
CloudTesting™ Service
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VXT PXI Vector Transceiver, 300/600/1200 MHz Bandwidth
M9410A
The Keysight M9410A VXT PXIe vector transceiver integrates a 6 GHz vector signal generator and vector signal analyzer in a 2-slot PXIe module.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver
786853-01
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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6TL23 Off-Line Seat Operation Base Test Platform
H71002300
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-02
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-01
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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PXIe-5841, 6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver
785832-01
6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver - The PXIe-5841 is a vector signal transceiver (VST) with 1 GHz of instantaneous bandwidth. It combines vector signal generator, vector signal analyzer and high-speed serial interface capabilities with FPGA-based real-time signal processing and control. The PXIe-5841 features the flexibility of a software defined radio architecture with RF instrument class performance. This VST delivers the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5841 is available with an optional high-performance local oscillator module for improved phase noise, measurement time, and EVM performance. You can use the VST to test a variety of cellular and wireless standards such as Wi-Fi 6 and 5G NR. In addition, you can expand the small, two slot 2U PXI Express form factor to support multiple input, multiple output (MIMO) configurations.
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PXIe-5645, 6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver
782377-01
6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver—The PXIe‑5645 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5645 offers the flexibility of a software defined radio architecture with RF instrument class performance. The PXIe‑5645 features a high-performance, differential or single-ended baseband I/Q interface. This interface allows the PXIe‑5645 to address many additional applications, such as testing both the upconverted RF and downconverted baseband signals of a device with a single instrument.
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PXIe-5820, 500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver
783967-01
500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver—The PXIe‑5820 is the baseband model of the second-generation vector signal transceiver (VST) with 1 GHz of complex I/Q bandwidth. It combines a wideband I/Q digitizer, wideband I/Q arbitrary waveform generator, and high-performance user-programmable FPGA in a single 2-slot PXI Express module. You can use the VST for a variety of applications including baseband I/Q test of wireless and cellular chipsets; envelope tracking of digitally predistorted waveforms for power amplifiers; and the generation and analysis of new wireless standards such as 5G, 802.11ax, and LTE-Advanced Pro.
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Fixture Self-Test Controller and Calibration Check
AQ818
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
