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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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EHC-03 Basic Corrosion Thickness Gages
EHC-03
Danatronics is pleased to welcome our EHC-03 to our corrosion thickness gage family. The EHC-03 is designed to accurately and non-destructively measure metal structures subject to corrosion.
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Thick Film Passive Element
GBR-403
GBR-403 series high voltage resistors are made in a thick film technology on ceramic substrates (Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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Thickness Gauge
EV 01
EV 01 Thickness gauge series are special thickness gauges, with the possibility of many different applications, measuring foot and table.
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Diode Submounts
Ultra-precise patterning of thin film metals on dielectrics with high thermal conductivity are used for diode submount applications. Via the acquisition of Ion Beam Milling, Inc., SemiGen is the industry leader for laser diode submount fabrication. As each application is different, we work with customers to develop a custom design that perfectly fits their requirements. We have experience producing circuits utilizing substrates of varying thicknesses with high thermal conductivity such as alumina (Al), aluminum nitride (AlN), and beryllium oxide (BeO). SemiGen can deliver laser diode submounts with or without Au/Sn pads depending on your needs.
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Compact Coating Thickness Gauges
MP0 Series
Ultra compact pocket coating thickness gauges for simple, fast and nondestructive coating thickness measurement on virtually all metals or only on steel/iron
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Thickness Tester
Shenzhen UYIGAO Electronic Technology Co., Ltd
The coating thickness gauge is designed for non-destructive, fast and precise coating thickness measurement.
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Ultrasonic Thickness Guage
KM 130D
Kusam Electrical Industries Limited
Ultrasonic Thickness Guage is an intelligent hand held meter which adopts ultrasonic measuring principle, & is controlled by micro processor, provides quick & precise measurement of thickness for most of industrial material. This unit is widely used in various precise measurement for different hard ware / parts in industrial realm; one of its important application is to monitor the level of thickness-decreasing during operation of various & pressure container. Diffusely applied in manufacture fields, metal processing, and commercial inspection. The material that conduct & reflect constant sonic velocity, this product is to be applicable to used.
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Scatterometers/ Thin Film Metrology Systems
LittleFoot Series
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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Continuity of Insulation Tester (High Voltage Method)
ZGQ-16B
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-5;Inspection standard: JB/T4279.13-2008Meet GB/T6109-2008 standard requirementsUsed to test the Insulation continuity (namely the pinhole number of enameled wire sample per unit length) of enameled round wires with nominal conductor diameter ranging from0.05mmto1.60mm;8 level test voltages can be selected by pressing button: 350V, 500V, 750V, 1000V, 1500V, 2000V, 2500V and 3000V;Test length ranging 0～99m;Application of SCM control.Automatically complete test process, display wire testing length and pinhole number;Brushless driving motor, guide pulley and take up pulley are equipotent.The electrode insulation to ground, using high resistance material of non-hygroscopic, no leakage, no tracking, easy to clean, Insulation thickness can ensure long-term 3000V voltage effect.Circuit board is subject to anti-static and moistureproof and long-time aging treatment, has more stable quality and higher durability;
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Pinhole Detector
NOVOTEST ED-3D
NOVOTEST ED-3D Pinhole Detector was designed for rapid non-destructive testing of the continuity of coating (e.g. porosity of film) with thickness up to 500mkm according to ASTM G62-A.Pinhole Detector is designed for testing the porosity of partially painted places and other discontinuities of protective dielectric coatings on metal products by putting low voltage through a sponge which is soaked in a liquid electrolyte with high penetrating properties.
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Non-contact Film Thickness Measurement
ALTO-IRT-7000
ALTO-IRT-7000 (IMPEDANCE RESONANCE TECHNOLOGY ) FILM THICKNESS METROLOGY TOOL UTILIZES NON-CONTACT CAPACITIVE AND EDDY CURRENT TECHNOLOGY TO ANALYZE MICRO SECTORS ON COATED SURFACES THAT ARE 1000 TIMES SMALLER THAN ANY COMPARABLE EDDY CURRENT PRODUCTS. BUT MOST IMPORTANTLY, THIS UNIQUE IRT TECHNOLOGY ALLOWS FOR SOPHISTICATED ANALYSES OF THE CONTINUOUS AND DISCRETE FILMS BELOW 50 ANGSTROMS, DRAMATICALLY IMPROVING THE ACCURACY OF QUALITY CONTROL READINGS.
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Flaw Detector & Thickness Gauge
DFX-8+
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Paper Testing Instruments
Whiteness and chromaciticity tester, whiteness meter, tensile stiffness tester, automatic horizontal tensile tester, automatic horizontal tensile tester, vertical tensile tester, pulp beating (refining) freeness tester, water absorbtion tester, Cobb tester, COBB sample cutter, coefficient of friction tester, electronic bending stiffness tester, paper and cardboard thickness meter, paper and cardboard thickness meter, ink rubber tester, standard strip cutter, softness tester, carton compression tester, paper air permeability tester, internal ply bond tester, puncture strength tester, paper tearing tester, electronic tearing tester, mullen burst tester, crush tester, Bekk smoothness tester, folding endurance tester
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Building Physics
* For determining the heat flow density up to max. 150°C.* Application-oriented designs, consisting of a meander ofopposing thermocouples that are embedded in a substrate.* In case of thick substrates no lateral circulation of the heat flowbecause of sufficient meander shell zone.* Software for k value measurement, see chapter Software
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ITA, G10, 10 Module, 0.88" Thickness
410104375
ITA, G10, 10 Module, 0.88" ThicknessCompatible with VPC 90-Series modules.
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Pulse Holiday Detector
NOVOTEST SPARK-1
Pulse Holiday Detector NOVOTEST SPARK-1 designed to detect pits, flaws, and holes in different non-metallic insulation coatings (such as polymers, epoxy, bitumen, etc.) and is mostly used for oil and gas metal pipelines and other objects. The device can be used while the pipeline construction, operation or service. Tested coating thickness is up to 12 mm. Such tests are needed to evaluate the oil and gas pipelines corrosion protection reliability.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Surveyor Thickness Gauge
Multigauge 5650
The Multigauge 5650 Surveyor Thickness Gauge is a simple, robust ultrasonic thickness gauge designed specifically for ship and small craft surveyors, but can also be used in applications where different measurement modes are required. The user has a choice of Multiple Echo, Echo to Echo or Single Echo to cover all requirements. The gauge can be used for metal, GRP or plastic measurement and it automatically switches modes and settings depending on the type of probe fitted. The easy to use keypad on the Surveyor Thickness Gauge allows operator interface whilst the bright LCD display can be used in all light conditions. All probes have Intelligent Probe Recognition (IPR), which automatically adjusts settings in the gauge at the same time as transmitting recognition data the result is a perfectly matched probe and gauge for enhanced performance. Additionally, the Automatic Measurement Verification System (AMVS) used with multiple echo ensures only true measurements are displayed, even on the most heavily corroded metals.
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Matrix Vapor Deposition System
iMLayer
The iMLayer matrix vapor deposition system is sample pretreatment (application of matrix) in order to perform MALDI-MS imaging using an analysis system such as the iMScope imaging mass microscope or the MALDI-7090. With the iMLayer, the deposition method has been adopted as a pretreatment method to achieve high spatial resolution. By using this method, fine matrix crystal can be produced. Also, thanks to automated control, the coating thickness is reproducibly controlled as users configure.
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Thickness Gauges
UMX
Take your MX-3 underwater with you! This portable solutionoffers off-shore inspectors a very versatile system for underwater corrosion surveys:Clear plexiglass construction.300 feet depth rating.Stainless steel connectors, latches, and control bar.Simple to install and operate.1 year limited warranty.
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Optics Test Systems
Lens Test
Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Thickness Gauges
CMX
The CMX has all features of the MX & MMX gauges with a ton of advanced features. Measure material and coating thickness simultaneously, while still detecting pits & flaws in a single mode (PECT). Auto probe zero, auto probe recognition, auto temperature compensation are also included. Selectable Large Digits and B-Scan display options, up to 64 custom user definable setups, selectable transducer table for precision linearity, and material and coating calibration options are also available.
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Thickness Gauges for Plastic films & Paper
CHY-CA
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Ultrasonic Thickness Gauges
MMX 6 + MMX 6DL
The new wall thickness gauges MMX-6 and MMX-6DL includes all the features of the MX devices with the additional unique possibility to measure on coated parts without the coating is applied in the measurement (Echo Echo + pulse-echo function)
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Coating Thickness Meters
PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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High Resolution Wafer Thickness & Thickness Variation Gauge
MX 10x series
The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Dimension & Displacement Measurement
Ono Sokki Dimension & Displacement Measurement - digital linear gauge, rotary encoder, non-contact thickness meter, laser doppler surface velocity meter.
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Coating Thickness Meter for Ferrous and Non-Ferrous Materials
CM8826FN
- Operating principle: magnetic induction/eddy current (F/NF)- Measuring range:0-1250um/0-50mil- Resolution; 0.1/1- Accuracy: 鍗?-3%n or 鍗?.5um- Min. measuring area: 6mm- Min. sample thickness: 0.3mm- Battery indicator: low battery indicator- Metric/ imperial: convertible- Power supply: 4x1.5V AAA(UM-4)battery- Auto power off- Operating conditions:0-+45閳?/span>(32閳?/span>-104閳?/span>),閳?0%RH- Dimensions: 126x65x27mm- weight: 81g(not including battery)- Optional accessories: other range 0-200um to 15000um
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Coating Thickness Gauges
Application of coating thickness gauge:used for measuring thickness and corrosion of pressure vessels, chemical equipment, boilers,oil storage tanks, etc. in industries of petroleum, shipbuilding, power station, and machine manufacturing.
