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Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Test Probes
E-Series
Your product descriA full portfolio designed for general purpose test on bare boards, surface mount assemblies and other forms of test specially to meet any needs.ption goes here.
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Test Probes
Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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Fine Pitch Test Probes
Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 80
MAXIMUM CURRENT: 6 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24 Kt gold plated over nickelBARREL: Nickel silver with 24 Kt goldplated ID and OD over nickelSPRING: (Standard) Beryllium copper,silver plated. (-1) Stainless steel,silver plated
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ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Single Ended Test Probes
Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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General Purpose Test Probes
Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Test Probes
Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Fused Test Probes with Silicone Test Leads
AL-56FL
Standard Electric Works Co., Ltd
Fused Test Probes with Silicone Test Leads
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Test Probes & Clips
CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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SMT & THRU HOLE LOADED BOARD TEST PROBES
SERIES 43
MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel
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LUTHER & MAELZER BARE AND LOADED BOARD TEST PROBES
SERIES LMP 60
MechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24 Kt gold plated over nickelBARREL: Nickel silver, 24 Kt goldplated over nickel
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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DMM Test Probe Kit With Multi-Stacking Banana Plug
5325A
DMM test probe kit with multi-stacking banana plug
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Test Sphere Probe
CX-500
Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Pilot V4
The Pilot V4 Next series is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs.
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IEC60335 Test Probe 11
CX-11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 11 This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Gaussmeter
DX-103
DX-103 Gaussmeter is a desktop gaussmeter.Which is based on he latest progress of the the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probes adapt imported GaAs linear Hall-chip, the difference between probes is small, which can be replaced directly when it is damaged, and is an ideal AC & DC magnetic field test instrument.
