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Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Test & Development
Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Rapid Test Development
TestEZ® Development Suite
Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Full test development environment
XJDeveloper
XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Test & Development
Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Compliance Test, Development and Test Service
DinoStor
With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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In-Circuit Test Application Development & Fixture Fab
Arxtron Technologies has been in the Agilent3070/HP 3070 (Medalist i3070) In-circuit test application development and fixture fabrication business since 2004 when it took over the Agilent Canadian application centre. Our engineers count more than 35 years of experience and have been serving a variety of customers focusing on high end/ high node count complex products (Telecom, Medical, Industrial computers etc.) as well as Automotive and consumer electronics customers. We are also an Agilent channel partner.
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Test development service
Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Software Update For Test Development, GTE 10.00p
K8224A
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Program Development for Multisite Test
IG-XL
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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TTCN-3 Compilation & Execution Environment
Titan
Titan is a TTCN-3 compilation and execution environment with an Eclipse-based IDE. The user of the tool can develop test cases, test execution logic and build the executable test suite for several platforms. TTCN-3 is a modular language specifically designed for testing (the acronym itself stands for Test and Test Conformance Notation), standardized by ETSI (see www.ttcn-3.org) and endorsed by ITU.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Capacitance & Tan Δ Power Factor Meter 2.5kV
CAPO 2.5
The measuring instrument CAPO 2.5 is a new Capacitance and tan δ / Power Factor Test Set developed by Raytech Engineers.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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HV DC Voltage Generators
Fivestar HV Testing Equipment Co., Ltd.
HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.
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Exhaust Gas Analysers
Designed specifically for the busy workshop environment, it incorporates the fastest MoT test procedures, developed in-house here at Boston and using our newly released SW900 product control software.
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INSTRUMENTATION AMPLIFIERS
EMC HIRF testing – meeting the most demanding RTCA/DO-160 requirementsScientific ResearchHigh Power Component Testing (PIM Testing)Medical LINACSRecent developments include a range of Ultra High Power HIRF amplifiers achieving generally over 10 kW. EMC test laboratories using TMD Amplifiers have generated 14,000 V/m, easily complying with the latest, most demanding RTCA/DO-160 requirements.
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SoC Tester
UltraFLEXplus
The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .
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Electric Servo Motor Type 3-axis Vibration Tester
The Electric Servomotor Vibration Test System Is A New Vibration Test System Developed Based On The Control Technology Of AC Servomotors That We Have Cultivated Since Its Establishment.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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EOL/Functional Testing
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Caibration Equipment For Lab Use
In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Turnkey Boundary Scan Solutions
TestGenie
TestGenie is a low-cost boundary-scan solution for those companies that have a genuine requirement for JTAG testing, but have difficulty absorbing the tool costs or assigning the resources required to implement the test technology into their development or production processes. TestGenie allows customers to use full-featured versions of Corelis ScanExpress products at a fraction of the cost.Once you’ve selected boundary-scan as a practical solution, the second biggest decision is whether you want to do the test development yourself or have a third party do it. The decision should not be considered lightly as there are advantages and disadvantages to each.
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Testing Tool Development
We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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Source And Measure WiFi And Bluetooth Signals
IQview
The LitePoint IQview® simplifies WiFi and Bluetooth® device development with powerful tools to both source and measure WiFi and Bluetooth signals and analysis capabilities providing insight into device behavior. The IQview offers seamless compatibility with the IQflex® manufacturing solution enabling test software developed on the IQview to run on the IQflex platform widely deployed in manufacturing environments.
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Systems Integration
We supply a full range of system integration services to ensure system success. Our services include system hardware build, integration of modular instrumentation including PXI, test fixture development, system wiring, software development, factory and site acceptance testing and data analytics.
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ISDN Chip Set
Emutel Symphony
Emutel Symphony is a convenient and flexible Basic Rate ISDN, Primary Rate ISDN and Analog PSTN network simulator. With support for S, U, E1, T1 and PSTN analog interfaces you can use the Emutel Symphony to test and develop a full range of ISDN(E1/T BRIS BRIU) and PSTN analog (FXS) equipment.
