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Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Magnetic Stripe Test Cards
Test Limit Cards (and tickets) are nominally encoded to ISO standards BUT WITH specific parameters deliberately set to predetermined levels, which can be inside or outside the ISO limits. The Test Limit Cards are designed for use by Test\Inspection Departments, Field Service Engineers, Reader \ Encoder Development Engineers to check and confirm proper operation of magnetic stripe reading equipment (e.g. ATMs and POS).
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PXI Switching Instrumentation
6U PXI
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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High Density Switches
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5050
The GX5050 is a high speed Dynamic Digital I/O card that provides a full set of features that is comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GC5050, but the GX5050 is a PXI card (6U) and the GC5050 is a PCI card. Both have the ability to operate independently of the host computer when in RUN mode.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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TestCentre
ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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Type 39 CompacFrame Development Platform, 6 And 8 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX94Y3VCC0
Elma’s SOSA aligned CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 8-slot OpenVPX backplane.
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Creepage Distances Test Card
CX-P27
Shenzhen Chuangxin Instruments Co., Ltd.
Creepage Distances Test Card Brief DescriptionCreepage Distances Test Card, Refer to GB4706.1-2005 the 29th Item Atc
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ISO, SWP/HCI, USB Card Tester
Spectro 2
# SO/SWP terminal simulator for Smart Card testing# Test Cases for ISO, SWP and HCI# ISO/SWP/HCI/USB trace function for ensuring interoperability between a real Smart Card and a handset
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Tx/Rx SignalBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for backplane path characterization. The card includes a HM-ZD connector segment for access to the backplane and edge-launch SMA connectors for ease of test cable attachment. DC blocking capacitors are included on the receive pairs as required by Advanced TCA.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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PXI Switching Instrumentation
GENASYS
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Multi Protocol Boards
The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.
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PXI Switching Instrumentation
Matrix
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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PXI Switching Instrumentation
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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SD Express
SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Probe Card Test & Analysis
Automated probe card test and repair is used to monitor probe card health to ensure cards are ready and capable of testing semiconductor devices. In cases where the card is not meeting performance specification, repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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PCI Card
EXC-1394PCI
The EXC-1394PCI card for the PCI bus is an intelligent test and simulation card for interfacing to an IEEE-1394 data bus. It implements a 1394b PHY layer, operating at 100, 200, or 400 Mbps.
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Test Fixtures & Jigs
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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ZIF PCI Test Connector
Meritec's ZIF PCI Test Connector offers the user an accurate and reliable way in which to test their PCI cards. With over 20,000 reliable cycles, it eliminates the need to constantly replace your PCI Connectors. Meritec's Test Connector assembly plugs directly into the PCI Connector in the test bed and is actuated by a lever for easy loading and unloading of cards. Meritec's solution eliminates the uncertainty associated with intermitancy between the PC Board and Test Connector during the test cycle.
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Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers
AI-CCS-128-E Rev B
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Digital I/O PCI Card
GC5050
The GC5050 is a high speed Dynamic Digital I/O card that provides capabilities comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GX5050, a 6U PXI card. Both have the ability to operate independently of the host computer when in the RUN mode.
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High Current Switches
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Control Board For Testing PCBs
TCC 1800
The TCC1800 Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via a galvanically separated USB interface. The TCC1800 is designed to work with positive voltages up to 24V. All inputs and outputs are protected against higher voltages however. The card provides basic IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, Serial (UART) and I2C interfacing.
