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Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
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Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Profiling Belt Radiometer
ILT400
International Light Technologies
The IL400 Profiling Belt Radiometer continues with the all-in-one exposure, intensity, and profiling capability first introduced in the IL393. New solid-state detector and ultra-stable amplifier technology along with rechargability combine to give lower noise, greater speed, and higher accuracy at a price below any precision belt radiometer sold today.
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Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
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Profiling Software
In today's world of advanced, high quality, lead-free electronics, thermal profiling is central to successful solder process control. It can, however, be a bewildering task: many software packages are difficult to understand and use, and their output requires a degree of interpretation that assumes long experience in profiling.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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Wideband Pulse Profiling Sensors
LadyBug wideband Power Sensors feed power waveform samples into high speed A/D converters. The measured power is processed and then delivered as required by the user. These sensors are capable of delivering everything from basic power, to time domain scope-like profiles of the modulated waveform, such as the pulse shown at right. Multiple time gated measurements, crest factor, pulse power, and statistical measurements are all possible with these sensors.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Multibeam Profiling Module
MB-2250
The BlueView 2250 multibeam profiling module, built for the Gavia AUV by Teledyne BlueView, is derived from the company’s proven 2250 kHz MBSeries sonar. Teledyne BlueView is recognized as the leading manufacturer of integrated Multibeam Profiling sonar systems for high resolution data collection.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Smart Profiling
The average thermal profiler on the market operates like the old chart recorder migrated onto a PC. It is a passive data acquisition unit that informs the user of the PCB profile. Smart profiling goes beyond that into the realm of data intelligence. Based on your input, the profiler tells you where you are, where you want to go, and how to get there. Intelligent databases provide such information without even needing to run a manual profile! The data can be linked and shared with all authorized personnel.
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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*Beam Profiling For 266nm To 3000µm
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Surface Thermography
Advanced Thermal Solutions, Inc.
Liquid Crystal & Surface Thermography Systems for Temperature Mapping Studies.
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Surface Cleanliness
Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Camera Based Beam Profiling
BeamGage
See your beam as never before with BeamGage®. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. The advantage to camera-based beam profiling is the real-time viewing and measuring of a laser’s structure. BeamGage software includes an extensive set of ISO quantitative measurements, features a rich graphical interface, and features its patented UltraCal™ algorithm, providing the industry’s highest accuracy measurements.
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Surface Analysis
InSight-450 3DAFM
Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
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CTDs: Profiling
Profiling CTDs make continuous measurements as they travel through water. When lowered over the side of a ship or integrated with an autonomous vehicle, they map a vertical column of water's characteristics. Compared to moored CTDs, profiling CTDs account for dynamic errors introduced by moving through water and sample rapidly to generate a high-resolution dataset over a short period of time. Sea-Bird Scientific profiling CTDs are:*Designed to perform under unique dynamic conditions found on moving platforms.*Pumped and ducted for constant flow to match temperature and conductivity response.*Plumbed so measurements are made on the same sample of water with a predictable delay and predictable flow effects.*Built with a rugged design for shipboard and autonomous deployments.
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Surface Analysis
Dimension FastScan Bio
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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LC/MS/MS MRM Library For Phospholipid Profiling
This MRM library includes two methods: one for phospholipid classification by comprehensive analysis of the main phospholipids in biological samples, and one for fatty acid composition determination created using analytical results obtained with the classification method. The library targets phospholipids containing C14 to C22 fatty acids, and includes MRM transitions for up to 867 components. This library enables performing phospholipid profiling by conducting an initial analysis with a phospholipid classification method. This is followed by creating a method for fatty acid composition determination based on the phospholipid peak detected in the first analysis, and subsequently using this method to perform a second analysis to determine fatty acid composition.
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Surface Resistance Meter
990SRM
The Model 990SRM is a convenient, pocket-sized meter for measurement of surface resistivity and resistance to ground.
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Surface Roughness Meter
Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Extended SWIR Camera For Laser Beam Profiling
BPCam
Princeton Infrared Technologies, Inc.
The Princeton Infrared Technologies’ extended SWIR response T2SL BPCam SWIR camera for laser beam profiling supports extended SWIR wavelength response with TEC cooled operation.
