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Probing Adaptors
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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PCB Test Fixture Kits
Emergent's fixture kits are available in bottom and double sided probing versions. They are fully scalable, from compact benchtop testers to full size multi-UUT production floor models. The removable, interchangeable plate design allows you to easily add and move test points, or swap out plates to test a completely different product. Each kit comes with a standard linear collapse over-clamp. A cam-follower closing system can be specified for higher force applications. Our fixture kits are manufactured using industrial grade phenolic laminate, which is similar to G10 in hardness and strength but easier to machine. The standard kit comes pre-assembled with blank plates for machining.
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Continuity Tester
TE6-0711
Hangzhou Tonny Electric & Tools Co., Ltd.
*Designed to test circuits while power is off*2 AAA batteries included*Durable ABS housing*36" Test lead with insulated alligator clip*Sharp tip for probing circuits
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Heavy-Duty Continuity Tester
TE6-0710
Hangzhou Tonny Electric & Tools Co., Ltd.
*Designed to test circuits while power is OFF*2- 1.5V Button cell batteries included. *Durable ABS housing.*High-quality materials for long-lasting durability.*Sharp tip for probing circuits.*Electrical Multi-Testers for almost any automotive repair on all 6, 12 , 24 and 48 volt systems.*Suitable for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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DH Series PT Browser Tip, 16 GHz BW, 3.5 Vpp Range
DH-PT
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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High Voltage Isolator for Logic Analyzers
LX-08
The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Logic Analyzers
A Keysight logic analyzer helps you minimize project risk by providing the most reliable, accurate measurements and the most complete view of system behavior. This comprehensive family of logic analyzer offers the measurement capabilities, probing, logic analyzer application support and analysis tools to meet your toughest digital debug needs.
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Precision Picoprobe™ Micropositioner Probe Holder Kit
PHD-3001A
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Microscopes
A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Starter Probe Station
C Series
Contains fundamental features to probing. C series lets you kick off your experiments and is an entry level machine designed for ease of use while allowing you to get accurate, reliable results.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Automated Multi-Functional Tester
QTouch 1408 C
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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High Volume / Double-Side Applications
APS 80D
Simultaneous, double-sided probing of up to 8" wafersPowerful, user-friendly control and monitoring softwarePlanarization of needle sets and constant preset needle loadPattern recognition systemRobot handling systemConfigurable to voltages in excess of 5 kV for specialized applications
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WaveMaster Oscilloscope, 16 GHz Bandwidth, 4 Input Channels, 80 GS/s Max Sample Rate
WaveMaster 816Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Logic Analyzer Cable
The logic analyser cable plugs in to the AUX port of the SmartScope, providing 8 shielded probe pins for each of the digital inputs, as well as the external trigger input. Each digital probe has its own ground connector and embeds a small passive filter close to the header, allowing for digital probing without signal cross-talk on the cable
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CAM/GATE Test Kits
The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
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Automated Bare Board Tester with Built-In Camera
QTOUCH2404C
Qmax Test Technologies Pvt. Ltd.
Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.
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eMMC
These sockets are specifically designed for standard 153 & 169 Ball eMMC devices. Custom probing sockets also available.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Microwave Testing
75
The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Microwave Testing
40A
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Precision Active Oscilloscope
CircuitMaster 4000M
The CircuitMaster 4000M Precision Active Oscilloscope is unlike any other oscilloscope as it provides some innovative test and measurement functions that enable engineers and technicians to perform several new types of circuit analysis. The CircuitMaster 4000M is designed for safe probing of closely spaced components by adding precision DC measurement, signal storage and analysis functions to a traditional oscilloscope design.
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DH Series Solder-In Tip, 30 GHz BW, 3.5 Vpp Range
DH-SI
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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WaveMaster Oscilloscope, 4 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 804Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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DDR4 X4/x8 BGA Interposer For Logic Analyzer, Connects To 61-pin ZIF
W4643A
The W4643A DDR4 2-wing BGA interposer for DDR4 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W4643A is the smallest BGA interposers for DDR4 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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Infiniium UXR-Series Oscilloscope: 10 GHz, 4 Channels, 3.5 Mm
UXR0104A
The UXR0104AA is the 10 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope with the most comprehensive set of probing, analysis applications, and measurements for advanced technologies. EVM performance for wideband mmWave measurements that rivals even the best signal analyzers. UXR-Series scopes have flexible upgrades: Bandwidth up to 110GHz, Memory up to 2Gpts, DDC up to 2.16GHz, and configurable frequency extensions up to 10GHz.
