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Parametric Test
determine whether a DUT's electrical characteristics meet specification.
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Combination Board Tester
ATE QT2256-640 PXI
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Parametric Test Solutions
Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Software
TFT Test Systems
Materials Development Corporation
Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Universal Launcher Test Set
TS-217
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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192 Channel Power Supply
HDPMU
Today cost efficiency is more important than ever. Many manufacturers are working on maximizing multi-site testing. Often maximization can’t be done because of limited tester resources. Salland’s HDPMU gives you up to 192 additional independent parametric measurement units (PMU) channels on a single board. Our solution will increase parallel testing without the need for creating complex device interface board (DIB). It can be used for continuity, functional or parametric tests or simply for device setup or loading. Full integration with the Teradyne IG-XL™ Software, easy set-up and high parallel measurement capability will reduce test costs significantly.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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DWV/IR Test Systems
When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Probe Card
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Test Contactor/Probe Head
Atlas
QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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DDR4 Parametric Test Reference Solution
Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card
GX5296
The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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SoftTest Design Testing Services
We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
