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Gigabit Ethernet Test
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GAOTek Handheld Gigabit Ethernet Test Module
A0070008tek
GAOTek Handheld Gigabit Ethernet test module is a highly efficient test instrument which designed for Ethernet layout and integration tests which conforms to Ethernet test standards. This instrument is required for testing from physical layer to service layer of emerging (or next generation) networks. The Ethernet tester is the new Ethernet tester to qualify Ethernet service over LAN and RAN deployment. This is a highly efficient test instrument for service providers to ensure SLA KPIs with the subscribers.
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC
XMC-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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L2-7 10GbE Test Solutions
NGY 10GE SFP+ and 10G BASE-T Load Modules
Keysight Network Applications and Security
Ixia's 10 Gigabit Ethernet LSM10GXM test load modules delivers an industry-leading, high-density, affordable layer 2 through 7, 10 Gigabit Ethernet IP test solution. The NGY family supports both low port count layer 2/3 applications with limited project budgets and highest density test lab, QA, and system test applications. NGY is perfect for both converged data center infrastructure testing and 10GbE switch test beds. NGY load modules leverage Ixia's converged data center test applications to offer the high port scalability, virtual scalability, protocol coverage, with an affordable test solution for data communications testing.
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10 Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-10GE
Avionics Interface Technologies
Supports 10G and 1G Full Duplex Ethernet2 Network Interfaces (future expansion to 4 network interfaces)User controlled Ethernet frame transmissions with high precision timing and scheduling
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Multi-Channel, Multi-Protocol ARINC Ethernet Appliance
ENET-MA4
eNet-MA4™ is an innovative product for “remoting” 1553 & ARINC-429/717 operations on 10/100/1000 Ethernet local area networks (LAN). eNet-MA4 is a very small, low-power, rugged device that provides real-time UDP connectivity to for 1-2 dual redundant 1553 (A/B) busses and 8 ARINC channels.
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PXIe-8234, 2-Port Gigabit PXI Ethernet Interface Module
780244-01
Vision Software Included, 2-Port Gigabit PXI Ethernet Interface Module—The PXIe-8234 with Vision Acquisition Software can acquire images from the fastest GigE Vision cameras. It transfers images at full Gigabit Ethernet bandwidth on both ports simultaneously, and it is optimized for extremely low CPU load. The PXIe-8234 with Vision Acquisition Software provides full GigE Vision bandwidth at every port, giving you the bandwidth you need for your most demanding vision applications. It also includes NI Vision Acquisition Software, which is driver software for acquiring, displaying, logging, and monitoring images from a multitude of camera types. With a set of easy-to-use functions and example programs, you can quickly create applications using LabVIEW, C, C++, C#, Visual Basic, and Visual Basic .NET.
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3U CompactPCI® 2/4-Port Gigabit Ethernet Card
cPCI-3E10/3E12
The cPCI-3E10 Series is 3U CompactPCI Gigabit Ethernet peripheral card equipped with Intel® 82574L PCIe Gigabit Ethernet controllers. The cPCI-3E10 provides four GbE ports on the front panel (RJ-45) with two switchable to the rear transition module, the cPCI-3E12 provides two GbE ports on the front panel (RJ-45), and the cPCI-3E10-SUB provides two Fast Ethernet ports on the front panel (DB-9). An optional Rear Transition Module (cPCI-R3E10) is available to provide rear access to the GbE ports switched from the cPCI-3E10 front panel.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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3U CompactPCI Serial 4-Port USB 3.2/2-Port Ethernet Card
cPCI-A3USB
- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP- 4x USB3.2 Gen 1 ports and 2x RJ45 2.5G LAN ports in front panel- 1x USB2.0 port on board- Operating temperature: -40°C to +85°C- Designed to meet EN50155 standards
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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FPGA UDP Packet Interface Connnecting 3-4 Channels of MIL-STD-1553 to Ethernet in Real-Time
ENETX-1553
ENETX-1553™ is an innovative product that provides “remoting” of 1553 operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). ENETX-1553 is a small, low-power, rugged device that provides real-time Ethernet connectivity to for three or four dual redundant 1553 (A/B) buses (channels). Ideal for remoting 1553 connections for in-field applications or point-point lab usage. AltaAPI provides and highly portable BSD SDK and National Instruments LabVIEW and LabWindows. ENET products are unique in the market as they have a hardware, FPGA real-time UDP engine – no OS or IP stacks – provides maximum throughput and ultimate virus protection.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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PXI Ethernet Interface Module
The PXI Ethernet Interface Module equips PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, this module is ideal for high-performance data transfer and vision applications on the PXI platform. Additionally, the PXI Ethernet Interface Module has independent bandwidth to support up to four GigE Vision cameras without PoE.
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
