Filter Results By:
Products
Applications
Manufacturers
-
product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
-
product
FPGA Image Processing (IP) Development Kit
ProcVision
Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
-
product
Graphical Waveform Editor and Instrument
PI-PAT
Much more than just a visualization tool, PI-PAT is a full-fledged graphical waveform editor that allows you to spend more time testing and less time programming. PI-PAT doesn't require any programming experience or complicated syntax. Just draw or type patterns directly into the pattern window. Move a clock edge by dragging it. Adjust integration times by entering a single number. Change the output to your DUT by clicking the Update button. You'll never have to wrangle DSP or FPGA code with PI-PAT.
-
product
Tunable Non-Reflective Band-Reject Filter (700MHz-1GHz)
SPCL-00597
This device is placed after the DUT to protect the Spectrum Analyzer from high-power fundamentals and provide harmonic measurements. The non-reflective functionality prevents energy from bouncing back to the DUT and raising the noise floor level.Broadband matching improves dynamic range and reducesmeasurement uncertainty.
-
product
Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
-
product
Signal Conditioning With SLSC
Switch Load and Signal Conditioning standardizes the "last mile" between the measuring device and the device under test (DUT) in hardware and software. SLSC is a modular extension for data acquisition products such as PXI and CompactRIO.
-
product
Adjustable Multisite Rail System™
The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.
-
product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
product
Performance Board
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
-
product
1-Port 14 GHz Analyzer
R140
R140 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-port VNA comes with all the features engineers have come to expect included standard in our software.
-
product
Mass Interconnect
Mass interconnect is a way of connecting test instrumentation to a device under test (DUT). To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.
-
product
Automated Measurement Expert (AMX), VNA Plugin
S94702A
The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller according to the optimized test sequence files generated by the AMX test plan builder. Other instrument plugins allow you to control the DUT mode, expand the number of test ports with the PXI switches or multiport test set, and use external instruments such as a DC power supply and a digital multimeter. The AMX backend software also provides step-by-step calibration wizard for full multiport calibration using the 4-port ECal module.
-
product
Shield Boxes
Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
-
product
Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
-
product
Multisite Testing – Rail System
Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
-
product
Solar Array Simulator
Among other things, solar array simulators are required for testing satellite power supplies. An SAS (Solar Array Simulator), consisting of an interconnection of several Solar Array Simulator modules, maps the solar panels and displays the individual strings connected in parallel. Optionally, the individual SAS modules are monitored by a Second Level Protection, so that the test object is not damaged in case of errors with the voltage sources. Additional circuitry is implemented via project-specific test modules. The signal path to the DUT can be separated, e.g. for dynamic current measurements.The Keysight Solar Array Simulators used were specially developed for satellite applications and cover the significantly higher requirements regarding the control speed of MPP tracking compared to terrestrial applications.
-
product
Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
-
product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
-
product
Wireless Measurement System for ETSI & FCC Devices for ISM Bands
TS8997
The R&S®OSP-B157W8 PLUS 7.5 GHz module with up to eight channels is the core of the system and uses a printed RF switch board in solid-state relay (SSR) architecture. It allows flexible operation of the connected DUT (up to eight ports) for power measurements, signal conditioning via the integrated attenuators, couplers and combiners, RF switching to the measuring instruments in combination with the R&S®OSP-B157WX up to 40 GHz and is controlled by R&S®WMS32 software.
-
product
Scienlab Measurement And Control Module
SL1066B
The Measurement and Control Module SL1066B is a rack-mount measuring and control module that provides adjustable voltage outputs for BMS and DUT power supply and floating relay contacts to simulate e.g. vehicle specific terminals 15, 30 and 31.
-
product
Phase Noise Analyzers
Holzworth Instrumentation, Inc.
Holzworth's Real Time Phase Noise Analyzers are each designed to provide data faster than any other system, while maintaining data accuracy and repeatibilty. There is no guess work as to whether results are valid to the DUT or if there are unwanted variations or contributions coming from the measurement system itself.
-
product
Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
-
product
Nonlinear Pulse-Envelope Domain
S94518B
The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
-
product
Temp Characterized CalPod, 20 GHz
85531B
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards. Very useful in thermal chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the thermal testing to perform a normal re-calibration.
-
product
Multichannel Source Measurement Unit
AXS844x
Run tests simultaneously on 4 channels with up to 400 V. Carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for direct testing of high-voltage RGBW LEDs
-
product
P-Series Single Channel Power Meter
N1911A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
-
product
Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
product
SNR Noise Generator
CNG-EbNo
The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
-
product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
-
product
Railway and Traffic Engineering Solutions
In the past, LXinstruments has already implemented a number of application-specific system solutions which cater for these special requirements. These solutions are often used to replace systems which have been in production for many decades. Our systems are not only employed for testing signal box technology modules, but also for testing train control system which are installed in the track bed. Due to the strong magnetic fields which occur at the DUT in combination with high voltages, the test systems require specific technical safeguards.
