Filter Results By:
Products
Applications
Manufacturers
-
product
Image Sensor Characterization Systems
Image Sensor QE and Spectral Responsivity Characterization
-
product
Full-Size Loudspeakers
UPQ
Meyer Sound’s award-winning UPQ loudspeakers have been core components in both portable and installed systems for more than a decade. Characterized by a high power-to-size ratio; smooth, uniform coverage; and consistent polar response; these two-way, self-powered loudspeakers are available in three coverage patterns to fit any application, from FOH mains in small-to-midscale systems to fills in large systems.
-
product
Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
-
product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
-
product
Photonic Device Testing
ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
-
product
USB4 Version 2.0 Receiver Compliance Test Software
N5991U42A
N5991U42A is the receiver compliance test automation software, allowing you to test and characterize USB4 Version 2.0 PAM3 designs.
-
product
Fiber Geometry System
2400
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
-
product
Test bench for Infrared Focal Plane Array detectors
BIRD
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
-
product
PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
-
product
Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
-
product
Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
-
product
Test Software
Includes everything a test engineer needs to fully characterize his transistors from 10MHz to 110GHz in power and noise.
-
product
WiGig RF Tester
IQgig-RF Model B
When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
-
product
Optical Multiport Power Meter
N7745C
Keysight's popular N7745A optical power meters with eight power-sensor channels provide increased throughput and operational efficiency to meet today's challenges in manufacturing. Designed for characterizing optical multiport components, these optical power meters offer industry-leading solutions for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing. The multiport power meter enables fast measurement solutions for all multiport devices; for example multiplexers, PON splitters, wavelength selective switches (WSS) and ROADMs, as well as compact setups for simultaneous testing of multiple single-port devices.
-
product
Computery Control Torsion Tester
SG-L10
The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed.Test data automatically display and process, print the test report according with the national criterions, including test date, number, material quality and torsion strength etc. The machine characterizes advanced technology, high accuracy, good stability, reliable quality and easy to operate, and it is necessary test instrument for aeronautics & astronautics, construction material, traffic, wire & cable, science research departm ent and universities.
-
product
Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
product
Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
-
product
COLOSUS
The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
-
product
MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
-
product
Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
-
product
Spray Particle Size Analyzer
Spraytec
Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
-
product
Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
-
product
Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
-
product
Comprehensive Test and Assessment for IoT Devices
Ixia IoT
Keysight Network Applications and Security
Characterize and optimize IoT devices under real-world deployment conditions
-
product
ENA Vector Network Analyzer
E5072A
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
-
product
High Voltage Optically Isolated Probe, 1 GHz Bandwidth. Includes soft-carrying case.
DL10-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
-
product
Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
-
product
Two-Pole Voltage Tester
P-6
SONEL P-6 has all the features that characterize the P-4 Voltage Tester and P-5 Voltage Tester. In addition, the P-6 model has the phase identification function which allows to verify the phase compatibility (and its overtaking or delay) against the phase at the reference object.
-
product
Basic Spectrum Analyzer
N9322C
Quickly uncover key insights through fast, value-priced, general-purpose performance up to 7 GHz with -152 dBm DANL and 0.6 dB overall amplitude accuracy Streamlined for straightforward and efficient operation with marker demodulation, one-button optimization, and user-definable soft keys Robust measurement features for easily characterizing your product Automation and communication interface with industry standard SCPI language support and USB and LAN connectivity choices
-
product
PNA-L Microwave Network Analyzer
N5235B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
