Integrated Development Environment
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Product
2 Slot 1U CompactPCI 19" Rackmount Development Platform; Type 39 19" Rackmount Chassis
39C02AD118Y3HCBX
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The Type 39C, 1U is an advanced generation of CompactPCI chassis for PICMG 2.0, 2.16, 2.17, and EXP.0 applications. IEEE 1101.10/11, 6U x 160mm CPCI cards from the front and 6U x 80mm I/O cards from the rear.
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Product
Software for Jazz® and M90™/M91™ - All-in-One OLC and HMI Applications in One Environment
U90 Ladder
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All-in-One software enables you to:- Develop your PLC and HMI applications in one environment- Configure Hardware & Communications- Establish modem and data communications- Test and debug your programs
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Product
Laboratory Battery Tester With Integrated Chamber
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Compact and versatile, our portable desktop solution integrates Arbin's advanced testing features.
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Product
Development Platform
NFC/WLC
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CISC is offering various technology elements to support the design of NFC-based WLC (wireless charging). These pre-tested hardware modules including various antenna sizes, firmware, and software support customers to quickly have available solutions for their requirements. Customization helps in particular for very challenging application requirements. Customers benefit from very fast time to market for WLC solutions.
