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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Product
Stylus Profilers
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The Alpha-Step®, Tencor® P-series and HRP® stylus profilometers enable high-precision, 2D and 3D surface metrology. The stylus profilers measure step height, roughness, bow and stress with industry-leading stability and reliability for your R&D and production metrology requirements.
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Product
Solar Radiation (Sunshine) Test
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This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.
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Product
Non-contact Surface Texture And Contour Measuring Instruments
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From sub-nano level surface roughness to milli level profile with 3D.Tokyo Seimitsu provides non-contact type surface roughness and contour measuring instruments with the confidence born out of many years cultivating know-how of surface roughness measurements.
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Product
Ceramics and Glass Inspection Systems
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Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Product
3D Optical Surface Profiler
NewView™ 9000
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The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Product
High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Digital Surface Profile Gauge
NOVOTEST SP-1M
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Digital Surface Profile Gauge NOVOTEST SP-1M is designed for profile measuring on either flat or curved surfaces. Also it can be used for measurements of surface roughness (Rz), after abrasive blasting pre-painting work.
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Product
Production Spin Testing & Balancing Services
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Test Devices provides production spin testing and balancing services of production parts for customers with a repetitive need and who demand schedule predictability along with a quick turn-around time. Whether proof testing critical rotating components before shipment, pre-spinning to achieve required rotational growth prior to finish machining or simplifying the supply chain by consolidating pre-spin with rough machining and/or NDT inspection, Test Devices offers a full range of spin testing solutions.
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Product
Stereo and Zoom Microscopes
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Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
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Product
Analytical Services
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Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Product
Spectroscopic Ellipsometry
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Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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Product
Sensors
NanoFocus Probe
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Scan of 3D topography of high accurate featuresVery high point densitySuitable to perform non-contact roughness measurementsHigh flexibility using a range of different front lenses
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
CMP Tester
CP-6
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The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Product
Optical Tactile Surface Finish
1000Z
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The Adcole Model 1000-Z features both optical and tactile measuring heads to deliver high precision surface measurements of camshafts, crankshafts and turned parts. The non-contact interferometric probe greatly expands on the measurement capabilities from the diamond tipped contact probe of the standard Adcole 1000 gage, as the optical accessory can precisely measure surface finish of cam track groove sidewalls, cam track bottom grooves and more. Profilometers such as the 1000-Z quantify surface roughness and are relied on to maintain quality and identify potential problems in the manufacturing and coating process.
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Product
S-parameter Measurement System
DPS21
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Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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Product
Analog Force Gauges
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Phase II force gauges are designed and engineered to achieve WORLD-CLASS tension/compression measurements. Heavy duty construction allows the force gauges to undergo rough handling in any environment, while providing for extremely sensitive and highly accurate readings. The Phase II force gauges include a direct dual scale reading in both lbf and kgf, eliminating the need for two separate gauges in the shop.
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Product
System
SYS-24
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The system shown here was built for a customer to be used in metallization, a common use for many smaller systems. It is also fully capable of performing optical coatings when equipped to do so. This particular system came equipped with a 16" APD ISO Flange mounted cyropump, and a Varian tri-scroll for roughing. The cooling tubes for the crystals as well as the drive motor for the parts holder can be seen on the top of the chamber.
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Product
Benchtop 3D Optical Profilometers
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Compact, non-contact metrology instruments used for high-precision, sub-nanometer to micrometer-level measurement of surface topography, roughness, and step heights.
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Product
Intrinsically Safe Smartphone for Mining Locations
Smart-Ex 01M
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The new Smart-Ex 01M was developed and certified to be used in underground mining locations - one of the toughest workplaces in the world. This rough environment places extra importance on mobile workers equipment to help them complete their work while staying safe - the Smart-Ex 01M is the perfect device to withstand this adversity. With this advanced technology, everything which was once handled by paper, clipboards and huge staff costs causing delays, can now be handled by this intrinsically safe smartphone. The Smart-Ex 01M comes with the same and unrivalled features as the Zone 1 / Division 1 Smartphone, the Smart-Ex 01: Same performances, same features, same quality. Of course, it is also unlocked, can be used with dirty or wet work gloves and has a powerful battery for a long workday. However, it is important to know that the Smart-Ex 01M is a stand-alone device with an own mining certification. Therefore and because of certification reasons a yellow leather case is required in underground mining locations. The Smart-Ex 01M with an ambient temperature range from 0C to +50C is approved and certified for use in ATEX and IECEx Mining areas.
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Product
Roughness Measurement
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ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Product
Elcometer MarSurf PS10 Surface Roughness Tester
7062
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In protective coating applications there is a requirement to measure surface roughness. With 31 surface parameter settings available the Elcometer 7062 surface roughness tester can display all parameters that comply to National & International Standards.These values include peak-to-valley profile measurement in combination with an assessment of the frequency of peaks within the sample area.The Elcometer 7062 surface roughess tester is a light weight and portable measuring solution for the range of surface roughness measurements required for compliance to International Standards.The unit is also suitable for assessing surface roughness conditions in a wide range of general industrial applications; particularly where the sample is too large to bring to the laboratory.
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Product
Dimensional Metrology Systems
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We are a global provider of optical industrial measurement technology for quality assurance of complex components with tight tolerances. With Bruker Alicona measurement systems, users measure dimension, position, shape, and roughness by using only one optical sensor. Measurement systems are applied in both research and directly on the shop floor.
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Product
Solid Optical 3D Measurement Instrument
IF-SensorR25
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The IF-Sensor25 is a solid optical 3D measurement instrument for automated form and roughness measurement in production. The sensor is integrated into a production line and delivers you high resolution, repeatable and traceable results when measuring surface characteristics in the m or sub-m range. This resolution can hardly be achieved by conventional 2D solutions or tactile techniques.
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Product
Optical Tensiometers
Theta Flex
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Attension® Theta Flex is a contact angle meter that enables all measurements in one instrument for both research and quality control. It measures static and dynamic contact angle, 3D surface roughness, surface free energy, surface and interfacial tension, and interfacial rheology.
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Product
Areal Confocal 3D Measurement
µsurf
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The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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Product
Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
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The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
