UHV
voltage from 1000 to 1600 kV.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Vacuum Compatible Instruments
Nearly all standard systems can be modified for vacuum applications to 10-8 Torr if baking is not necessary. Many UHV applications require custom designed solutions. With experienced UHV instrumentation specialists on staff, we can provide custom nanopositioning and micropositioning solutions for your vacuum application.
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Electromagnets
Our means of simulation and our knowledge allow us to manufacture a custom electromagnet according to 5 criteria:Air gapMaximum fieldHomogeneitySpeed of field variationMechanical constraints (Optical access, UHV, bulk, mass, etc.)
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Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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System for UHV Temperature Programmed Desorption (TPD) Studies
TPD Workstation
The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies. The triple filter mass analyser is configured with a cooled shroud giving the analyser optimum sensitivity with minimum background contributions to desorption products from the sample. A fast sample load lock with sample transfer mechanism is included to provide for rapid sample change. The TPD Workstation features a multiport UHV chamber with heated sample stage coupled to a high precision triple filter analyser with digital pulse ion counting detector for ultimate sensitivity and time resolution.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Custom/OEM
From simple modifications of existing designs to completely custom projects, Mad City Labs’ engineering team has the capability to quickly provide unique piezo nanopositioning systems for specialized requirements. In-house research scientists with extensive experience in UHV instrumentation, optical spectroscopy, and nanotechnology can provide the real-world advice and assistance to move a project from concept to reality. Generally, this work is done without NRE charges and without any requirements for multiple unit orders. Whether you needa special physical configuration, expanded or reduced range of motion, compatibility with environmental conditions, or special materials, a short discussion with our technical sales staff and engineers will quickly reveal the feasibility of a custom solution.
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Ion Pumps & Controllers
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Cluster Series Systems
The quadrupole analyser is a precision assembled triple mass filter with unique, independently driven RF only secondary filter stages preceding and following the primary mass filter. A UHV low profile electron impact ioniser with twin oxide coated iridium filaments and a pulse ion counting single channel electron multiplier detector are included as standard. A Faraday detector option extends the dynamic range to 5 x 1010.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Ultra High Vacuum
UHV
Our range of UHV magnet systems for x-ray beamline applications offers the highest performance specifications currently available combined with an unparalleled degree of flexibility ensuring that the system is tailored precisely to the requirements of the user facility.
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Power Device Analyzer / Curve Tracer
B1505A
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Vacuum Quality Monitor Systems
The 835 VQM is a mass spectrometer that operates from UHV to 10-5 Torr and accurately measures the gases in the vacuum chamber. The 835 VQM Differential Pump System delivers the advantages of the 835 VQM at higher pressures. The VQM system consists of an autoresonant ion trap mass spectrometer gauge, a VQM Controller and VQM Viewer software that that converts raw data into actionable information. The system is ratiometric, meaning that it determines the ratio of each gas to other gases in a vacuum chamber. It is usually coupled with a total pressure gauge to provide partial pressures of each gas as indication of the quality of the vacuum in the chamber.
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Scanning Tunneling Microscope for Ultra High Vacuum
STM
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Vacuum Pump
DP-03
The XIA Model DP-03 differential pumps provide a cost effective, windowless, direct, line-of-sight transition between an ultra-high vacuum (UHV) region (< 1 x 10-9 Torr) and a high vacuum (HV) region (< 1 x 10-6 Torr).
