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Production Test Systems
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IQC Test Systems
Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
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DC Power Supplies
Rohde & Schwarz offers a versatile portfolio of DC Power supplies that fit variety of test and measurement scenarios. Whether you are looking to equip an educational lab or integrate a power supply into a production test system, we have the right equipment for you.
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Multiport Coaxial Switch, DC to 20 GHz, SP4T
87204B
The Keysight 87204B terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204B which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204B is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Multiport Coaxial Switch, DC to 4 GHz, SP4T
87204A
The Keysight 87204A terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204A which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204A is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Coaxial Matrix Switch, DC to 20 GHz
87606B
The Keysight 87606B matrix switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control creates a switch that meets the requirements for highly repeatable switching elements in test instruments and switching interfaces. The switch is designed to operate for more than 10 million cycles and will meet all electrical specifications for at least 5 million cycles. The switch exhibits exceptional insertion loss repeatability. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of the switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Test Box
RF
This is a custom made part of a Phase Noise test system. It contains relays, filters, amplifiers, and so on. It works with other of-the-shelf eqipment, and custom software to form a high volume production test system.
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Battery Formation and Testing System
BFS 2000
BENNING Elektrotechnik und Elektronik GmbH
For many decades now, BENNING has designed and manufactured charge/discharge converters for the battery industry. These converters are used in both the production and testing processes involved in battery manufacturing and for series-testing of batteries. BENNING's BFS battery production and testing system provides a solution which makes it easier to control and monitor production and test processes which saves both time and energy. When used in power stations and rail applications (mobile version), it can be used to test and maintain a wide range of battery types.
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Automation Of Vibration Testing
The system can be equipped with various National I / O devices using PCI, PXI, USB and cRIO platforms for both testing tasks and for advanced diagnostics of the tested products. The system software includes a wide range of virtual instruments (Vibrotest, Vibration, Vibrotest SBC, Vibrorezonans, Beat, etc.).
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PXI-Based Modules
PXI-based modules form the core of many measurement and automation systems. These modules are designed to integrate into design verification and high-volume production test systems. Combined with our demonstrated microwave and high-speed digital expertise, SCT’s PXI design capabilities make us well positioned to deliver innovative products to the wireless test market.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Production Test System
G3 Hybrid
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Saluki S87234 Series USB Peak and Average Power Sensor (max. 67GHz)
S87234D/E/F/L USB peak and average power sensor is a diode-detection broadband power measurement instrument based on the USB 2.0 interface, which can realize accurate average power measurement, pulse power measurement with large dynamic range and CCDF statistical measurement analysis. The frequency range covers 50MHz to 67GHz, the highest power accuracy can reach 0.2dB, the video bandwidth is ≥30MHz, and the rise/fall time is ≤13ns.S87234 series can flexibly expand the power measurement function of electronic measuring instruments and test systems, and is mainly used for field testing, production line testing and system integration.
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Industrial Vibration Sensor
IVS-500
The new IVS-500 Industrial Vibration Sensor is the key to fast acoustic quality inspection, structure-borne noise analysis and reliable pass-fail decisions. This Laser sensor measures reliably, in demanding industrial environments, without contact and therefore without wear and on virtually all surfaces. Costs and yields are therefore optimized by reducing false rejects in the production and assembly process. The simple setup and ruggedized sensor design of the IVS-500 enable a smooth integration into production test systems. Complemented with the software tool QuickCheck, Polytec offers a comprehensive solution for reliable pass/fail analysis.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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68 Pin VHDCI Connector & Cable Accessories
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Coaxial Matrix Switch, DC to 20 GHz
87406B
The Keysight 87406B matrix switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control creates a switch that meets the requirements for highly repeatable switching elements in test instruments and switching interfaces. The switch is designed to operate for more than 10 million cycles and will meet all electrical specifications for at least 5 million cycles. The switch exhibits exceptional insertion loss repeatability. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of the switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
