Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Product
Highly Accelerated Stress Screening (HASS) Test
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HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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Product
In Stock & Rental Testing Chambers
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Weiss Technik In Stock and Rental test chamber programs help assist you with your environmental testing needs with a wide selection of stock for fast delivery. We offer many options that will fit your testing requirements. Our In Stock test chambers offer common sizes and features that allow you to keep your testing on track.
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Product
JTAG Boundary-Scan Controllers for High-Volume Production Systems
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Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.
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Wireless In-Circuit Test Fixtures
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Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
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Product
USB Explorer (Two Port)
JT 3705
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The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
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Product
ESD Tester
GZ600 HID
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• Personal equipment tester with badge reader• Compact• LCD digital display• Identification by RFID badge• Possibility to program test parameters for each employee• Allows communication with the company network or the dedicated server (SQL database)• Supplied with a shoe test mat• 4 test modes: bracelet / shoes / bracelet and shoes / bracelet or shoes
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Product
Fully Automatic Colorimeter
DRK103C
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Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.
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Product
In-Circuit Test
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Test Coach has been delivering the highest quality in-circuit test programs since 1998. Our engineers have the education, experience and expertise needed to solve your most challenging test requirements. We partner with our customers to provide comprehensive test solutions, including consulting on: design for test, recommendations on the best hardware and software options to implement, test strategy, and long term planning for multi board projects. Our expertise allows us to really understand customer requirements, so that quotes are accurate and timely. However, we also understand that sometimes projects can change scope. At Test Coach, we have the flexibility to adapt to changes with as little impact to delivery as possible.
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Product
Promira™ Serial Platform
TP500110
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The Promira™ Serial Platform is our most advanced serial device ever. This new, powerful platform offers many benefits over our previous generation of host adapters:*Integrated level shifting ensures you'll be able to work at a variety of voltages ranging from 0.9 to 5.0 volts without needing any costly accessory boards.*High-speed USB connectivity to the host system provides high performance and convenience for benchtop programming, testing, and emulation.*Ethernet connectivity is convenient for benchtop work, and it also enables remote control for your automation needs.*With the ability to provide a total of 200 mA of power, Promira platform can easily power your project, simplifying connectivity and troubleshooting.*New architecture enables you to download applications to the Promira platform - Upgrade your device when you need new features and you'll never wait for that emergency delivery in the middle of your project.
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Product
Test Program Sets (TPS)
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Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Product
Testing & Programming Solution - Electronic Assemblies
BARCUDA VP230
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The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
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Data Logging and Analysis With Tecap
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Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Open Source Hardware Test/Programming Fixture
OpenFixture
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OpenFixture is a fully parametric programming/test fixturing solution written in openscad. The inputs are generated/captured from the users board layout software and a laser cuttable fixture is generated automagically.
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Product
FPGA Testing
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Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Test Fixture and Test Programing
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Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Product
PCIe to 3U VPX Extender / Riser Card
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This adapter can be used to run, test or program a 3U VPX card in a standard PC PCIe slot. SSC switchable (ON/OFF) PCs available from PCI-Systems Inc.
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Product
Boundary-Scan Test and In-System
PCIe-1149.1
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The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
790406-08
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
PCI Based JTAG Controller
PCI-1149.1/Turbo
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The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-12
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-08
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Product
Professional ATLAS WorkStation
PAWS Developer's Studio
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We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
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Product
DiodeTester
FECPLS510
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Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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Analog Mixed Signal Testers
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- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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Product
Digital Battery & Electrical System Analyzer w/Printer
726
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*Accurate Battery & Electrical System Tester *Features programmed test for new Start/Stop Batteries 3 Testers in ONE! 1) 6 & 12 Volt Battery Tester + 12V Start/Stop Battery Test 2) 12 & 24 Volt Charging System Tester 3) Alternator-Starting-Charging System Tester *Wide Testing Range from 40 to 2,000 CCA *Built-in Printer - print the results for permanent service records *Removable/Replaceable Cable Set *Patented Dynamic Resistance Technology
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Certification Programs
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With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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Pattern Conversion
Wave Wizard
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Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Product
Boundary Scan Program Development Service
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No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
