Switching Systems
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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PXI/PXIe Microwave Transfer Switch, Single, 50 GHz, 50 Ω, SMA-2.4, Failsafe, Remote Mount
40-782B-551-E
The 40-782B-551-E (PXI) and 42-782B-551-E (PXIe) single failsafe transfer switches with remotely mounted relays are part of our range of PXI microwave switching modules. They have a characteristic impedance of 50 Ω and a maximum operating frequency of 50 GHz. Connections are made via front panel mounted high quality SMA-2.4 coaxial connectors.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Mezzanine System Carrier
MMS6245
The MMS6245 gives you the ultimate flexibility in rugged embedded I/O by allowing you to customize the 64 user-configurable front panel signals with our patented Electrical Conversion Module (ECM) technology. This configurable XMC carrier can host up to four ECMs giving you the ability to customize I/O to your specific needs.
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Modular VXI Switch Card Carrier
1260-100
The 1260-100 Switch Carrier accommodates up to six plug-in switch cards, providing optimum switching solutions while reducing the ATE size requirements.
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High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-FK230-3
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Standard 2.90 (82.20) - 5.40 (153.00) Switch Probe
TSP157-F200-1
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
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Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-J100-1
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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PXI 8 Trib Daisy Chain Switch 120Ohm Balance
40-795-001
The 40-795/796 Daisy Chain Switching Module is designed for telecom test applications. It allows production or verification testing of SONET/SDH transmission multiplexers switching 2MBit/s or 1.5MBit/s data over 100 or 120 balanced lines.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Dual Sensor Enhanced Vision Systems
EVS
Enhance your safety and situational awareness while flying with Max-Viz dual sensor enhanced vision systems (EVS) from Astronics. These multi-spectral imagers include a long wave infrared sensor, a visible light + near infrared sensor, and patented blending and dynamic range management image processing to enable pilots to see clearly during day and night.
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Mezzanine System Carrier
MMS8010 / MMS8011
The Abaco ECM 3U VPX carrier supports up to six Abaco Systems Electrical Conversion Modules (ECMs) in a VITA 46 VPX form factor. Each ECM site connects 32 single-ended 3.3 V signals to the FPGA. The specific ECM board installed on a site converts the FPGA signals to 16 I/O signals, for a total of 96 I/O signals across the six ECM sites.
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PXI Single 8 Channel Switch Simulator
40-485-021
Designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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PXI Dual Transfer Switch 40GHz 50Ω SMA-2.9
40-782-542
The 40-780 Microwave switching module consists of one, two, three or four changeover switches capable of switching frequencies to 18GHz (optionally to 67GHz) in 50Ω or 2.5GHz in 75Ω. The 40-782 module consists of one or two microwave transfer switches. It has a characteristic impedance of 50Ω and is available in versions with maximum operating frequencies of 18GHz, 26.5GHz or 40GHz.
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Mezzanine System
5085
ECM P/N 5085 provides two channels of 24 bit A/D conversion suitable for high resolution low speed applications, which include bridge circuits, thermocouples, RTD and voltage measurements. For bridge applications each channel provides a fused +5 Volt or a current source drive.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Validation System
FLEX BMS
The FLEX BMS™ Validation System is a quick-connecting, highly flexible test system for rapid evaluation of centralized, single-board and distributed battery management systems. Utilizing Bloomy’s industry-leading battery cell simulators, COTS instrumentation, industry-standard connectors, and models that run in real-time, the FLEX BMS™ Validation System can easily be reconfigured to test a wide variety of BMSs. The FLEX BMS™ Validation System is used by national and regional safety and standards labs for certifying the BMS for a wide array of e-mobility products and applications.
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PXI Solid State Switch Module, 6xSPST, 30 A, Hardware Interlock
40-183B-011-HI
The 40-183B-011-HI has 6 high current SPST switches with hardware interlock in two PXI chassis slots. Each SPST switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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PXI Hybrid Coaxial Switch: DC to 40 GHz, Dual Transfer
M9156CH40
The Keysight M9156CH40 PXI hybrid dual transfer switch module provides an exceptional 0.03 dB insertion loss repeatability, high isolation, low SWR with a long operating life up to 10 million cycles.
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PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode
40-860A-332-HI
The 40/42-860A-332-HI is a PXI/PXIe triple insert/bypass switch with MU connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Standard 4.10 (116.00) - 6.50 (184.00) Switch Probe
MSP-3C
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 140Full Travel (mm): 3.56Recommended Travel (mil): 85Recommended Travel (mm): 2.16Mechanical Life (no of cyles): 100,000Overall Length (mil): 2,140Overall Length (mm): 54.40Switch Point (mil): 30Switch Point (mm): 0.76
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PXI Dual 8 Channel Switch Simulator
40-485-121
Designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions.
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Standard 2.90 (82.20) - 5.40 (153.00) Switch Probe
TSP157-H200-1
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
