Finite Element Method
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Life-time Measurement System For Silicon Bulks/ingots By JIS Method
HF-100DCA
*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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Labratory Micro-Spot XRD Residual Stress Analysus with both Iso- and Side-Inclination Methods
AutoMATE II
Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product's quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control process and helps predict the service lifetime of products.
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Non-Contact (Pulse-Voltage Excitation Method) Ultra-Low Sheet Resistance Measurement System
PVE-80
*No damage measurement by non-contact Pulse-Voltage excitation method*Easy to measure & carry around, Removable stage plate*Easy operation and data processing by PC with Software*Measurement result can shown by 3 types of measurement unit (Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])*Pulse-Voltage excitation method : Pat. No.5386394 Joint development with Chiba Univ.
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Pulse AC Method Area Ionizers
ER-X Series
Panasonic Industrial Devices Sales Company of America
The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).
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Ultrasonic Dual Element Probes
SONOSCAN T
The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
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2CT Method Mini Clamp Tester
M-2002
MULTI MEASURING INSTRUMENTS Co., Ltd.
Compact size and light weight for convenient field use. True rms reading with wide range from 1mA to 200A. Extensional measurements by combination with optional auxiliary CT.
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Conductivity Type (P/N) Checker By Contact Thermo-electromotive Force Method (seebek Effect)
PN-12α
*Thermo electrode and cold electrode is mounted detecting part of measuring probes*Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on*Please select from 2 types;1) 2 probe ver.(Hot probe, Cold probe),2) 1 probe ver.(Hot & Cold probe)
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Metabolites Method Package Suite
This suite allows comprehensive analysis of over 1900 metabolites without the need for investigation of separation conditions, MRM optimization or parameter settings. The range of metabolites spans both hydrophilic and hydrophobic compounds, including amino acids, short-chain fatty acids, sugars, nucleotides, bile acids, and lipids. The suite consists of five LC/MS/MS Method Packages including ready-to-use methods for the LCMS-8050/8060 series, the LC/MS/MS MRM Library for Phospholipid Profiling, the Smart Metabolites Database™ for GC/MS(GC/MS/MS), and a Multi-omics Analysis Package. The Multi-omics Analysis Package included in this product supports not only regular analysis but also large volume data analysis and interpretation. The Multi-omics Analysis Package includes metabolic pathways and other contour maps corresponding to the Method Packages. This makes it easy to visualize fluctuations in the quantitative values of metabolites across metabolic pathways. Data filtering functions and statistical analysis can be applied to the network of compound relationships, providing a total solution for metabolite analysis.
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L4-7 Application Performance Testing of Virtualized Compute and Network Elements
IxLoad VE
Keysight Network Applications and Security
IxLoad VE supports complete functional and performance testing of virtualized servers and 10GbE[LE1] converged network adapters (CNAs) for cloud computing environments. Using Ixia Virtual Load Modules, IxLoad VE is able to test a host of virtualized assets, including firewalls, deep packet inspection (DPI) devices, load balancers, and other network devices.
