PCB Test Fixtures
jigs which hold, align and engage pcb with test interconnect.
See Also: Test Fixtures, Board Test Fixtures, ATE Fixtures, Bed of Nails
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Male SCSI Connectors
510150125
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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In-Circuit Test Fixture Design Services
XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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Becker NAV/RMU/RMI/OBS Test Fixture
TA-3320
This NAV test fixture is specific to the requirements for testing Becker Avionics NAV, RMI and RMU products. The panel incorporates specific functionality required for testing these Becker products by the book including special requirements for the RMU 5000 and the IN 3300 series of nav indicators. This BAEE NAV test fixture also facilitates resolver alignment and discrete meter testing through the PG 3300 interface connector. The RM 3300 portion of the panel tests the Becker RMI indicators and allows for sourcing the composite signal from the paired radio or from an external generator. The DME channeling outputs are monitored with discrete LED's as well as the ILS, V/LOC, Glideslope and NAV TEST valids. Discrete test jacks are provided for all the meters and the resolver of the NAV indicator and a dimming source is also provided. When testing the RMU 5000 computer access is through a dedicated connector.
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Multi-Stage In-Circuit Test Fixtures
Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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PCB Test Points
Test Socket 2mm. Plug 2mm. Measuring Socket 2mm . 2 Pin Test Socket 2mm. Miniature Test Socket 2mm
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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RF/Microwave PCB
With unique expertise and decades of experience in complex RF PCB and Microwave Printed Circuit Boards, Teledyne Labtech offers a “one-stop” solution for the design, manufacture and test of the most demanding RF/Microwave PCB designs.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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PCB Test And Design-For-Test Services Group
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Test Fixture with API
TA-14VG
The TA-14VG test fixture is based on the requirements for the Integrated Test Procedure for the VG-14A assembly as shown in the OEM maintenance manual. The panel also contains a test point breakout for the units main connector as well as one for the VG-401 base. The VG-401 breakouts provide an in series connection that will allow easy access to the gyro's signals and also provides a way to monitor rotor current. The panel also contains a variac to allow for line voltage adjustment.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Standard & Custom Test Fixtures
Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I -V tester. Fixture configurations range from from simple hold down devices to temperature-controlled fixtures with front and back side contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I -V Tester and Solar Simulator.
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Bending Stiffness Test Fixture
Q-Card’s bending stiffness fixture features splayed feet and aggressive no-slip rubber pads for stability. It is manufactured of aerospace-grade aluminum alloy with a hard anodized, scratch-resistant, durable finish to provide years of rigorous testing and trouble-free service.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Fixture Kit
MF500
Electronic Test Fixture Kit Very low-cost kit facilitates use in situations where traditional fixtures are too expensive:o Research & Developmento Engineeringo Low-volume Production Uses include:o Debuggingo Programmingo Verification and Test
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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PCB Test Connectors
Tag-Connect
Tag-Connect is a simple and secure way of connecting debuggers, programmers and test equipment to your PCBs. Tag-Connect uses a specially designed and patented connector for making the connection to your PCB (Patent Pending for the -NL versions). Tag-Connect eliminates the need for a programming or JTAG connector on your PCB.
