Gigabit Ethernet Test
-
product
SMD Test Fixture
16034G
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
-
product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
-
product
Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
-
product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
-
product
Research & Electronic Test Products
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
-
product
6U CompactPCI 10 Gigabit Ethernet Switch Blade
cPCI-6S10
- ARM Cortex-A9 processor integrated in Broadcom BCM56150 switch- 24-port fully managed Gigabit Ethernet switch- Pre-installed ADLINK PacketManager accelerates packet processing- Layer 2/3 switching with advanced support for VLANs, QoS and IPv6- Two 10 Gigabit Ethernet SFP+ uplink ports- Supports IPMI based on PICMG 2.9 (System Management Specification)
-
product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
-
product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
-
product
SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
product
Automotive Ethernet Testing
The automotive industry is evolving rapidly. The newest models have features that represent unparalleled innovation – cars that can communicate with each other, the road-side infrastructure, the Internet, plus highly advanced in-car infotainment systems. Cars are also being equipped with sensor-based safety systems that can dramatically improve traffic safety by virtually eliminating crashes. And we are nearing a point where fully automated vehicles that can handle all driving tasks will soon be commercially available.
-
product
Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
-
product
10 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3430
The aTCA-3430 is a high performance 10G Fabric switch blade for AdvancedTCAR platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controllers, DPI/security network, IPTV, IP multimedia subsystems, RNC/BSC, broadband access/bearer networks, data centers, and LTE/4G network applications. The aTCA-3430 provides 10GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
-
product
Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
-
product
SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
-
product
Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
-
product
Ethernet to CAN Bus Gateway
YAV90090
• High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet P/N STM32F207IEH6• USB 2.0 connector for serial data transfer (reserved for factory use)• Connections for CAN, and power supply via 4-pole Weidmüller connector• Reboot and reset of the device to factory defaults with a reset button• Plastic casing for benchtop operation• LEDs for device status and power supply• Voltage supply from 8 to 30 V
-
product
Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
-
product
Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
-
product
SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
product
Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
-
product
10 Gigabit Ethernet Cameras
HR Series
Our cameras are available with resolutions of 2, 4, 12, and 20 megapixels in monochrome, color, or near-infrared enhanced (NIR) with full frame rates of up to 338fps, 179fps, 84fps, and 32fps respectively (we can also provide taped on glass). As the first 10GigE industrial digital camera series in the world, our HR and HT cameras (coming soon) obtain their high performance from industrial CMOS sensors with Global Shutter technology in combination with the cross-industry standard 10 Gigabit Ethernet (10GigE) interface.
-
product
ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
-
product
Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
product
Gigabit Ethernet Module
DS-MPE-GE210
The DS-MPE-GE210 is a rugged, low cost Gigabit Ethernet PCIe MiniCard module that is ideal for adding an extra Ethernet port to any system in embedded and OEM applications.
-
product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
-
product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
-
product
Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
-
product
3U OpenVPX Rugged Gigabit Ethernet Cisco ESR6300 Based Router
NetKit-3110
NetKit-3110 is a 3U conduction-cooled (VITA 48.2) VPX Gigabit Ethernet router based on Cisco’s ESR6300 Embedded Series router and is designed for harsh deployed environments. NetKit-3110 provides six high-performance Gigabit Ethernet interfaces (two routed and four switched) along with Cisco’s IOS® XE Software, giving deployed applications a rugged routing engine with a separate encryption/decryption processor, and providing highly secure yet scalable video, voice, and data services.
-
product
Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
-
product
Ethernet Testing Network Performance
Networked Communication Solutions, LLC
Xena Networks and Veryx Technologies have created an innovative Ethernet test platform that combines Xena’s high performance, wire-speed Ethernet test hardware with Veryx’s broad portfolio of IP & Ethernet functional and conformance test suites. The result: an affordable, high-performance platform for IP & Ethernet load stress, protocol conformance & functional verification testing.
