Test Call Generators
check telecom networks by call event validation.
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 1 Channel, High Voltage Outputs
M2P.6570-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
Automated Multi-Functional Tester
QTouch 1408 C
Functional Test
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Surge and Test Generator
STG 600
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Cable fault location with the BAUR STG 600. The STG 600 surge and test generator is a multifunctional cable fault locator for low voltage networks. The surge and test generator is used for cable testing as well as for precise location of high-resistive and intermittent faults in low voltage cables.* Specifically for use in low-voltage networks* High surge energy: 600 or 1000 J** Light, compact and transportable* Single systems for cable testing and faults location
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Product
HPA-0B General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785598-02
FlexRIO Signal Generator
The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
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Product
30MHZ, 150 MS/s,16 kpts, 2 Channel, 20 Vpp Function/Arbitrary Waveform Generator
T3AFG30
Arbitrary Waveform Generator
Teledyne Test Tools T3AFG5 and T3AFG10 series Function/Arbitrary Waveform Generators are a new family of low cost, high performance, single channel Function / Arbitrary waveform generators offering a high level of functionality and an excellent specification at a very competitive price point.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3C
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Speaker/Receiver Unit Test Generator
BK2019
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The BK2019 Generator is easy to operate, simple to set up, and you can fit it just about anywhere. This portable generator produces tones or sweeps and is technology you can whip out of your briefcase, plunk down on a table and start using. It's equally useful for either spot checking or for quality control. The setup is so easy that you can change DUT's in minutes.
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 1.25 GS/s on 1 Channel
M4I.6630-X8
Arbitrary Waveform Generator
The M4i.66xx-x8 series arbitrary waveform generators (AWG) deliver the highest performance in both speed and resolution. The series includes PCIe cards with either one, two or four synchronous channels. The large onboard memory can be segmented to replay different waveform sequences. The AWG features a PCI Express x8 Gen 2 interface that offers outstanding data streaming performance. The interface and Spectrum’s optimized drivers enable data transfer rates in excess of 2.8 GB/s so that signals can continuously replayed at a high output rate. While the cards have been designed using the latest technology they are still software compatible with the drivers from earlier Spectrum waveform generators. So, existing customers can use the same software they developed for a 10 year old 20 MS/s AWG card and for an M4i series 625 MS/s AWG.
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Product
3GHz 16-Channel Signal Generator 19" 3U Rack Module
LS30816R
Signal Generator
The LS30816R, 3GHz 16 channel RF Analog Signal Generator, offers industry leading performance, in a 3U, 19” space efficient, rack-mounted box. The LS30816R features 16 phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. With the highest channel density in the market the LS30816R offer the ideal solution for applications requiring high channel count at minimum space and cost.
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Product
Test Case Generator
Hexawise
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Use Hexawise to design better tests. Maximize test coverage with the minimum number of test cases. Find twice as many errors per tester hour. Manually-designed software test plans often omit combinations of functions and configurations that need to be tested. Hexawise leaves no gaps and ensures all important combinations get tested.
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30U
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Product
Impulse Test Generator
SUG-CCITT-A
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Impulse Test Generator SUG-CCITT-A (1a. 10/700us, 6KV, figure is according to N.1 in IEC60950-1:2005 Annex N). N.1 ITU-T impulse test generators.
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Product
RMP Replaceable General Purpose Probe
RMP-22B
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 125Test Center (mil): 20Test Center (mm): 0.51Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 52Recommended Travel (mm): 1.33Mechanical Life (no of cyles): 50,000Overall Length (mil): 598Overall Length (mm): 15.19
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Product
3GHz Dual Channel Signal Generator
LS3082B
Signal Generator
The LS3082B is a 3GHz Dual Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
12GHz Four Channel Signal Generator
LS1294B
Signal Generator
The LS1294B is a 12GHz Four Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
General Purpose Switches
SMX-5XXX (General Purpose)
General Purpose Switch
The VTI SMX-5xxx Series of general purpose switches deliver exceptional performance and reliability by implementing extensive signal path shielding, isolation and built-in health monitoring. Embedded virtual schematic control simplifies setup and debugging, allowing all relays to be engaged independent of application software and device drivers.Ideally suited for a wide range of discrete signal switching, the SMX-5xxx Series provides uncompromised measurement integrity ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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Product
Alternate 2.50 (71.00) - 5.80 (164.00) General Purpose Probe
P2665G-1C2S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
Pulse Generator
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Product
1.25GS/s 16Bit 1GS Mem 8CH 8 Markers AWG
P1288D
Waveform Generator
The Proteus P1288D, is a 1.25GS/s, eight channel arbitrary waveform generator packaged in a 4U, half 19” dedicated chassis, offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P1288D offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels
M2P.6566-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2J40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Test Signal Generators
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MicroImage Video Systems has a broad array of video test signal and color bar?generators designed for many applications from laboratory and testing to embedded systems. MicroImage Video Systems can design a video test signal generator for your applications. In fact, we have designed many more custom test signal generators that we offer as standard products. Small size is important and our video test signal generators start at just 1.5 inches square.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2C40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Digital And Analog Call Simulation
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GL’s T1 E1/Analog Test Suite supports analysis and emulation of legacy protocols (MFCR2, E&M, SS1/SS4, SS5, Voice Call Signaling, 2-wire Call, SF Signaling (DTMF)) applicable to Federal Aviation Administration "FAA" within their National Airspace System "NAS" Ground-to-Ground Air Traffic Control Network and Voice System (NVS) to Analog Interphone.
