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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
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8-Channel, 200MHz, 512Kb/channel, Data/Pattern Generator
Acute TD3008E
Model / Data Channel / Event Channel / Pattern DepthTD3008E / 8 / 3 / 512Kb/chTD3116B / 16 / 3 / 1Mb/chTD3216B / 16 / 3 / 256Mb/ch
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Antenna Measurement Software
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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PXIe-6536, 32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module
779988-01
32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module—The PXIe‑6536 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Dual Channel Bit Synchronizer for Rates up to 45 Mbps
LS-45-DB
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Avionics Data Bus Tester
Distributed CORVUS
Distributed CORVUS works in conjunction with CORVUS-300 to isolate bus anomalies and fault resolution. The Transmit unit, C-9235-TX, sends 1553 like data pattern through a bus stub and coupler to the Receive unit, C-9235-RX, on another stub. This will measure insertion loss, possible bit errors and correct polarity. The Receive unit can also be used to give a digital scope representation of the active data bus showing signal quality and peak to peak amplitude.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Logic Analyzers
The PC-based Logic Analyzers are controlled with easy-to-use Windows software. This allows for more organized data display (with color-coded data and increased screen size), intuitive user interface, and data management (file saving, loading, sharing and exporting to other software and reports). This provides the familiar Timing and Statelist displays. However, they are much larger than those found on a standalone Logic Analyzer. Many also have Pattern Generators (digital word generators) that can output digital data.
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FMC, XMC & PMC
The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.
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Pattern Generators
A Pattern Generator outputs digital data and is used to stimulate circuits. The data can be from user files, previously captured data or from the data creation wizard (editor) in the software. All of our Pattern Generators (digital word generators) are also Logic Analyzers and are controlled with easy-to-use Windows software. Some or all of the outputs are bi-directional and can be used to capture data.
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.
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Artificial Intelligence And Machine Learning Testing
AI and ML testing framework can efficiently recognize pitfalls and with constant updates to the algorithms, it is feasible to discover even the negligible error. Essentially, Artificial Intelligence (AI) and Machine Learning (ML) tech are well-trained to process data, identify schemes and patterns, form and evaluate tests without human support. This is made possible with deep learning and artificial neural networks when a machine self-educates based on the given data sets or data extracted from an external source such as the web.
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Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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Central Office Line Simulator
AI-7280
The AI-7280 is a highly flexible central office line simulator. It is designed primarily for the testing and verification of common terminal equipment, including standard telephones, Caller ID devices, SMS (Short Message Service) capable equipment, and any device using an analog Tip/Ring interface circuit. Supplied with the TRsSim software for Windows, it can analyze a telephone''s DTMF characteristics, pulse dialing and flash timing, generate various network tones and ringing patterns. Both Type I (on-hook) and Type II (off-hook) Caller ID is supported using either FSK or DTMF data transmission. As an optional component, the TRsSim software can perform SMS testing to either the ETSI protocol 1 or protocol 2 standards.
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Compact Anechoic Chambers
If you have mmmwave or THz antenna phased-array that require Over the Air measurements, MilliBox has the equipment and tools that you need. With the help of MilliBox compact anechoic chamber system, you can plot radiation pattern , collect data from those plots, and assess your antenna performance easily and precisely.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Video Pattern Signal Generator
Model A223800/01/02/03/04
Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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Telemetry Transmitter for FM with up to 3 Bands
LS-11-F
The LS-11-F portable FM test transmitter is designed for checkout and troubleshooting of telemetry receiving systems operating with FM modulation. For applications with any of the ARTM modulations (Tier 0, Tier I, or Tier II), please refer to the LS-11-M Data Sheet. Complete ground stations including the antenna with LNA, RF down-converter, IF receiver, bit synchronizer, and PCM decommutator can be tested and bit error tests performed. The design allows secure links to be tested with an external encryptor. The Test Transmitter contains an internal PCM Data Simulator and Pseudorandom patterngenerator that operates in a BERT mode. The device provides simulated clock and data (without transmitter enabled) and accepts external data for modulating the internal transmitter. Complete setup can be achieved locally through the keypad and two-line LCD display or remotely through the USB Interface. Operational parameters include the PCM format parameter database information (frame sync patterns, wavewords, etc…), pre-modulation filter selection, transmitter carrier frequency, transmitter deviation, and output power level. Output power can be selected from approx. -60 to +5 dBm in 5 dB steps. The Test Transmitter contains a LiFePO4 Battery (Lithium Iron Phosphate), which provides higher energy density at ¼ the weight of legacy lead-acid batteries. The unit also provides an internal battery charger and will operate for up to twelve hours on battery power having received on a full charge.
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PCIe Fast Digital Waveform Acquisition/Pattern Generator - 32 Digital I/O Channels, 1 kS/s up to 125 MS/s Sampling Speed
M2P.7515-X4
The M2p.75xx series of fast digital I/O cards allow to acquire or replay digital patterns with a programmable speed of up to 125 MS/s. The direction can be switched by software between input (digital data acquisition) and output (digital pattern generation). The on-board memory of 1 GByte can be completely used for digital pattern. Furthermore the on-board memory can be switched to a FIFO buffer allowing to continuously stream data in either output or input direction.
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Microsoft Graph Data Connect
Microsoft Graph is the Microsoft 365 data that describes the patterns of productivity, identity, and security in an organization. Microsoft Graph Data Connect offers developers a highly secure, efficient way to copy Microsoft Graph datasets, at scale, into Azure Data Factory. It's an ideal way to train AI and machine learning models that uncover rich organizational insights and deliver new value to your productivity solutions.
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RF
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and an attitude to utilise the latest technologies.
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Material Testing Software
TRAPEZIUM X
Windows 10 compatible TRAPEZIUM X can carry out various tests ranging from simple test control to complex custom-made patterns, using the industry's first data search and preview function, free layout reports, visual wizard settings, quick panel, and quick conditions lists.
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PCIe-6535B, 32-Channel, 10 MHz, 40 MB/s Digital I/O Device
782629-01
The PCIe-6535 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Telemetry Simulators & Test Transmitters
Command Data Telemetry Simulators offer a dynamic way to create or change a PCM data stream on a word by word basis on the fly. This PCM data stream can be used to modulate an FM or SOQPSK RF output at S-Band or L-Band. In addition to simulating a new telemetry stream, the telemetry simulators can play back and loop an archived data file (which can also be changed on the fly) or create pseudo-random patterns.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Optical & Electrical Data/Pattern Generators
The Data/Pattern Generators offer both electrical and Optical outputs with standard and custom data patterns. PPG products cover data rates ranging from 100 Mb/s to 28.05 Gb/s.
