Filter Results By:
Products
Applications
Manufacturers
-
product
AIM System Solutions
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
-
product
RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
-
product
Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
-
product
200KHz / 10000Freq.Point LCR Meter
MCH-2816A
It has high test frequency of 300kHz and 0.01Hz stepping arbitrary programming, and it has 10mV-2V signal level, all making it meet the precision test requirements of production line quality control, in-coming inspection and lab. Its HANDLER, RS232c interfaces are used for the component automatic sorting system, which provides the conditions for computer telecommunication and test recording. Flexible frequency-response analysis:Due to non-ideal inductor, capacitor and resistor, in order to precisely evaluate the characteristics of one component in one frequency band, MCH2816 could use its signal generation ability with 10mHz resolution to correctly analyze frequency response of the component parameters in any frequency band. In particular, it can do the precise measuring of the resonant impedance of the low-frequency ceramic resonant devices which has wide impedance range.
-
product
Blackbodies & Extended Area Sources
The Infinity Series of blackbody radiation sources and extended area sources combine leading edge technology with features that support the expanding test requirements of the latest high performance sensors. SBIR designs the most stable, uniform, accurate and highly emissive blackbodies available. SBIR now offers VANTABLACK®S-IR as an optional coating, providing the E-O test community an unprecedented flat plate source emisisivty. SBIR continues to offer blackbody systems that provide the test community with unequaled performance, reliability and ease of integration into test systems. Our blackbody family includes six different varieties to choose from. The Infinity line offers four types of precision blackbody systems and our extended area sources offer two additional types of precision blackbodies to support all levels of IR testing.
-
product
2-port Battery Portable Passive Intermodulation Analyzer - iXA Series
iXA
The Kaelus iXA Series Passive Intermodulation (PIM) analyzer is a dual-port, battery powered PIM Test Analyzer. It supports multiple test scenarios such as testing at the top of the tower, the base of the tower, rooftop, in-building for DAS systems and external PIM Finding.No other PIM tester has ever been integrated to this level! The iXA includes a network of electronic switches to change from one-port to two-port measurement seamlessly. In addition, with integrated Range-to-Fault (RTF) on each port, the user can first troubleshoot the system for internal PIM. Then, without reconnection, the user can progress with the external PIM process, making the entire process much more efficient.With integrated RTF on each port, the user can collect four times more range-to-fault data than the standard 1-port PIM Finder solution. Thus, the user can easily locate and swiftly eliminate the strongest PIM source.
-
product
Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
-
product
Small Device Noise Emission Test System
The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.
-
product
Hardy Shaker
HI-913
This Hardy Shaker provides the ability to set the amplitude and change the frequency range without the amplitude changing. This automation makes conducting a test easier. A test can be conducted on a vibration transducer and manually recorded. Multiple tests are not saved; for multiple tests use the HI-903 or HI-803 units. The HI-913 is used for testing from 7 to 10,000 Hz, it offers adjustable frequency and vibration levels. This provides a reference source for verifying the accuracy of vibration transducers, connectors, cabling and instruments or instrumentation systems. The HI-913 has a ruggedized suspension system that can support heavy transducers (up to 800 grams - see frequency limits in the manual). The HI-913 has a built-in battery charger that can operate on 120 or 240 VAC. The unit comes in a rugged Pelican case.
-
product
Device Testing
S-TEST Lab
SPEKTRA Schwingungstechnik und Akustik GmbH Dresden
S-TEST Lab solutions have been tailored for system level testing in development and lab environments. The core component is the S-TEST desk system. It combines a compact design with the full test interface, that enables the developer to react flexible on changing requirements already in early project phases and to also verify product performance parameters.
-
product
Battery Extra Load Units
BXL Series
BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way. Also, all instruments are in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.These units can be used on any type of battery string, such as lead-acid, Li-Ion, Ni-Cd, etc. They test battery strings with voltages in the range of 5,25 – 500 V DC. On the other hand, current up to 250 A can be discharged through the BXL internal structure.The instrument simulates a constant resistance load during the discharge test. Several resistances can be set for different battery nominal voltage levels. This makes BXL extremely flexible in selecting its load capabilities.
-
product
GPIB (IEEE-488) Switching
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
-
product
Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
-
product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
-
product
Pilot V4
The Pilot V4 Next series is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs.
-
product
Aviation Engine Test Cells
1.Design, manufacture and installation: ● Thrust stand components: thrust measurement system, adapter, superstructure etc. ● Facility subsystems: DAQ, supply systems (fuel, oil) etc.2.Civil construction works: site survey, building works etc.3.Contracting: ● Turn-key – MERA is able to supply a “turn-key” test cell including civil works, thrust stand, DAQ, all necessary facility subsystems, specialized software, throttle control level and etc. ● Joint – MERA is capable to supply specified items such as thrust stand with DAQ and software. The Customer is able to procure necessary items such as test nacelle directly from OEM. 4.Project management in accordance to EPC (Engineering, Procurement, Construction, FIDIC) 5.Certification in accordance to international and local standards and rules (SAE 5305) Engine types: PD-14, PS-90, RD-93, RD-33MK, AL-31FN
-
product
JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
-
product
Build to Print
In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.
-
product
Compact Antenna Test Range
700.00 MHZ – 110000.00 MHZ
A Compact Antenna Test Range (CATR) allows electrically large antennas to be measured at a significantly shorter distance than would be necessary in a traditional far-field test range. Compact ranges use a source antenna (feed) to radiate a spherical wave in the direction of a parabolic reflector, collimating it into a planar wave for aperture illumination of a Device under Test (DUT). It's lowest operational frequency is determined by the size of the reflector, its edge treatment and the absorbers. The two edge treatments available are serrated edge for general purpose applications, and rolled edge to achieve higher accuracy for special applications. Multiple-feed systems may be used to improve the far-field characteristics. A compact range test system also allows system level testing of a complete device architecture.
-
product
Board Fault Locator
SYSTEM 8 (BFL)
The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applications.
-
product
PXIe-6544, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument
780992-03
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
-
product
Booster and In-line Amplifier
Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
-
product
Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
-
product
Drivetrain Test Stands
Customers in automotive and off-highway vehicle production and R&D environments trust us to design and build precise, reliable, and repeatable drivetrain component test stands. All of our systems are designed to provide the highest level of dynamic testing capability at a competitive price. For decades, RedViking has designed, built, and implemented highly engineered test systems for drivetrain systems and components.
-
product
Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
-
product
Kjeldahl Analyzer
LD-LKA-A10
Kjeldahl AnalyzerLD-LKA-A10is a complete microcomputer controlled user-friendly automatic device integrating distillation and titration functions. It is compatible with 42 mm digestion tubes and has features such as automatic waste discharge and cleaning of digestion tubes and titration cups, control steam flow and real time detection of distillation temperature. Along with High-accuracy Charging Pump and Titration system, it is also equipped with large LCD touch screen panel, faster ARM system and multiple fluid level detection system to ensure smooth test process.
-
product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
-
product
Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
-
product
Measurement, Communications & Testing
Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
-
product
Reference Thermapen®
Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
