X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Non- Destructive Testing
NDT
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Non-destructive testing (NDT) is an application of industrial radiography that uses X-rays to reveal defects in manufactured products or structures. Fujifilm NDT systems share digital X-ray innovations with our Fuji Computed Radiography (FCR) imaging systems.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Micro-CT for material science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the sub-micron level.
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Tracealyzer
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Get X-ray vision into your embedded software at runtime.Find improvements quickly, speed up development and verify the real-time behavior. Deliver great products with confidence.
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Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
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Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Gratings for Space-Flight
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HORIBA Scientific (with its Jobin Yvon Grating Technology) has 50 years of experience in space-flight gratings. The first space flight ruled gratings were produced for the CNES mission D2A in early 70’s. Since that date, HORIBA Scientific has continuously produced some of the most technically-challenging gratings ranging from off-plane X-ray replica gratings to aspherical 5800gr/mm VLS gratings for the FUV and Transmission Grisms or very low groove density VNIR-SWIR ruled blazed gratings. HORIBA Scientific gratings (master and replica) have been space qualified and are TRL9.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
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Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Benchtop X-ray Diffractometer
Aeris
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Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
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X-Ray Preamplifier Power Supply
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The X-ray Preamplifier Power Supply (XPPS) provides power for 50 or more preamplifiers. The 19-inch rack-mount or benchtop unit contains linear power supplies that generate +/-12V @ 5.1 Amperes and +/-24V @ 3.6 Amperes, with very little noise.
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XRF
M Series
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The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
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High Voltage
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A comprehensive range of high voltage power sources are available from ETPS. Product families range from programmable high precision laboratory power supplies to HV Cassettes and PCB modules. The flexible high voltage design platforms and responsive management structure enable us to offer an economically viable custom build. High voltage power supplies from ETPS are used in a variety of applications ranging from electron acceleration systems and mass spectrometers to magnetrons, x-ray and nuclear research.
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High Speed Inline AXI Platform
AXI X Series
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The X-platform series is a dedicated high speed inline automated X-ray inspection system for the inspection of PCB-assembly boards for single/multipanels or samples in trays. The system offers market leading inspection speed and is ideal for low-mix high-volume production environment.
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Analysers
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Hand-held tester for checking the molybdenum content of stainless steels. Portable semi-quantative analyser for stainless steels, nickel-base alloys and monel. The MolyTester is most convenient for quick, non-destructive determination of alloys both in-shop and outdoor. Molytester is apllicable even for narrow weld seas where the local resolution of X-ray analysers is not fine enough.
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CT-ALPHA
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The CT-ALPHA system meets the most stringent demands in CT X-ray. With this Computed Tomography system, ProCon X-ray GmbH offers the highest possible flexibility for individual customer requirements.
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Spectrometers
VUV and XUV Spectrometers
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Innovative and affordable spectrometers for VUV/XUV/Hard X-Ray spectroscopy applications in science and industry
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Survey Meters
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Measures alpha, beta, gamma, and x-rays. Its digital display shows readings in your choice of counts per minute (CPM), CPS, Sv/hr, or mR/hr, or in accumulated counts. Now with the USB and the Observer USB Software, you can download your accumulated data form the Digilert200's internal memory, set computer alarms, and calibrate your instrument.
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Benchtop X-ray Crystallography System
XtaLAB mini II
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The Rigaku XtaLAB mini II, benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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High Resolution Inline AXI Platform
AXI XS Series
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The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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XRF Analyzer
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X-ray fluorescence (XRF) is a non-destructive analytical method used to determine elemental concentrations in various materials.
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
