Microelectronic
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Product
2-Zone and 3-Zone Vertical Thermal Shock Chambers
FS
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Originally developed for testing microelectronic devices for use in military and aerospace electronic systems, Bemco Vertical Thermal Shock Chambers are widely used for screening and quality evaluation of smaller electronic parts.
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Product
OEM Femtosecond/Picosecond Laser and Amplifier Modules
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They provide output wavelength options at 780 nm, 925 nm, 1030 nm, 1064 nm and 1550 nm and can be used as stand-alone systems with a user-provided 5 V DC power supply or integrated into higher power laser platforms. The high quality ultrafast pulse streams are perfect seed sources for chirped pulse amplifier systems used in diverse applications, such as high precision microelectronics micromachining, laser eye surgery and nonlinear spectroscopy.
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Product
METES - Meter Test Systems
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Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Product
Microelectronics And Packaging AOI
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Machine Vision Products, Inc. has extensive experience in a wide range of Microelectronics and Packaging applications. MVP works with the world’s leading manufacturers on a global basis. From multiple die and wire technologies to leadframe, ball grid array and surface inspection applications, MVP has the widest applications toolbox of any AOI provider. MVP takes pride in the fact that they supply many complex inspection solutions to diverse industries such as Automotive, Telecoms, Medical Devices, Military, and Space. MVP’s 900 Series is the base platform upon which all Microelectronics and Packaging inspection solutions are based. The 900 series 2D capabilities provide metrology and defect detection using a propriety Quad-Color lighting, Telecentric optics and resolutions down to 1um. 3D height measurement capabilities allow for in-line high speed inspection of Dies, paste deposition, positional accuracy, volume and height with a resolution down to 1.13um.
