B-H Curve
depict's the relationship of B (magnetic flux density) and H (magnetic field density).
See Also: Curve Tracers, Hysteresis Graphs
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Curve Tracer
Series 5000C
Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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B-H Analyzer
SY-8218 / SY-8219
Soft magnetic components made of ferrite play an important role in electric components as they are used in a broad range of applications from low-frequency applications such as yokes for micromotors, to high-frequency applications such as flyback transformers, deflecting yokes, high-frequency transformers and magnetic heads. In actual operation, these magnetic components display characteristics different from DC magnetic characteristics or characteristics measured with an LCR meter.
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Curved Needle Test Systems
Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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SENSOR FOR THICK & CURVED MATERIALS
S3
The smallest, simplest, most affordable high-precision non-contact sheet resistance sensor availableNon-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterReads any conductive coatingon even the thickest nonconductive substratesOptions include PC-based productivity software, stage, and morePerformance limited by "lift off" phenomenonelevation of sensor above conductive layer must be carefully controlled
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Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Power Device Analyzer / Curve Tracer
B1505A
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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PathWave IV Curve Measurement Software
PW9251A
The PW9251A PathWave IV Curve Measurement software helps to control Keysight SMUs for easy test setup and to perform IV measurements without any programming.
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Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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PV Analyzer I-V Curve Tracers
The Solmetric line of PV Analyzer I-V curve tracers are widely used in Commissioning, Auditing, O&M, and Troubleshooting of PV systems.
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1500V Multifunction I-V Curve Tracer
SOLAR I-Ve
SOLAR I-Ve allows both testing a single-phase (three-phase with optional MPP300) photovoltaic system and verifying I-V curve. Thanks to remote unit SOLAR02, it is possible to test the system complying with the requirement of simultaneity as provided for by the reference standard. SOLAR02 is a datalogger which, synchronized with SOLAR I-Ve, acquires the data relevant to irradiation and temperature while tests carried out by SOLAR I-Ve are carried out.
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Automated DC Parametric Curve Tracer
MegaTrace
MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.
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1500V 15A I-V Curve Tracer
I-V525w
I-V525w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V525w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.













