Inverter Test
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Product
High Current Probes (Inverter Testing) HCB166B12ALS90
1045058
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The High Current Probes (Inverter Testing) HCB166B12ALS90, with order code 1045058, is designed for high-performance testing applications in various industries. This basic contact probe features a robust design that can withstand extreme temperatures ranging from -45°C to +200°C, making it suitable for applications that demand reliability in harsh environments. With a continuous current rating of 400A and a typical contact resistance of only 0.10 mOhm, this probe guarantees efficient performance and accurate testing results, essential for inverter testing and other critical applications.Engineered with mechanical specifications in mind, the HCB166B12ALS90 boasts a preload of 500cN and spring force of 9000cN, along with a nominal travel of 4.40mm to ensure precise engagement. The probe is constructed using high-quality materials, including a silver tip style, beryllium copper plunger, and gold plating on the plunger and barrel, ensuring excellent conductivity and durability. The dimensions of the probe, with a total length of 65.50mm and a tip diameter of 3.00mm, are optimized for ease of use and versatility in various connection types. Overall, this probe is a vital tool for electrical testing professionals seeking reliability and high performance.
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Product
High Current Probes (Inverter Testing) HCB190B12MS73
1135082
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The High Current Probes (Inverter Testing) HCB190B12MS73 are engineered to meet the demanding requirements of inverter testing applications. With an impressive temperature range from -45°C to +200°C, these probes excel in extreme conditions, ensuring reliable performance across various environments. The HCB190 model is designed for high-performance electrical measurements, featuring a continuous current rating of 450A and a typical contact resistance of just 0.30 mOhm, making it ideal for applications that require precision and reliability.
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Product
High Current Probes (Inverter Testing) HCB170D12MS72TYPK
1139214
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The High Current Probes (Inverter Testing) HCB170D12MS72TYPK is designed for precision and reliability in high-performance electrical testing applications. With a continuous current capacity of 450A, these probes ensure efficient energy transfer and accuracy during inverter testing. They can operate within an impressive temperature range of -45°C to +200°C, making them suitable for a variety of environments and applications. The low typical contact resistance of 0.25 mOhm enhances the quality of measurements, ensuring that the tests yield reliable data that professionals can trust.
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Product
Photovoltaic/Inverter Test & Automation Solutions
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Chroma Photovoltaic/Inverter Test & Automation Solutions
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Product
High Current Probes (Inverter Testing) HCB155D12MS62TYPK
1136614
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The High Current Probes (Inverter Testing) HCB155D12MS62TYPK, with order code 1136614, are designed for precision measurements in demanding electrical environments. Capable of withstanding a temperature range from -45°C to +200°C, they are ideal for a variety of testing applications. When used for inverter testing, these probes demonstrate exceptional reliability due to their low typical contact resistance of just 0.25 mOhm, ensuring accurate measurement of currents up to 400 A continuously.
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Product
High Current Probes (Inverter Testing) HCB190D12MS68TYPK
1115528
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The HCB190D12MS68TYPK High Current Probes are engineered for precision inverter testing, accommodating an extensive temperature range from -45°C to +200°C. These probes excel in performance with a continuous current capability of up to 400 A, ensuring reliability under demanding conditions. Designed for versatility, their robust construction includes brass tips and silver plating, which significantly reduce contact resistance to a mere 0.15 mOhm, thereby maximizing efficiency in electrical measurements.
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Product
DC/AC Sine Inverter
44KS1
Sine Inverter
NAI's 44KS1 is a DC/AC Sine Inverter that accepts +28 VDC input and converts it to a 26 VAC sine wave at 65 VA power.
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market





























