Transmission Electron Microscopes
image a beam electrons through a thin specimen.
See Also: Electron Microscopes
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Field-installation Type Electric Resistivity Meter (Four-Wire Transmission)
HE-200R
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HE-200R connects resistivity sensor (ERF Series) and measures resistivity and temperature in the sample water. It is suitable for measurement of UPW resistivity.
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Data Transmission
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HighReach Measuring & Controlling System Co.,Ltd
Is sending and receiving digital or analog data between devices.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Product
ELECTRONIC MEGOHMMETER
MI-1050e
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The MI-1050e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 1 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 2.000.000 MΩ with four test voltages: 100 V, 250 V, 500 V and 1.000 V.
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Fiber Optic Inspection Microscope
80761
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The Miller 400x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment. Includes 2.5mm universal adapter cap and zipper case.
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DC Electronic Loads
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An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.Both static and fully dynamic DC loads are offered. With dynamic functionality 2 levels of load current can be set. The rise and fall time can then be adjusted together with the time period spent at each level. The load can also be made to follow complex waveforms by tracking an external arbitrary oscillator input.
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Electronic Brake Meter for Forklift Trucks
BrakeCheck FLT
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The BrakeCheck FLT is our portable brake tester designed specifically for forklift trucks.The Bowmonk BrakeCheck FLT is a fully self-contained, user-friendly, portable brake tester, which has been developed with a leading forklift truck manufacturer to take account of the slow speed and tilt of forklift truck vehicles. The instrument records the braking efficiency and percentage of braking imbalance in a matter of minutes.
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DC Electronic Load
3310G Series（800W）
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Has its own control and display panel, CC / CR / CV / CP / Dynamic modes, with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface
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Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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4500~6000W DC Electronic Loads
JT634 Series
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Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Printed Electronics & Printed Sensors
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The first membrane switch was developed and produced in 1978 using printed electronics. Conductive pastes can now also be printed on substrates such as paper, textiles, or metal in addition to polyester. Our functional foils and printed electronics enable compact, and extremely efficient electronic products that are used in every industry. Processing intelligent pastes that have various physical properties enable the production of new and innovative applications in minimized form factors without the use of additional, highly complex electronic components.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Industrial Electronics Testing for Smart Devices & More
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As more and more devices are being designed with inherent intelligence and the ability to connect and communicate, the amount and complexity of electronic content is continuously increasing for our industrial customers. They need the ability to quickly and efficiently verify proper operation of these products as they flow off the production line. Circuit Check responds to these needs by offering a wide range of industrial electronics testing solutions from consulting to complete test system and software design. We also offer adaptable support solutions to ensure proper equipment operation throughout its life cycle.
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Microscopes
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Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Electronics
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We develop and deliver a wide range of advanced technologies for the commercial and military electronics markets. Our portfolio includes flight and engine controls, electronic warfare and night vision systems, surveillance and reconnaissance sensors, mobile networked-communications equipment, systems integration, and environmentally friendly energy management systems.
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Digital Inverted Microscopes
WELDinspect
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High-resolution, ergonomic optical inspection systems designed for weld bead analysis and measurement. 4K or Full HD inverted imaging system with motorised zoom, auto-focus, built-in large aperture illumination, and dedicated software for weld bead measurements, analysis, documentation, and reporting.
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Transmission FT-NIR Spectrometer
QuasIR™ 1000
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The QuasIR™ 1000 is an NIR analysis solution that brings together portability with unmatched spectroscopic performance. The QuasIR™ 1000 ensures direct calibration transfer without the frustration of standardizing instruments or adjusting models to accommodate excessive instrument variability.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Sensitive Terahertz Detectors: Cooled Terahertz Detectors Based On Hot Electron Bolometer (HEB) And Room Temperature Terahertz Detectors Based On Golay Cell.
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Insight Product Company offers Cooled and Room Temperature Terahertz (THz) Detectors
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Electronic DC Load, 80V, 80A, 400W With/without Remote Interfaces
LD400 Series
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Versatile solution for testing dc power sourcesConstant current, resistance, conductance, voltage and power modesWide voltage and current range, 0 to 80V and 0 to 80A400 watts continuous dissipation at 28°C (360W at 40°C)600 watts short-term dissipation (up to 60 seconds)Low minimum operating voltage of <1V at 40AHigh resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminals (front terminals 30A max.)Full bus control via USB, RS232 and LXI compliant LAN interfaces (LD400P)GPIB option (LD400P only)
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Simulation Tools for Analog and Power Electronics
SIMetrix/SIMPLIS
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Fast and accurate simulator for switching power circuits, fully utilising the SIMetrix development environment.
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Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Product
Digital Microscope Camera
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Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
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Dielectric Loss Tangent and Transmission Attenuation Measurement System
RTS03
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RTS03 measures relative permittivity (dielectric constant), dielectric loss tangent in the frequency range between 5GHz and 26.5GHz based on a correlation between measurement frequency and transmission attenuation as the microwave passes through the flat plane sample.
