IV Curve
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Product
I-V Measurement Systems
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The I-V Curve Data Acquisition includes a fixture for holding cells for testing (see Figure 1 below). This fixture can accommodate cells from small to up to 100 mm x 100 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. Two micro-manipulators are provided as shown in Figure 1. Each micro-manipulator has two spring loaded contacts to allow 4-wire measurement even for cells that have top contacts only. Two back-side voltage contacts are embedded in the Plate (galvanically isolated from the Plate) and make good electrical contact when the cell is held down by vacuum to the plate. All voltage and current probes are gold-plated. The cell is held down with vacuum during testing (built-in vacuum pump).
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Product
Pulsed IV
AURIGA 4850
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Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Product
Pulsed IV Systems
AM3200-Series
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AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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Product
Power Device Analyzer / Curve Tracer
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The B1505A Power Device Analyzer / Curve Tracer is focused on the needs of power device manufacturers, while the B1506A Power Device Analyzer for Circuit Design is focused on the needs of power electronics circuit / product manufacturers. The B1507A Power Device Capacitance Analyzer helps both power device development engineers and power circuit designers maximize product value by revealing device capacitance characteristics.
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Product
Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Product
I-V Tracers
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EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
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Product
IV Characteristics Measurement Device [
PECK2400-N
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Easy-to-use measurement software supports IV measurement (software + source meter + connection cable). Compatible with Windows 10. RS-232C connection (PC is optional). Works with NI GPIB. Simultaneous use with IPCE PEC-S20 D type is possible. There is only one operation panel. done on one screen.
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Product
Semiconductor Curve Tracer
CS-3000 Series
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*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Product
Solar Panel IV Tester
REOO GIV-20A2616
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REOO GIV-20A2616 Solar Panel IV Tester is designed for PV module manufacturing electrical inspection, enabling electrical performance verification and stable output measurement during production. Built for solar factories, it supports reliable module grading.
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Product
Multi-functional High-speed I-V Measurement System
“Rakit”
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Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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Product
Goniophotometer For Luminaries Intensity Distribution Curve
LCG-1800
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Shenzhen Chuangxin Instruments Co., Ltd.
Mainly used to measure FL etc. When installing luminaires, the lighting center of luminare and the rotating center of rotating table shall be at the same position. In B- coordinates, luminaire axis is superposed with the horizontal axis of rotating table. In A- coordinates, luminaire axis is vertical with the horizontal axis of rotating table.
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
Semiconductor Curve Tracer
CS-5000 Series
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*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Product
BH Curve Tracer
6700BH Series
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This BH curve tracer is adopted pole coil measuring method. The limit of size and shape for measuring work is very little and it can measure the difference of both face and reverse side of magnet.
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Product
Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
DC Power Analyzer
The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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Product
Quick I/V Measurement Software For PXIe SMU
PX0109A
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The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Product
43 Inch UHD J Type Curved LCD Curved Monitor
CRV-430JP
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Advantech CRV-430JP provides a 43 inch UHD J type curved LCD with a curvature of 1500R. It supports 10 multi-touch controls and HDMI/DP/VGA outputs.
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Product
Curve Tracer
Series 5000C
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Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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Product
Precision Curve Tracer
CurveMasterTM
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The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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Product
Light I-V Testing for Modules
FMT-500
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Advanced analysis of solar modules including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency modules.
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Product
Automated DC Parametric Curve Tracer
MultiTrace
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MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Product
43 Inch UHD C Type Curved LCD Curved Monitor
CRV-430WP
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Advantech CRV-430WP is designed with a 43 inch UHD C type curved LCD which features a1500R curvature. It supports 10 multi-touch controls.
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Product
Automated DC Parametric Curve Tracer
MegaTrace
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MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.
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Product
Triple Alarm CAT IV Non-Contact Voltage Detector with Flashlight
FLIR VP50-2
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The FLIR VP50-2 is a durable, CAT IV-rated non-contact voltage detector featuring light, vibration, and beeper feedback alarms and a powerful LED flashlight. Use the VP50-2 to reliably check if an AC circuit is live before beginning work; detect voltage on exposed conducting parts or through insulation; identify live wires within electrical panels, switches, and outlets; or trace live wires and map circuits. With an ergonomic and drop-tested design, the FLIR VP50-2 is the right choice for professionals performing field troubleshooting and verification of electrical installations within residential, commercial, and industrial buildings.
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Product
Precision I/V Source
MeasureReady™ 155
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The MeasureReady™ 155 Precision I/V source combines premium performance with unprecedented simplicity for materials scientists and engineers requiring a precise source of current and voltage. Low RMS noise: from 200 nV (10 mV)/7 pA (1 µA). Bipolar, 4-quadrant power source. DC and AC modes supported up to 100 kHz*. Full scale ranges from 10 mV to 100 V (1 μA to 100 mA). 0.001% programming resolution (from 100 nV/10 pA.
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Product
IND AC/DC CAT IV TRMS Clamp Meter
ACDC-3400
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The Amprobe ACDC-3400 clamp multimeter is CAT IV rated to add an extra level of safety for high voltage, industrial or utility testing applications. It is an AC/DC current clamp meter and a voltage meter all in one.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Product
Semiconductor Curve Tracer
CS-8000 Series
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The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
