Surface Contamination
-
Product
Surface Contamination Kit
138/2
-
The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
-
Product
Surface Contamination Monitors
-
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
-
Product
Surface Quality Monitors
-
PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
-
Product
Surface Contamination Monitor
IMI Inspector Alert™ V2
-
The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
-
Product
Optical 12,000 Meter Connector
-
Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
-
Product
Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
-
Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
-
Product
Omicron Fiber Optic Connector
-
Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
-
Product
Total Reflection X-ray Fluorescence (TXRF) Services
-
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
Product
Geiger Counter
ONYX®
-
ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
-
Product
Elcometer Bresle Patches
135B
-
Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
-
Product
Analytical Techniques
-
Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
-
Product
Fluid Contamination Test
-
Fluid contamination testing determines the abilities of materials to withstand the contaminating fluids, to which they are exposed in service.
-
Product
Surface
-
Electronic Development Labs, Inc.
EDL has been handcrafting quality sensors that are robust in design and feature high accuracy with remarkable reliability. Our technicians meticulously consider every specification, meeeting the individual needs of every customer. And quality doesn’t have to mean exorbitant cost. Our sensors are always priced competitively to deliver exceptional value.
-
Product
Ionic Contamination Test Systems
CM+ Series
-
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
-
Product
Ionic Contamination Test Equipment
-
For manufacturers driven to deliver quality products, SCS Ionic Contamination Test Systems are the industry standard, delivering accuracy and performance in a range of configurations.
-
Product
Absolute Contamination Standards (ACS)
-
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
-
Product
Surface Condition
-
Surface Condition: degree or percentage of rust, level of mill scale, etc., can be visibly assessed using Pictorial Surface Standards. Weld beads can be assessed using a weld comparator and weld gauges.
-
Product
Automated Monitoring of Airborne Molecular Contamination
AMC-Monitor T-1000
-
The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
-
Product
Contamination Detection and Analysis
-
Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
-
Product
Elcometer Surface Comparators
125
-
Using the Elcometer 125 surface comparators as a reference the blasted profile can be compared to the four reference profile grades in each comparator. Profiles are recorded in microns.
-
Product
Surface Measurement Instrumentts
-
Analyze surfaces texture with nanometer precision is already a technological challenge, but TR Scan Premium is able to perform this task with unprecedented speed! The TR Scan Premium is used in workshops and laboratories worldwide. It is completely designed and manufactured in Switzerland by TRIMOS. The TR Scan is focusing on Digital Holographic Imaging Technology. Accuracy, speed, ease of use and modular construction make it ideal for all types of surface measurements.
-
Product
Skin Surface Probe
SST-2
-
The SST-2 skin surface temperature probe for humans, with convenient plastic handle. Probe re-useable and has a fast response time.
-
Product
EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
-
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
-
Product
Surface Roughness Gage
1000
-
The Adcole Model 1000 represents the state of the art in surface roughness measurement for crankshafts, camshafts and other cylindrical components. The machine is pre-programmed for optimized workflows. Operators simply need to load and unload the parts. In addition to its unprecedented accuracy, this product is also the fastest system for taking critical surface measurements.The base gage is a rugged, self-standing horizontal granite surface plate with affixed headstock, tailstock and carriage. Scanned data is immediately available for review on the touchscreen monitor or printing.
-
Product
Surface Measurement Instrument
SMI
-
Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
-
Product
Surface Calibrators
-
Electronic Development Labs, Inc.
A software-driven process for gaming mice that optimizes the sensor to a specific surface's texture, reflectivity, and weave.
-
Product
Surface Cleanliness
-
Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
-
Product
Surface Probes
-
Eddyfi offers a variety of mechanical designs to suit your ECA surface inspection requirements, ensuring high-quality results.
-
-
Product
Surface Thickness Gauges
-
The Cygnus range of ultrasonic surface thickness gauges are non-destructive testing (NDT) instruments that enable an accurate metal thickness measurement to be obtained from one side only, without the removal of protective coatings or damage to test materials.
