Protection Relay Test
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
PXI/PXIe Microwave Relay, Single SPDT, 26.5 GHz, 50 Ω, SMA, Internal Termination, Failsafe, Remote Mount
40-781A-221-E
Relay
The 40-781A-221-E (PXI) and 42-781A-221-E (PXIe) are single failsafe SPDT 26.5 GHz microwave relay modules with internal terminations and remotely mounted relays. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50 GHz in 50 Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
PXI/PXIe Power Relay Module, 8xSPDT, 5 Amp, 50-Pin SGMC Connector
40-158-004-HI
Relay
The 40/42-158-004-HI is a PXI/PXIe high density power relay module with 8xSPDT switches rated at 5A and includes the hardware interlock option. User connection is via a 50-pin SGMC male connector, hardware interlock is via a 4-pin 00 series socket (mating plug is supplied). The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock.
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Product
PXI/PXIe High Density Electro-mechanical Relay Module, 50xDPST
40-146A-202
Relay
The 40-146A-202 (PXI) and 42-146A-202 (PXIe) 50xDPST relay module is part of a range of high density switching modules available in Normally Open (SPST & DPST), Changeover (SPDT) and Normally Closed (SPST) configurations. Connections are made via a front panel 200-pin female connector.
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Product
PXI Power Relay Module, 10xSPST, 16 A, With Interlock
40-161A-003-HI
Relay
The 40/42-161A-003-HI is a PXI/PXIe 10xSPST power relay modulewith optional hardware interlock. It is part of a range of high density power switching solutions with a choice of SPST, and SPDT relay configurations with or without hardware interlock.
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Rear Cover, G12, Tabletop Configuration
310113421
Protective Cover
The G12 Rear cover is designed to connect to the Receiver in a Table top configuration and act as a mean to hide the cables that are running back to the testing equipment. This works well with applications where the cables are running down to a lower level below the G12.
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781420-11
Reed Relay
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 26.5 GHz, 50 Ω, SMA, External Termination, Failsafe, Remote Mount
40-781A-322-E
Relay
The 40-781A-322-E (PXI) and 42-781A-322-E (PXIe) are dual failsafe SPDT 26.5 GHz microwave relay modules with external terminations and remotely mounted relays. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50 GHz in 50 Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
PXI/PXIe Power Relay Module, 36xSPST, 5 Amp, 50-pin SGMC Connectors
42-153-002
Relay
The 40/42-153-002 is a PXI/PXIe high density power relay module with 36xSPST switches rated at 5A. User connection is via 2x50-pin SGMC male connectors.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
PXI/PXIe Microwave Relay, Triple SPDT, 18GHz, 50Ω, SMA, Remote Mount
40-780B-523-E
Relay
The 40-780B-523-E (PXI) and 42-780B-523-E (PXIe) are triple SPDT 18GHz unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT panel mounted relays capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions can support up to three SPDT relays in a single slot.
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Product
Relays
CXM/2x1
Relay
CXM/2x1-F-SMA Microwave Relays have a Normally Closed (NC = OFF) and Normally Open (NO = ON) Position. Specifications Bandpass DC to 18 GHz Insertion Loss 0.3 dB @1 GHz, 0.8 dB @ 18 GHz VSWR 1.2:1 @ 1 GHz, 1.5:1 @ 18 GHz Isolation -80 dB @ 1 GHz, -60 dB @ 18 GHz
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
CMOS Drive High Voltage SIL Reed Relays for up to 3 kilovolts
Series 101
Reed Relay
Direct drive from 74HC/HCT Cmos SIL Relay. Dry or Mercury Wetted switches. 5 Volt coil for 1A dry version is 1600 0r 3000 Ohms
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Product
Ultra High Density 4mm Reed Relays
122-1-A-3/2
Reed Relay
Single Pole Reed Relays0.5 Amp switchingVery high packing densityStacking on 4mm x 4mm pitch1 Form A3 V Coil
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Product
PXI Mixed Configuration Relay Module - 9 Cells Populated
40-138-AA-BB-CC-DD (9 CELL)
Relay
The 40-138 2A Relay Module with 9 cells populated is a cell-based mixed configuration switching module suitable for applications requiring medium power switching with high density. It provides a broad selection of mixed relay types for greater flexibility and features 2A current capacity and voltages to 300VDC/250VAC.
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Product
PXIe Power Relay Module, 16xSPST, 16 A, With Interlock
42-161A-001-HI
Relay
The 40/42-161A-001-HI is a PXI/PXIe 16xSPST power relay module with optional hardware interlock. It is part of a range of high density power switching solutions with a choice of SPST, and SPDT relay configurations with or without hardware interlock.
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Product
Protective Cover, G12, Receiver
310113402
Protective Cover
The Receiver Protective Cover prevents damage to your modules and contacts and keeps your test system in proper working order.
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Product
PXI 75 x Normally Closed Relay 1A 60W
40-145-101-NC
Relay
The 40-145/46/48 range of high density switching modules are available in Normally Open (SPST & DPST) and changeover (SPDT) configurations. Connections are made via a front panel 200 pin female connector.
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Product
PCI 50xDPST Reed Relay Card
50-115A-122
Reed Relay
This is the 50xDPST version of our 50-110A/50-115A range of reed relay switching cards which are available in both Changeover (SPDT) and Normally Open (SPST & DPST) configurations. Connections are made via a front panel 200 pin female LFH connector.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
PXI 20Amp 28Volt 4xSPST Automotive Relay
40-180-111
Relay
Models 40-180/181 are High Power Relay Modules available with 2 SPST, 4 SPST or 2 SPDT contacts. They are capable of switching inductive/capacitive loads up to 40A at 14VDC or 20A at 28VDC.The 40-180/181 High Power Relay Modules are suitable for switching heavy loads or for slaving large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of D.C. voltage at high current. The 28V version is suitable for truck system test applications.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
