Memory Test Systems
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Product
Cogging Test System
CTS
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Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
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Product
Versatile quality control testing system
QuickSun® 550Ei
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QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.
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Product
Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Product
Relay Testing System
UNO
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With high power outputs package in an extremely compact and rugged system, the UNO has a tremendous power-to-weight ratio. The design incorporates the latest in modern digital microprocessor technology to achieve unbeatable output characteristics in terms of power, accuracy, low distortion, and dynamic capability. This hi-tech solution enables the testing of many different functions required in relay testing without the need of additional accessories.
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Product
Modular Battery Test System
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This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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Product
Test System
Griffin III
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The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Product
Circuit Breaker Test Systems
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Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Product
General Purpose Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Electronics Functional Test Systems offers a wealth of choices in general purpose instruments, power supplies, switch loading and DIO capabilities in a multiple rack heights, seamlessly connected with open architecture software Test Exec SL, all immaculately assembled and thoroughly tested so you don’t have to.
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Product
Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Product
Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Product
System on Demand (SoD): HiL Test System
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System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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Product
Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-PUSH
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Foerster Instruments, Incorporated
The ROTO-PUSH test station, which is integrated in production lines, serves to test cylindrical components for cracks in the liner surface. The testing configuration has to be rotated for automatic crack testing. After the test, the test pieces are sorted and separated. The continuous test run ensures a high testing rate, which increases profitability.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Product
Photoelectrochemical Test System
ModuLab XM
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The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Product
AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Product
Thermal Stability Test System
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Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Product
Integrated 5G mmWave Test System
IQgig-5G
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The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Product
Power Module And Device Testing System
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Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Diagnostic Test System™
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The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Measuring Systems For Night Vision Systems
MTF Test Bench For Image Intensifier Tubes (IIT) And Night Vision Devices (NVD)
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Optik Elektronik Gerätetechnik GmbH
The MTF MASTER NVD was specially designed to measure the MTF of Night Vision Devices (NVD) and of Image Intensifier Tubes (IIT).
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Product
PCI / PMC / CompactPCI Test System
PCITS
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The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PD Test Systems
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1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Product
Memory Tester
RAMCHECK
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RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
