Logic
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ATPG with Embedded Compression
TestKompress
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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PXI High Density Digital I/O Module, 32-bit TTL
40-410-001
The 40-410 range of Digital I/O Modules are suitable for operating external devices, such as heavy duty relays (power, RF and high voltage types), solenoids, lamps, or for interfacing with external logic such as a programmable instrument with a BCD interface.
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64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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DDR4 X4/x8 BGA Interposer For Logic Analyzer, Connects To 61-pin ZIF
W4643A
The W4643A DDR4 2-wing BGA interposer for DDR4 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W4643A is the smallest BGA interposers for DDR4 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
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Active FET Probe Kit 1.2 GHz, 10x, ±40 V
CT4121
The CT4121 is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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32-CH/64-CH Isolated Digital I/O PCI Express Card With Digital Filter
AX92351
The AX92351 is a 64-ch isolated digital I/O PCI Express card with 2,000VDC isolation protection. This high-density digital I/O card with high-speed PCI Express x1 bus is excellent for use in applications requiring digital control or monitoring, such as semiconductor machinery, PC-based industrial machinery, programmable I/O logic control, and process status monitoring. The AX92351 features 32 isolated digital input channels and 32 isolated digital output channels with isolation protection of 2,000V for industrial applications where high-voltage isolation is required. It is equipped with a board ID feature for easy identification of multiple cards in single system. There is a digital filter function to prevent input signals from carrying noise or a chattering. Each isolated input has a sink or source current which supports dry and wet contact for maximum application flexibility. The card has a wide range of input voltage from 10 to 30V to meet most industrial application needs. The AX92351 also provides two interrupt sources on digital input channels. Digital output has open controller and supports maximum 30VDC. The read-back function is another useful function that allows monitoring each output port.
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RC BGA Interposer, LPDDR4 200-ball, Rigid, Connects Using 2x U4207A
W6602A
The W6602A LPDDR4 rigid RC BGA interposer for LPDDR4 200-ball DRAM enables capture of simultaneous read and write traffic at data rates and has been tested to 3200 MT/s. Two U4207A zero Ω, 34-channel, soft touch pro, single-ended, 4 x 160-pin direct connect probes are required to connect the W6602A LPDDR4 BGA interposer into two U4164A logic analyzer modules. The W6602A LPDDR4 rigid RC BGA interposer allows signal access to the LPDDR4 signals critical to your debug and validation effort through a U4164A logic analyzer system. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR4 200-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR4 signals.
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6,000 Counts Dual Display Digital Multimeter With VFD Feature
KM-711
Kusam Electrical Industries Limited
• VFD-V & VFD-Hz in Dual Display• 5msCREST-MAX capture mode (Peak Hold)• Autoranging Relative -Zero mode• Display Hold• EF-Detection (NCV)• Beep-Jack input warning• Hz Line Level Frequency• Hz Logic Level Frequency• Diode Test• Continuity Test
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Professional Thermal Camera
FLIR T560
Troubleshoot hot spots, find hidden faults, and confirm repairs quickly with the ergonomic, high-resolution FLIR T560. This 640 × 480 (307,200 pixel) thermal imaging camera has a bright 4" LCD and a 180° rotating lens platform, so you can easily and comfortably diagnose electrical or mechanical issues, even in hard-to-reach areas. Advanced on-camera measurement tools such as 1-Touch Level/Span, plus laser-assisted autofocus, ensure you’ll record accurate temperature measurements every time. With on-board FLIR Inspection Route mode, you can download and run survey plans to your camera from FLIR Thermal Studio Pro (with FLIR Route Creator plugin). Together these systems will help you record temperature data and imagery in a logical sequence for faster troubleshooting and repair. The T560 also features FLIR Ignite for automatic uploading of images directly from the camera to the cloud for easy, secure storage and sharing. The purchase of a T560 camera includes a 3-month subscription to FLIR Thermal Studio Pro and FLIR Route Creator.
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Triple PCI Express, Hot-Plug Controllers
MAX5958
The MAX5957/MAX5958 triple hot-plug controllers are designed for PCI Express (PCIe)® applications. These devices provide hot-plug control for 12V, 3.3V, and 3.3V auxiliary supplies of three PCIe slots. The MAX5957/MAX5958s' logic inputs/outputs allow interfacing directly with the system hot-plug management controller or through an SMBus™ with an external I/O expander such as the MAX7313. An integrated debounced attention switch and present-detect signals simplify system design.
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PC-based Logic Analysers
A logic analyser helps debug and validate digital electronic circuits. It is a tool that allows numerous digital waveforms to be acquired and viewed simultaneously. An oscilloscope can only capture two or four signals at once, the logic analysers we sell capture up to 8, 16 or 32 signals at the same time. A logic analyser processes data across buses, something a scope can't do.
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Cantilever Probe Cards
Venture
Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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8-Channel 250 MHz A/D with Virtex UltraScale+ HBM FPGA - SOSA Aligned 3U VPX
Model 5585
- Jade 5585 and 5586 FAQ- Complete radar and software radio interface- Wideband data acquisition- Multi-channel, multi-board synchronization for high channel count systems- High-bandwidth memory, FPGA logic and DSP density make this board a single-slot 3U VPX processing powerhouse- Exceptional dynamic range and analog signal integrity- Features Xilinx Virtex UltraScale+ HBM FPGAs- Eight 250MHz 16-bit A/Ds- 10 GigE Interface- 40 GigE Interface- Dual 100 GigE UDP interface- Optional VITA 67.3C optical interface for backplane gigabit serial communication- Compatible with several VITA standards including: VITA 46, VITA 48.11, VITA 67.3C and VITA 65 (OpenVPX™ System Specification)- Navigation Design Suite for software and custom IP development
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Level Translators
Renesas offers a 6-channel bidirectional, auto-direction sensing, level translator that simplifies the interface between two logic ICs operating at different supply voltages.
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Preparative HPLC Systems
Nexera Prep
*Easy optimization of preparative parameters and scale up Fractionation simulation for rapid setup of collection logic Column line-up for scale-up from analytical to preparative*Time- and energy-saving by automation of the purification workflow Collection of target components at high purity by automated desalting*Expandable to suit the sample/fraction number and volume Choose from a wide range of options for recovery scale and analytical detection Problems are resolved simply, to accommodate a variety of needs.
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Solar Analyzers
Max. solar system power (Pmax) search by Auto-scan: 1000V, 12A (12000W capability)The analyzer and the Remote Solar Detector is connected by Bluetooth wireless communication (Bluetooth 2.1 + EDR Class 1)The Remote Solar Detector is moisture-proofIntelligent test logic with no personnel attendance required in the field Solar system analyzer waits and tests the system until appropriate sunlight irradiance is detectedMax. voltage (Vpm) at Pmax, Max. current (Ipm) at Pmax Voltage at open circuit (Voc), Current at short circuit (Isc)Efficiency (%) calculation of solar systemTemperature measurement of solar panelsIrradiance measurement of sun lightSeries resistance (Rs) calculation of solar panelsWith data logging/open function, the I-V curves of solar system can be analysed / recorded for a period of time (e.g. 60 min.)Conversion of I-V curve under OPC to data under standard test condition (STC) based upon IEC standardProvide Operating Condition (OPC) and Standard Test Condition (STC) test reports for verification of solar panel performance (OK or NO OK)Users can set up the parameters of solar panelsUsers can set up the series number of solar panels. Parameters of many solar panels can be measured in one measurementThe Irradiances and Temperatures of solar panels can be continuously measured, monitored and recordedContinuously measure/monitor/record the DC power output of solar system and the AC power output of inverter (1 phase or balanced 3 phases)Calculate the efficiency of DC to AC power conversion and the efficiency of the max.output power
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ARM LPC2468 Board
MS 1511
- 32 Bit ARM7 LPC2468 Processor (128KB SRAM, 512KB FLASH)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports- High Speed Logic Device- External Bus Interface (15 bit address bus and 16 bit data bus)
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Ultra-Portable BLE and Wi-Fi Protocol Analyzer
Bluetooth Tracker
The pocket-sized, bus-powered Bluetooth Tracker designed to support concurrent capture and analysis of Bluetooth Low Energy and Wi-Fi communications, as well as a wide variety of wired interfaces, including logic signals, host controller interface (HCI) protocols (UART and SPI), Audio I2S, and WCI-2, all visualized over the widely adopted Ellisys software suite.
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F9 Systems CalBlade
The CalBlade backplane calibration fixture isdesigned to permit accurate and convenient impedance and transmission measurements of a HM-Zd backplane. The CalBlade is used to calibratethe logic card connector interface to the backplane rather than to the usual far-end of the coaxial measurement cables. Very accurate impedance, skew and propagation delay measurements are possible since parasitic fixturing effects are removed.
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Logic Analyzer Module With State Mode Up To 4Gb/s
U4164A
The U4164A logic analyzer provides industry’s highest data rate state mode (up to 4 Gb/s), highest deep trace timing mode (up to 10 GHz), and deepest memory (up to 400 Mb), enabling validation and debug of DDR4 or LPDDR4 at data rates over 3.5 Gb/s.
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PC Crush Tester
DRK113E
Shandong Drick Instruments Co., Ltd.
DRK113E Crush Tester PC is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance.The instrument has parameter testing, adjusting, computer screen display, memory, printing function.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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NI-9426, 24 V, 32 Channel (Sourcing Input), 7 µs C Series Digital Module
780030-01
24 V, 32 Channel (Sourcing Input), 7 µs C Series Digital Module - The NI‑9426 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each digital input line is compatible with 24 V logic levels.
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Quadrature Position & Rate Meter
Accepts low-level differential or single-ended 5 V logic level quadrature signals from shaft encoders to display scaled position or scaled rate. One, two or four transitions may be counted at a maximum combined rate of 250 kHz and be mathematically scaled to display in engineering units from -999,999 to +999,999. An analog output scaled to the display and relay outputs are optional.
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DC/DC Converter 10 W
EC6AW-110D15N
DC/DC converter with 10 W from Cincon | input ranges 43 - 160 VDC | outputs 15 V and -15 V | operates in temperature from -40 to +85 °C | according to EN45545-2 fire and smoke | negative control logic
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Robotic Cell for Testing Car Multimedia System
It is necessary to develop an automated system for testing a multimedia device. The system should perform functional testing: testing of physical buttons, touch screen and logic of operation.
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Built-in Self-Test
TurboBIST
TurboBIST family of products from SynTest Technologies, Inc. includes tools for logic (TurboBIST - Logic) and memory (TurboBIST - Memory) (SRAM, ROM, DRAM and CAM) built-in self-test.
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Open Source Logic Analyzer
Logic Pirate
8 channels 256,000 Samples recording size 20 MHz sampling speed, can potentially be overclocked to 60 MHz No compromise on sample size when combining different speeds or number of channels Simple configurable edge detection triggers on all inputs (simple OR trigger) Configurable ratio of samples from before and after the trigger (rolling sample buffer) 5 V tolerant inputs (LOW-level voltage < 0.8 V, HIGH-level voltage > 2.0 V) About 500 kB/s transfer speed to the PC (256 kSamples take about 0.5 seconds) Data capturing can be stopped from the host software anytime Cross platform host software for Windows, OS X, and Linux DIY-friendly 0603 parts and SOIC packages used on a 2-layer board On board 3.3 V regulator can supply up to 400 mA to an external circuit Tiny 3cm x 3cm PCB Firmware updates via built-in USB bootloader Probe cables and acrylic case available from Seeed Studio Open source PCB (EAGLE) and firmware files
