Electron
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Product
Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Electron Spin Resonance Spectrometer
ESR
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Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Product
EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Electronic Calibration Module (ECal), 67 GHz, 1.85 Mm, 2-Port
N4694D
Electronic Calibration Module
The Keysight N4694D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4694D is a precision 2-port ECal module that supports 1.85 mm connectors up to 67 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4694D is included for securing your ECal module and accessories.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Electronic Pressure Switch With Digital Display
PPG
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31mm compact 1-screen 2-color display pressure switch.Supports protection structure IP65. (Piping connection: Female thread added)
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Power Entry Modules
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Simplifying the power entry element in an electrical or electronic product with a module can help make the assembly easier and may benefit a company in product design.
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Product
MOS Transistor Selector
UI9610
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MOS with superior performance has now been widely used in electronic ballasts, energy-saving lamps were. But power MOS test screening, matching problem. It is difficult due to a lack of corresponding inspection means that many enterprises do not have to engage seriously in quality control as well as the effect of product consistence and reliability. The equipment in a unique program designed to solve the power MOS test problem containing micro-processing, intelligent a few significant simple application.
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PSD Signal Processing Tool
SEEPOS
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For most position measurement applications the SiTek SEEPOS system offers a complete and easy-to-use solution. High speed PSD electronics combined with digital signal processing and high speed USB data transfer gives a powerful measurement system. With its large dynamic range it can handle light powers from nW to mW from DC light sources as well as modulated light sources. All parameters, such as PSD bias voltage, amplifier gain, the use of analog and digital filters etc., are easily controlled from the included software and light spot position is continuously displayed both in XY and X-t, Y-t graphs. Optimized plot algorithms ensure that all data is visually seen on the screen even in full speed measurements. Included tools for data analysis and visualization simplify rapid scan through large data sets in order to find specific parts of interest.
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High Resolution Magnet Systems
EPR
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EPR samples with S=1/2 electronic spins exhibiting a narrow signal at G=2 and require magnetic fields of only ca. 3.5 T. However, EPR spectra from S>1/2 spins are typically much broader and have spectral features that spread over magnetic field range of several Tesla.
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Product
8-CH Relay Output EtherCAT Module
EPS-2308
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ADLINK" s EPS slave system features modular design for flexible high channel density, rugged construction, easy maintenance, and intelligent performance, compatible with 3rd party EtherCAT products. Precise time-deterministic control enables I/O synchronization for critical applications, and FPGA and ARM technology allow users to fully monitor status of EPS modules and systems, including operating temperature and usage cycle of relay switching, as well as motion control status for general purpose motor drive control. In addition, the ADLINK EtherCAT configurator enables auto-scan and configuration across EtherCAT systems. The EPS" unique structural and electronic design supports hot-swappable function, reducing repair time, and the rugged construction and operating temperature range of -20°C to 60°C allow operation in the harshest environments.
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4-Sot BRIC, 64x16, 1 Pole, PXI Matrix (2 Sub-cards)
40-559-401-64x16
Matrix Switch Module
This range of BRIC ultra-high-density large PXI matrices are available in 2, 4 or 8-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays.
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Product
Thermocouple Kit
34307A
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The Keysight 34307A is compatible with the Keysight 34970A Data Acquistion/Switch Unit. The 34307A can also be used with the Keysight 34401A, 34460A or 34461A, however, an external program is required to convert the voltage measurements to temperature and an ice bath or electronic reference junction must be used.
