Electron
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
Electron Spin Resonance Spectrometer
ESR
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Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.
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Product
Electron Multipliers
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Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Product
EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Product
Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Product
Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Product
Electron Beam Lithography System
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Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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Product
Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 4.3-10, 2 Port
85094D
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The Keysight 85094D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Product
Ultrasonic Clamp-On Flow Sensor
SEMIFLOW CO.65
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SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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Product
PCB Test Fixtures
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ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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Product
PXI 12-Slot BRIC Matrix, 160x16 1-Pole (5 sub-cards)
40-558-121-160X16
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The 40-558-121-160x16 matrix is part of a range of BRIC ultra-high-density large PXI matrices are available in 2, 4, 8 or 12-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays.
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Product
Isoperibol Calorimeter
AC500
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The AC500 determines calorific value, a key indicator of quality and value in solid and liquid fuels, through measurement of the heat released after combustion of a sample. This stand-alone benchtop unit uses a fully-integrated circulation system for a compact footprint—no additional heaters or coolers required. An integral water-measuring station simplifies sample preparation, and a Windows®-based operating system uses an electronic thermometer accurate to 0.0001°C to measure temperature every six seconds. Two-channel correction is possible through constant temperature monitoring in both the outer jacket and the calorimeter proper.
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Product
AvaSpec-Mini
AvaSpec-Mini2048CL
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Avantes is excited to release the next generation of AvaSpec-Mini spectrometers with CMOS detectors and advanced electronics and communications. Like the original AvaSpec-Mini, the CL series is only the size of a deck of cards, with excellent temperature and wavelength stability. This instrument is easy to take anywhere you like and is very well suited for handheld applications.
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Product
20KV 30KV Electrostatic Discharge ESD Simulator
20KV/ 30KV Electrostatic Discharge ESD Simulator
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Shenzhen Chuangxin Instruments Co., Ltd.
ESD simulator (Electrostatic Discharge Generator or Electrostatic Gun) is in full compliance with IEC 61000-4-2, EN61000-4-2, ISO10605, GB/T17626.2, GB/T17215.301 and GB/T17215.322. The ESD generator is designed for the assessment of electrical and electronic equipment to withstand ESD performance. ESD-0230/ESD-0220 has LCD display in both English and Chinese, they equipped with an infrared remote control which can allow you do the test in some special place.
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Product
High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
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While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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DC Power Supplies
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Is the unidirectional flow or movement of electric charge carriers (which are usually electrons). The intensity of the current can vary with time, but the general direction of movement stays the same at all times. As an adjective, the term DC is used in reference to voltage whose polarity never reverses.
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Product
Operational Amplifiers
Op Amps
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Operational amplifiers, known also as op amps, play a major role in analog signal conditioning applications. Invented by Karl Dale Swartzel Jr. in 1941, these products are largely used in today’s electronic devices.
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Product
3D Guidance®
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The 3D Guidance® electromagnetic tracking solution delivers exceptional performance and value for OEM image-guided interventional and therapy systems and medical trainers that require real-time navigation tracking capabilities. The 3D Guidance solution tracks 6DOF sensors that can be embedded into OEM instruments such as ultrasound probes, rigid and flexible scopes, and laparoscopic tools. Continuous in-vivo tracking is maintained through difficult anatomy, even when sensors are out of sight. Low latency and fast update rates ensure the most subtle tool movements are instantly tracked and visualized within the OEM host interface. The 3D Guidance solution is available in the driveBAY™ and trakSTAR™ configurations, as based on the Electronics Unit. The trakSTAR is a standalone desktop unit that connects to a direct power source. The smaller driveBAY fits inside the drive bay of a computer, OEM imaging cart, or medical trainer/simulator, using the host’s power supply. Both share the same tracking accuracy and reliability. The ready-to-use configuration facilitates cost-effective integration and speeds time to market.
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Product
Standard Climatic Test Chamber(Environmental Chamber)
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Guangdong Test EQ Equipment co., Ltd.
Primarily used for accelerated damp heat testing, alternating damp heat testing, constant humidity testing, as well as high/low temperature routine testing, cold resistance testing, low-temperature storage, and adaptability testing under rapid or gradual temperature changes in industries such as aviation, aerospace, electronics, instrumentation, electrical products, materials, components, equipment, and complete machines. It is particularly suitable for Environmental Stress Screening (ESS) testing of electrical and electronic products or for enhancing production efficiency. It enables analysis and evaluation of performance and behavior under simulated environmental conditions.
