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Product
Temperature Cycling
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Reltech provides a full capability for Temperature Cycle testing as part its full turn-key solution to package level qualification testing. Our Temperature Cycling system type Espec TSA11-A, two zone (-65°C to +200°C) vertical movement system, provides an exceptional recovery time of less than 5 minutes without the need for any auxiliary cooling.
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Product
Thermal Cycling and Humidity-Freeze Test
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King Design Industrial Co., Ltd.
*10.4" TFT LCD, touch-type Chinese/English display controller.*Temperature/humidity setting procedure, LCD curve display device (set to “curve display”).*Chinese/English/LCD operation/troubleshoot/guiding window.*State-of-the-art intelligent auto-dispatch “heat load value” coolant servo valve flowrate algorithm control.
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Product
Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Product
Long Life Seismic Energy Source
1900LLX-T
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Output volume of 10 cubic inches to 250 cubic inches. Light weight enough for shallow draught vesselsPowerful enough for blue water seismic surveys. Available with engineered seals for more robust performance.
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Product
Rotary Switch Life Tester
CX-1
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Shenzhen Chuangxin Instruments Co., Ltd.
1: The CX-1 Rotary Switch Life Tester is strictly designed according to IEC60669-1, IEC61058-1, GB15092-1-2003 and GB15092.1 Standard. It's mainly used to test the service life of household and similar switch equipment products. 2: This rotary switch life tester connected to the power load cabinet and conduct electrical life test, normal operation and breaking capacity test of the rotary switch. 3: The rotary switch life tester is mainly used to test the all kinds switch
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Product
Global-N Temperature Cycling Chambers
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Over 70 different Global-N models allow you to choose the size and performance best suited for your test applications. Temperature cycling rates from 5 to 20°C/min. are possible. Two different ultimate low temperatures are available: -35°C or -70°C. The Global-N series require the least amount of floorspace for this level of performance.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
OLED Life Time Test System
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A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Product
High Temperature Operating Life
7000 Series
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With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Product
Temperature Cycling Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Temperature cycling test chamber is suitable for testing various performance indexes of aerospace products, electronic instruments, materials, electronic products and various electronic components under the condition of rapid temperature change.
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Product
High Accelerated Life Test Chamber
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Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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Product
Temperature Cycling Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Temperature Cycling test chamber is performed on materials to determine the resistance of exposure to alternating extremes of high and low temperatures.
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Product
Highly Accelerated Life Testing (HALT)
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Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1J-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
HALT – Highly Accelerated Life Test
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HALT is a process used on electronic assemblies and modules to determine weaknesses and the stress limits of a product by temperature cycling and omni-axial random vibration step stress. Inherent weaknesses in a products design and build are stimulated by applying increasing levels of mechanical stress. Within an accelerated timescale, faults in a product can be realised prior to product release and preventing failures occurring during after-sale user operation, very often during the warranty period.
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Product
Life Science Lab Instruments
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Shimadzu's Life Science Lab Instruments are focused on developing new tools to help accelerate life science research by integrating novel chemistry with innovative technology to achieve a unique position as a true provider of solutions for life scientists. Shimadzu brings together technologies and tools that help you find out more about your biological sample. Whether it is a gel based experiment for understanding protein expression, characterizing differences in metabolism in patient studies, imaging tissue with mass spectrometry, Shimadzu can help you discover more about the biology of disease.
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Product
IoT Battery Life Optimization Solution
X8712A
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The Keysight X8712A is an IoT battery-life-optimization solution that consists of a DC power analyzer, 20 W or 80 W battery drain analyzer source/measure unit (SMU) modules, RF event detector, and dedicated software in one integrated solution.
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Product
Primary VoltageE Standard: Cryocooler (Closed- Cycle Refridgerator) System
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The Hypres Primary Voltage Standard System with cryocooler (closed-cycle refrigerator) is a complete, computer controlled system implementing a variety of voltage calibration functions. This system configuration is a cryogen-free complete Primary Voltage Standard System with parameters that are identical to the liquid helium version.
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Product
Direct conversion from cycle driven simulation data
Test program generator
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Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Product
Power Supply Rack For Climatic Cycling Test
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One essential part of the module quality testing according to IEC 61215 is the thermal cycling test (MQT 11) and humidity freeze test (MQT 12). Besides the environment simulation in the climate chamber, it is necessary to energize the PV modules during specific parts of the test.
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Product
Laser Diode Life Test
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Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Product
Micro-CT for Life Science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the micron level.
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Product
Battery Cycle Test Systems
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Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
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Product
Electrical Button Life Span Tester
IEC60884
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Shenzhen Autostrong Instrument Co., Ltd.
Plugs and the sockets life tester is designed according to the corresponding provisions of the GB2099-96,GB16915-97 and IEC60884-1,used to detect the mechanical life test of the household and similar purposes of the plugs and the sockets products.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Cycle Voltage Drop (Rise) Simulator
STT-CSS-20P1
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Beijing KeHuan Century EMC Technology Co,.LTD
*Using 2 The regulator, and the rated voltage adjustable automatic voltage regulator, power fluctuations avoid adversely affecting the test results. Simulate the test under 110V power supply. It can simulate the fluctuation of the power grid under extreme conditions (such as high or low power supply voltage in remote areas).
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1Z-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Life / Chatter Test
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Offers a complete range of life test hardware and software modules to enable any Relay Life Test application to be easily and quickly configured, no matter how large or small.
