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Life / Chatter Test
Offers a complete range of life test hardware and software modules to enable any Relay Life Test application to be easily and quickly configured, no matter how large or small.
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Multiway Life Tester
CH316
Measure 16 samples at the same time, evaluate and record the life of each sample. Very flexible: Samples can be added and changed at anytime. The life of each sample is readable at anytime. The switch ON/OFF time is adjustable (Test period is min 1s). Automatically remember the test result when the power is off, and resume the old measurement when power is on. Sound and light alarm when the products were failed.
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Life Science, Stability Test Chambers
Weiss Technik provides test Chamber solutions for packaging, medical devices, pharmaceutical, biotech and other life science products.
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Highly Accelerated Life (HALT) Test
HALT consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated life testing is performed to identify design weaknesses and problems prior to production. HALT subjects equipment to overstress conditions at a level which does affect life, but offers an advantage by reducing the design and development phases of a program.
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High Accelerated Life Test Chamber
Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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Long Life Seismic Energy Source
1900LLX-T
Output volume of 10 cubic inches to 250 cubic inches. Light weight enough for shallow draught vesselsPowerful enough for blue water seismic surveys. Available with engineered seals for more robust performance.
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Long Life Seismic Energy Source
1500LL
Excellent low frequency content. Using heavy-duty cluster spreader bars cluster elements in excess of 1,000 cubic inches possible without sacrificing peak output
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IEC60884-1 Plug Socket Switch Life Tester With 3 Stations
CZKS-4
Shenzhen Chuangxin Instruments Co., Ltd.
1. This test equipment is designed and manufactured according relevant requirement of Standard IEC60884-1,GB2099.1 and GB16915.1,Mainly used to test the service life of household and similar use plugs and sockets or switches. 2. This machine connect to load cabinet and conduct electrical life test ,normal operation and breaking capacity to plug socket and switch.
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Long Life Serismic Energy Source
2800LLX
Bolt introduced the LONG-LIFE air gun in 1992. Since then it has become the standard energy source for marine seismic exploration.
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6 Position Plug Socket Switch Life Tester
CZKS-6
It is designed according to terms and conditions of IEC60884-1, IEC60669-1, GB2099.1-2008 and GB16915.1-2003, for life test of plug and socket and switch products of household and similar use appliances. The device can connect with matched load cabinet, in order to conduct a test of electrical life, normal operation and breaking capacity. The equipment provide some clamp, it can test plug and socket production, wall switch, rocker switch, dial plate switch and button switch.
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Electric Tool Life Tester
Guangzhou Jumho Electric Co., Ltd.
Electric Tool Life Tester loads various periodic signals, such as constant current, constant torque and revolving speed etc, to a single electric tool until it is completely ruined, comparing historical data for further causal analysis.
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Life Science Instrumentation
With a wide spectrum of Teledyne technologies such as high-performance cameras, sensors, automation and pumps, OEM solutions serves the vast Life Science industry in many ways.
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Life Sciences
Life science is defined as all sciences ranging from biology, chemistry, environmental science and physics. More specifically, life sciences consist of companies in the fields of biotechnology, pharmaceuticals, biomedical technologies, life systems technologies, nutraceuticals, cosmeceuticals, food processing, environmental, biomedical devices, and organizations and institutions that devotes most of their efforts in the various stages of research, development, technology transfer and commercialization.
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Rotary Switch Life Tester
CX-1
Shenzhen Chuangxin Instruments Co., Ltd.
1: The CX-1 Rotary Switch Life Tester is strictly designed according to IEC60669-1, IEC61058-1, GB15092-1-2003 and GB15092.1 Standard. It's mainly used to test the service life of household and similar switch equipment products. 2: This rotary switch life tester connected to the power load cabinet and conduct electrical life test, normal operation and breaking capacity test of the rotary switch. 3: The rotary switch life tester is mainly used to test the all kinds switch
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25H-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Switch Modules - 32 Single Pole Relays Arranged as a 16x2 Matrix
JX32/AB-1
This module has 32 single pole relays arranged as a 16x2 matrix as shown in the figure to the left. The matrix may be operated and wired individually for up to 16 16x2's per chassis, or jumpered to the backplane to form up to a 256x2 matrix. It is available with Type S or M reed relays for high speed, long life application.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1L18-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Low PIM Coaxial Switch, DC to 4 GHz, SP6T
87106P
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87106P is a low PIM SP6T coaxial switch, operating from DC to 4 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency, and ultimately maximizes test throughput.
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PCIe Mono Industrial Camera
CMOSIS CMV2000
2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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VPX/open VPX 5 Slot 3U
OpenVPX (ANSI/VITA 65 Standard) addresses this by specifying a set of standard profiles of interconnections. Comtel Backplanes are equipped with Air-/-Plane technology. It extends the life of the existing VPX connector system (MultiGig RT2) and enables unprecedented signal integrity performance which complies with IEEE 802.3bj 100Gb/s standard (4 Ethernet channels via fat pipe).
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Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62J-6-S
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2P-2
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Transformer Resistance Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
