Acceleration
rate of change in velocity.
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Carbon / Sulfur Elemental Analyzer
EMIA-Expert
The EMIA-Expert Carbon/Sulfur Analyzer is based on HORIBA''s widely respected expertise in Non-Dispersive Infrared (NDIR) technology. It offers improved the cleaning efficiency, enhanced user-friendly software, durability, operability and maintenance to ensure efficient measurements and its shortened cycle time accelerates your development and manufacturing speed.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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M-Code Mission Timing and Synchronization
SecureSync
The latest generation of modernized security architecture, modernized anti-spoofing and anti-jamming for GPS-degraded environments, operations in mixed P(Y)-code and M-Code constellations, accelerated Direct-Y and Direct-M code acquisitions, and Over-The-Air-Rekeying (OTAR). SecureSync M-code provides better than 41 dB J/S while tracking and better than 54 dB J/S while providing cryptographic key retention without battery backup.
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Dual-Axis Accelerometer For HS5 & 6 Handyscopes, +/- 2G
TP-ACC20-09
The Accelerometer is a low cost, low power, complete dual-axis accelerometer with signal conditioned voltage outputs. The output signals are analog voltage proportional to acceleration. The Accelerometer is capable of measuring both positive and negative accelerations to at least +/- 2G.
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SMARC
ROM-5420 B1
ROM-5420 SAMRC v1.1 Module integrates ARM Cortex-A9 NXP i.MX6 series ultra low power SoC and I/O solution chips to be OS support ready. NXP i.MX6 supports 2D, 3D graphics acceleration, full HD 1080P video decoding and an HD 1080p video encoding hardware engine.
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Development
Our JTAG Switch Modules (JSMs) are flexible testing and diagnostic cards to accelerate the design, prototyping and operation of your embedded computing system. We have a range of AMC modules for IPMI software development, power load testing and monitoring or to provide a telco/fabric clock. Also, our single slot backplane for AMC modules is ideal for low-cost development and testing.
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Wireless EPaper Display Solutions
Wireless ePaper Solution Suites accelerate ePaper devices, routers, gateways, and DeviceOn/ePaper software to a wide range of industrial applications.
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6U OpenVPX Multifunction I/O Board
67G6
NAI's latest generation 6U OpenVPX Multifunction I/O and Communication Board, the 67G6, can be configured with up to six smart function modules. Ideally suited for rugged military, industrial, and commercial applications, this low-power/high-performance board delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems.
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PathWave Manufacturing Analytics
PM2288A
Combining test and measurement expertise with data science and big data engineering, the PathWave Manufacturing Analytics platform provides actionable insights for every level in your organization in the smart factory of the future. Improve yield, lower retest and handling, and lower the cost of poor quality with big data advanced analytics that really works. Accelerate your Return on Investment and business outcomes with unique, innovative analytics.
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SMARC® 2.1 Short Size Module With NXP I.MX95
LEC-IMX95
ADLINK LEC-IMX95, based on the powerful NXP i.MX95 (6x Arm Cortex-A55 + 1x Arm Cortex-M7 + 1x Arm Cortex-M33) processor with an integrated ISP and eIQ Neutron Neural Processing Unit (NPU) operating at up to 2 TOPS., is the latest SMARC revision 2.1 compliant module. It combines power-efficient high-performance compute, immersive Arm® Mali™-powered 3D graphics, innovative NXP NPU accelerator for machine learning, and high-speed data processing with safety and security features.
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Temperature Chambers & Humidity Chambers
Temperature and humidity test chambers are available as standard products in a variety of sizes to suit your needs. Our environmental test chambers are often used for steady-state stability testing, basic temperature cycling and accelerated stress testing.
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3U OpenVPX Ethernet Switch and Multifunction I/O Board
68G5E
The 68G5E is a 3U OpenVPX board that is configured with an Ethernet Switch module (choose the ES1, 12-Port GbE Cu legacy unmanaged Ethernet Switch, or the ES2 16-Port Cu GbE managed Ethernet Switch with optional 4x 10GBASE-SR 850 nm multimode Fiber Optic interface) and provides additional support for one NAI smart I/O and Communications function module. Uniquely designed, the 68G5E provides ‘independent’ Ethernet Switch capabilities and can operate as a MFIO board end point with access via the 1 x1 PCIe and/or 1x 10/100 Ethernet motherboard Control Port which hosts the NAI Ethernet Protocol Server/Listener application for direct GbE MFIO control. Ideally suited for rugged Mil-Aero applications, the 68G5E delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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LT-200A Aging-Life Test System For LEDs
Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Photonic Test & Measurement
Keysight offers a wide-range of innovative test and measurement solutions to accelerate the progress of next-generation intelligent optical networks. Keysight's mission in the optical market is to shorten time-to-market and reduce cost-of-test for customers in R&D and manufacturing, as well as enable new technologies which include innovative optical components, network elements & systems, and all-optical fiber networks.
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Digital Current Integrator
The ORTEC Model 439 Digital Current Integrator was designed to accurately measure DC currents or the average value of pulse currents such as produced by accelerator beams. It digitizes the input current by producing an output pulse for specific values of input charge. A front-panel switch permit the selection of three different amounts of charge (10–10, 10–8 or 10–6 coulomb) required to produce an output pulse. The instrument has a digitizing rate from 0 to 10 kHz to provide wide dynamic range on each setting and high-resolution readout without meter interpolation.
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Sencha Test
Sencha Test is the most comprehensive unit and end-to-end testing solution for Ext JS apps. Based on years of testing Ext JS applications and the deepest integration with the framework, Sencha Test helps you improve application quality, accelerate time to market, and reduce testing time and costs. With Sencha Test, you can create unit and end-to-end tests quickly, and execute them on multiple browsers simultaneously. Cross-browser testing is critical to ensuring quality for organizations, and test automation is a requirement to meet delivery timelines. Sencha Test is the only dedicated testing solution for Ext JS applications. It helps you build an end-to-end testing plan without having to cobble together testing tools.
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XCITE 1100-5 Inertial Mass Excitation System
The 1100-5 Inertial Mass Modal Excitation system allows the testing of structures where backup fixturing is not available or possible. Accelerating an internal mass with the closed loop hydraulic excitation system generates the inertial forces. The compression control of the Xcite Master Controller maintains a constant force over a frequency sweep by continuously altering the drive signal to maintain the required dynamic force level.
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Vibration Meters
Simple to operate and are ideal for obtaining spot measurements. Features accurate, piezo-electric accelerometer sensor, LCD read-out in acceleration, velocity and displacement and true RMS velocity response.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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High Temperature ICP® Accelerometers
PCB® offers specially designed and tested ICP® accelerometers for conducting vibration and shock measurements under demanding environmental conditions of up to 356 °F (180 °C). These sensors combine proven quartz and ceramic shear sensing technology with specialized, built-in microelectronic signal conditioning circuitry to achieve dependable operation in extreme temperatures and through repetitive temperature cycling. Laser-welded, hermetically sealed, lightweight titanium or stainless steel housings offer further protection from the environment. Prior to shipment, each sensor undergoes a battery of tests to ensure survivability for its intended use. Such tests include temperature soak at elevated temperatures, temperature cycling, and exposure to highly accelerated screening procedures with hydraulically actuated shakers.
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Hot Air Ageing Oven
Premier Electrosystems' Hot Air Ageing Oven is a testing instrument that is used for analyzing the aging effect on the products and materials. It is used by different industries and product manufacturers to heat the products for conducting the dry tests in the laboratory. This helps manufacturer study the accelerated effects of ageing of the sample in a very short time.
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Task Factory
Save time managing tedious data warehousing ELT/ETL tasks *60+ prebuilt SQL Server Integration Services (SSIS) components to accelerate ETL processes *Optimized for SSIS to ensure fast performance of data-centric applications *Connect to dozens of data sources, including REST-enabled sources
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Radio Access Network
RAN
Break free from traditional restrictions of proprietary networks with Radisys Connect Open RAN protocol software and accelerate 5G deployments.
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Stability and Shelf Life Test Chambers / Rooms
Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
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Photo Gate Logger Sensor
NUL-209
This sensor can be used to study various kinds of motion. With six modes of operation, time, velocity or acceleration can be measured with one or two photo gates and associated timing cards, as well as showing pictorially the status (digital 1 or 0) of the voltage output of the photo gate as timing cards pass through it.
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Ozone Test Chamber
EKT-2001OZ-HCLSX
Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Torsional Vibration Monitoring Systems
Advanced Telemetrics International
Are used for Noise Vibration and Harshness (NVH) testing and analysis in automotive drivetrain, wind turbine gearbox and various other applications where measuring or monitoring rotating vibration is important. These systems are used to transmit torsional acceleration from a rotating shaft or component, while the machinery is running.
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Particle Impact Noise Detection
BW-LPD-DAQ4000
Computer based controller with predefined MIL-STD test sequences stored (New)Create unlimited custom tests with multiple vibration frequencies and acceleration and other parameters to meet unique requirements (New)
