Metrology
field of measurement.
See Also: Measurement, Instrumentation, Coordinate Measuring Machines
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Product
Non-Contact Sensors
IRIX
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Sciences et Techniques Industrielles de la Lumière
IRIX™ is a family of non-contact sensors based on chromatic confocal technology capable of measuring distances and thicknesses on any material transparent to white light.IRIX™ is capable to measure simultaneously up to five layers of material. The controller can be used in combination with a large family of optical probes with different measurement ranges, mechanical dimensions and metrological specifications to best meet the most diverse application needs.
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Product
Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
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Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Product
Shunts
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WSM alternating current measuring resistors have compared with traditional direct current shunt resistors with coaxial voltage tap significantly better high-frequency transmission characteristics. This resulted from a production engineering very complicated structural design of the active part.ISM pulse current measuring resistors allow the metrological recording of the time curve fast current changes large amplitude in the nanosecond range. The ISM are designed for the pulse current measurement with broadband oscilloscopes.
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Product
Offline Programming, Advanced Simulation & Digital Twin
Silma
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Improve your 3D measurement experience with a winning combination: Silma, for advanced simulation and digital twin of your 3D measurement process, and Metrolog for on-machine execution and analysis.
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Product
Reverse Engineering Services
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Whether for global manufacturers or small custom shops, API’s measurement expertise, combined with advanced metrology equipment, can execute convenient and fast reverse engineering projects. Our Laser scanning services can create data from an existing part or compare captured data to a CAD model. Reverse engineering services include scan as-built parts to creation of a 3D digital point cloud and CAD Model.
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Product
Advanced Stand-Alone AFM
SmartSPM
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The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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Product
Compact Horizontal Gage
1302
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The Adcole Model 1302 represents a significant advancement in precision metrology and is an essential part of the production process for sliding cam and shifting camshaft components. The shaft gage features two opposing measuring heads to maximize speed and achieve faster cycle time, while still delivering the sub-micron accuracy and repeatability that have defined Adcole gages as the world standard in cam/crank metrology.
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Product
Metrology System
IVS
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The IVS 220 system is the latest generation in the IVS series and has been designed for ultimate precision, TIS (tool induced shift) and throughput on 200mm wafers. The cornerstone of the system’s reliability and stability is its mean time between failure (MTBF) of 2,100 hours. The IVS 280 provides the same capability in a package designed for overhead track handling with full E84 GEM300 capability.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
White Light Continuum Generator
JIBE
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A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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Product
Thermal Warpage Measurement Tool
PS600S
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The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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Product
Laser Interferometers
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ZYGO laser interferometers support and enable the most demanding metrology applications in industries from semiconductor and lithography to space-borne imaging systems, cutting-edge consumer electronics, defense-related IR and thermal imaging systems and ophthalmics.
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Product
Ambient Air Quality Monitoring System
AQMS
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AQMS, the doctor for "Human Health"An Air Quality Monitoring Station (AQMS) is a system that measures metrological parameters such as wind speed, wind direction, rainfall, radiation, temperature, barometric pressure and ambient parameters. The AQMS also integrates a series of ambient analyzers to monitor the concentration of air pollutants (such as SO2, NOx, CO, O3, THC, PM, etc.), continuously. HORIBA also provides mobile monitoring stations that can be used to monitor ambient conditions at multiple sites.
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Product
CMOS USB3 Cameras
CELERA One Series
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CELERA One camera series provide the same excellence in quality, flexibility and performances of CELERA cameras, with the only exception of a single USB3 interface, while keeping the original extremely reduced dimensions and rugged design that make CELERA One cameras suitable for most applications: automated optical inspection, high performance sorting systems, industrial metrology, microscopy, medical diagnostics and machine vision.
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Product
Biconical Antennas
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TDK Biconical Antennas - precision biconical antenna, metrology biconical antenna, high power biconical antenna.
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Product
Micrometers
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Is a device incorporating a calibrated screw widely used for accurate measurement of components in mechanical engineering and machining as well as most mechanical trades, along with other metrological instruments such as dial, vernier, and digital calipers.
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Product
Thin Film Metrology Systems
Gemini Series
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The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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Product
330 System
NSX
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With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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Product
Platform
AXM XM8000 Wafer
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The complete solution for operator free, automated X-ray wafer metrology. XM8000 is specifically designed for inline use in clean room environments.
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Product
Wavefront Measurement Systems Using the Shack-Hartmann Sensor
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Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.
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Product
Stylus Profilometers
Tencor™
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KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Product
High Precision Angular Position, Calibration and Geometry Inspection
GeoOrdinate
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Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The GeoOrdinate has been designed specifically for the inspection of large and heavy components and is fully compatible with any shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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Product
Process XRR, XRF, and XRD metrology FAB tool
MFM310
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Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Product
Full 3D Inline Metrological & Imaging AOI
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Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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Product
WAFERMAP
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WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
Meter Test Equipment
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Signals & Systems India Private Limited
Our meter test equipment is a user-friendly and innovative device for energy meter calibration, built on the current technologies – Bluetooth & Android. The metrology sub-unit measures and communicates the parameters to an Android Tab via Bluetooth. All user interfaces – textual, graphical, and data entry are made available on the Android application, with innovative features. Being a portable device measuring the voltages and currents from the metering panel, the product ensures the safety of the test personnel by making use of wireless communication between the equipment – which is connected to the High Voltage- and the user interface – Tab.
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Product
Industrial Lenses
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ZEISS lenses for technical applications are key components in complex production processes (Machine Vision) as well as in optical metrology, medical applications, traffic enforcement, quality assurance, sports and many other applications. Here they prove their outstanding image performance and reliability. Due to the precise manual adjustment of the helical focusing mount our partners will gain much better results than with comparable lenses.
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Product
High Precision Angular Positioning Calibration and Geometry Inspection
LabStandard
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Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.Designed for horizontal and vertical applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Product
Advanced Metrology System
AMS Series
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Precision systems for accurate measurement and quality control in semiconductor manufacturing.
